1995 Fiscal Year Final Research Report Summary
Plasma Potential Diagnostics Using X-ray Spectra obtained with Semiconductor X-ray Detectors Developed by Our New Theory
| Project/Area Number |
06452418
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| Research Category |
Grant-in-Aid for General Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
プラズマ理工学
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| Research Institution | University of Tsukuba |
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Principal Investigator |
CHO Teruji University fo Tsukuba, Institute of Phyusics, Associate Professor, 物理学系, 助教授 (80171958)
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| Co-Investigator(Kenkyū-buntansha) |
TANAKA Shigetoshi Fukui National College of Technology, Professor/President, 学校長 (20025240)
KONDO Mafumi University fo Tsukuba, Institute of Physics, Assistant Professor, プラズマ研究センター/物理学系, 講師 (70222247)
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| Project Period (FY) |
1994 – 1995
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| Keywords | X-ray diagnostics / semiconductor detectors / plasma X-rays / potential diagnostics / a new potential observation / potential trapped electrons / maximum electron energy / X-ray detectors |
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| Research Abstract |
A new method for plasma potential diagnostics using plasma X-ray spectra is developed. In particular, newly developed semiconductor X-ray detectors are utilized ; these detectors are originally designed using our new theory on semiconductor X-ray responses.
Localized positive electrostatic plasma potentials have the capability of plasma electron trapping. The maximum energy of the potential trapped electrons is in turn determined from the value of the potential, since the electron heatings beyond the maximum potential energy make the trapped electrons untrapped. The observation of such a maximum X-ray energy provides the identification of the spatially localized electron confining potentials.
In fact, the comparison of potential values using this new method and the conventional potential diagnostics shows good agreement between the two. This new method also provides a new scaling law of the potential formation.
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