1994 Fiscal Year Final Research Report Summary
Development of Scanning Reflection Electron Holography Microscopy (SREHM)
| Project/Area Number |
05402028
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| Research Category |
Grant-in-Aid for General Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Research Field |
Applied physics, general
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| Research Institution | Osaka University |
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Principal Investigator |
SHIMIZU Ryuichi Osaka University, Applied Physics, Professor, 工学部, 教授 (40029046)
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| Co-Investigator(Kenkyū-buntansha) |
IKUTA Takeshi Osaka-Electro-Communication University, Applied Electronics, Professor, 応用電子工学科, 教授 (20103343)
KIMURA Yoshihide Osaka University, Applied Physics, Research Associate, 工学部, 助手 (70221215)
TAKAI Yoshizo Osaka University, Applied Physics, Associate Professor, 工学部, 助教授 (30236179)
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| Project Period (FY) |
1993 – 1994
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| Keywords | Reflection Electron Microscopy / Holography Microscopy / Micro Surface Physics / Surface Potential / Surface topography / 表面トボグラフィー |
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| Research Abstract |
Scanning type reflection electron beam holography microscopy (SREHM) has been developed. The resualts obtained though the present research project are as follows.
(1) UHV Reflection electron microscope was, first, developed and we succeeded to observe the reconstructed domains on Pt(100) under this microscope (paper #1)
(2) A new type sample holder for the SREHM ws also designed. This holder enables shifts along X and Y directions and rotation for incident and azimuthal angles to be controlled with high precision. (paper #2)
(3) Micro mapping of electric field along superconducting wire and its hologram have been successfully obtained. (paper #4)
(4) The SREHM system with infrared-radiation heating system and Zr-O/W(100) TF emitter has been contructed, and a prelimary result was enconrageous enough to confirm very high potentiality of the SREHM (paper #5)
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