1996 Fiscal Year Final Research Report Summary
TUNNELING CHARACTERISCITCS OF INDIVIDUAL SURFACE ATOMS
| Project/Area Number |
05245106
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| Research Category |
Grant-in-Aid for Scientific Research on Priority Areas
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| Allocation Type | Single-year Grants |
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| Research Institution | Kanazawa Institute of Technology |
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Principal Investigator |
NISHIKAWA Osamu Kanazawa Institute of Technology, Faculty of Engineering, Professor, 工学部, 教授 (10108235)
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| Co-Investigator(Kenkyū-buntansha) |
HYOUDO Shin-ichi Meiji University, Faculty of Engineering, Professor, 理工学部, 教授 (30010713)
IKAI Atsushi Tokyo Institute of Technology, College of Life Science and Engineering, Professo, 生命理工学部, 教授 (50011713)
MORITA Seizo Osaka University Graduate School of Engineering, Professor, 工学研究科, 教授 (50091757)
KAWAZU Akira The University of Tokyo, Graduate School of Engineering, Professor, 工学研究科, 教授 (20010796)
YAMAGUCHI Tsuyoshi Shizuoka University, Faculty of Engineering, Professor, 工学部, 教授 (50013537)
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| Project Period (FY) |
1997
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| Keywords | field emission microscope (FEM) / fiel ion microscope (FIM) / scanning tunneling microscope (STM) / atomic force microscope (AFM) / atom probe (AP) / Scanning tunneling spectroscopy (STS) / field emission electron spectroscopy (FEES) / atom manipulation |
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| Research Abstract |
The purpose of this research is to clarify the characterisitcs of individual surface atoms by utilizing the atomically high resolutions of field emission microscope (FEM), field ion microscope (FIM), scanning tunneling microscope (STM) and atomic force microscope (AFM). The electronic states of individual surface atoms are probed by field emission electron spectroscopy (FEES), scanning tunneling spectroscopy (STS) and the constituent distributions of the surface layrs are examined by the atom-by-atom mass analysis with the atom probe (AP). In order to promote these studies efficiently and fruitfully, the general division of the this research on priority areas organized five research division ; theory, atom manipulation and tip evaluation, tunneling characteristics, development of new methods and macro-and bio-molecules. This general division also organized scientific meetings to exchange new information and to examine the newly obtained results from various point of views. Accordingly,
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the division invited many researchers of universities, national institutes and private institute who are not participating in this research project. Many joint meetings were also organized inviting many foreign researchers. The meeting organized by this division from 1993 to 1996 are listed below.
1993 4 general meetings including a joint meeting with the thin film and surface division of the Japan Society of Applied Physics.
1994 2 general meetings, 1 open symposium, 1 joint international colloquium with the thin film and surface division of the Japan Society of Applied Physics and STM/AFM seminar.
1995 1 general meeting, 1 joint symposium with the Fall meeting of the Japan Society of Applied Physics, 1 satellite meeting of the 9th International Conferenc of Solid Surfaces and 1 joint international colloquium with the thin film and surface division of the Japan Society of Applied Physics.
1996 1 general meeting, 1 joint symposium with the Fall meeting of the Physical Society of Japan, 2 joint meetings with the theoretical division of this research on priority areas and 1 joint international colloquium with the thin film and surface division of the Japan Society of Applied Physics. Less
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Research Products
(20 results)
