1994 Fiscal Year Final Research Report Summary
Low frequency fluctuations and the stabilization in semiconductor laser diodes
| Project/Area Number |
05452198
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| Research Category |
Grant-in-Aid for General Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
電子デバイス・機器工学
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| Research Institution | Kyushu Institute of Technology |
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Principal Investigator |
TAKAGI Keiji Kyushu Inst.of Tech.Dept.of Electrical Eng., Professor, 工学部, 教授 (90005281)
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| Co-Investigator(Kenkyū-buntansha) |
SERIKAWA Seiichi Kyushu Inst.of Tech.Dept.of Electrical Eng., Assistat, 工学部, 助手 (60226686)
MIZUNAMI Toru Kyushu Inst.of Tech.Dept.of Electrical Eng., Asst.Prof., 工学部, 助教授 (00174029)
SERIKAWA Seiichi Kyushu Inst.of Tech.Dept.of Electrical Eng., Assistat (60226686)
SERIKAWA Seiichi Kyushu Inst.of Tech.Dept.of Electrical Eng., Assistat (60226686)
SERIKAWA Seiichi Kyushu Inst.of Tech.Dept.of Electrical Eng., Assistat (60226686)
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| Project Period (FY) |
1993 – 1994
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| Keywords | Laser / Fluctuation / Noise / Low-frequency / Stabilization / 1 / f |
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| Research Abstract |
A system for analyzing low frequency light fluctuation is set up with amonochromator (MC50N) and multi-channel detector (Hamamatsu C2326). The multi-channel detector includes a PCD Image Sensor which has 256 sensing elements. The light output of a laser diode is divided into various wavelengths and the light spectral intensities are obtained at various wavelengths. The current noise is also measured. The noises show 1/f spectra. This can explained by the superposition of the Lorentzian spectra. The correlation coefficient between the light and the driving current was calculated from the measured values in single- and multi-mode operations. The optical feedback was carried out to the laser diode and the noise reduction was demonstrated. The mode-hopping noise and mode partition noise would often occur in multi-mode operation on the light output of laser diodes. Employing this analyzing system, more detailed study including the current dependence of the noise will be carried out and the 1/f noise problem should be studied more intensively in the low ferquency range including the other semiconductor devices.
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