1995 Fiscal Year Final Research Report Summary
Detection and Control of force as a vector in atomic force microscopy
| Project/Area Number |
05452215
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| Research Category |
Grant-in-Aid for General Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
計測・制御工学
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| Research Institution | UNIVERSITY OF TOKYO,INSTITUTE OF INDUSTRIAL SCIENCE |
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Principal Investigator |
KAWAKATSU Hideki UNIV.of TOKYO,Inst.of Ind.Sci., Associate Professor, 生産技術研究所, 助教授 (30224728)
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| Co-Investigator(Kenkyū-buntansha) |
MASUZAWA Takahisa UNIV.of Tokyo, Inst.of Ind.Sci., Professor, 生産技術研究所, 教授 (60013215)
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| Project Period (FY) |
1993 – 1995
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| Keywords | AFM / STM / Condensed matter |
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| Research Abstract |
An atomic force microscope with two optical levers was developed to access the possibility of detecting the deflection and torsion of the cantilever. Experiments showed that the sytem is capable of detecting the difference of tip end point displacement along the axis of the cantilever and in the direction normal to the sample surface. When scanning mica, it was shown that the tip end point meanders along discrete stick points. The potential of the microscope was demonstrated.
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