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1993 Fiscal Year Final Research Report Summary

Surface Analysisi under Air by UV Photoelectron Yield Spectroscopy

Research Project

Project/Area Number 04640552
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field 分析・地球化学
Research InstitutionOsaka University

Principal Investigator

MONJUSHIRO Hideaki  Dept. Chemistry, Fac. Science Osaka Univ., Assistant, 理学部, 助手 (80191071)

Co-Investigator(Kenkyū-buntansha) WATANABE Iwao  Dept. Chemistry, Fac. Science Osaka Univ., Associate Prof., 理学部, 助教授 (50028239)
Project Period (FY) 1992 – 1993
KeywordsPhotoelectron Emission / Work Function / Surface Anlysis / chemical Modification / Semiconductors
Research Abstract

Ultraviolet photoelectron Yield spectroscopy (UPYS) is a new tool to investigate the surface property of the solid sampke under air atmosphere. In this study, the UPY spectra of semiconducters and surface modified gold metal were measured and andlyzed to elucidate the ability of this techniquw as surface analytical technique in air.
The photoelectron threshold energy, Et of the various types of silicon wafers were determined form the UPY spectra. The Et and photoelectron Yield, Y reflect the nature of the surface electronic band structre and are sensitive to the type of the inpurity and its concentration. It is also indicated that the (111) and (100) faces of the silicon wafers can be easily distinguished by the use of derivative of th eUPY spectra.
The escape depth of th every low energy electrons in hydrocarbon layr was determined to be about 11A by measuring the UPY spectra of alkane thiol modified gold metals. This value is vomparable or smaller than that for photoelectron neasured in XPS, indicating that the UPYS is very sensitive to the suface of the sample. The Et for the functinally modified gold metal reflects the dipole amplitude and its orientation of the surface functional group.

  • Research Products

    (2 results)

All Other

All Publications (2 results)

  • [Publications] Shigemi Kohiki: "UV Photoelectron Yield Spectroscopy of Chalcopyrite Structure Cu-In-Se Thin Films." Thin Solid Films. 238. 195-198 (1994)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Shigemi Hohoki: "UV Photoelectron Yield Spectroscopy of Chalcopyrite Structure Cu-In-Se Thin Films" Thin Solid Films. vol.238. 195-198 (1994)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1995-03-27  

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