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1995 Fiscal Year Final Research Report Summary

Developement of X-ray Excited Scanning Tunneling Spectroscopy and Application to One-Atom Detection

Research Project

Project/Area Number 06453109
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field 工業分析化学
Research InstitutionInstitute for Materials Research, Tohoku University

Principal Investigator

HIROKAWA Kichinosuke  Institute for Materials Research Tohoku Univ. Professor, 金属材料研究所, 教授 (00005852)

Co-Investigator(Kenkyū-buntansha) TSUJI Kouichi  Institute for Materials Research Tohoku Univ. Associate, 金属材料研究所, 助手 (30241566)
Project Period (FY) 1994 – 1995
KeywordsTotal Reflection / X-ray Analysis / STM / elemental Analysis / x-ray fluorescence / x-ray Photoelectron / surface Analysis / micro-analysis
Research Abstract

We challenged the experiments combining the x-ray analysis and the scanning tunneling microscope (STM) for the first time. Therefore, we had to investigate the optimal experimental conditions, the origin of the obtained signal, and the information which was contained in the signal, step by step. Although we could not obtain the good results for more than 1 year.
We found that the STM tip current was measured when the x-rays irradiated the sample's surface under that condition where the usual tunnel current could not be detected. We refereed to this current as the x-ray excited current. Next, we investigated the dependencies of the x-ray excited current on the incident angle of the x-rays, the kind of the gases, the gas pressure, the bias voltage, the x-ray intensity, and kind of the sample. As a result, it was found that the x-ray excited current originated from the electrons emitted from the sample's surface by x-ray irradiation, and that the electrons ionized the gaseous atoms and molecules and produced many electrons when the electrons approached toward the molecules and produced many electrons approached toward the STM tip. Now we have tried the micro-analysis by measuring the x-ray excited current.

  • Research Products

    (6 results)

All Other

All Publications (6 results)

  • [Publications] K. Tsuji: "X-Ray Excited Current Detected with Scanning Tunneling Microscope Equipment" Jpn. J. Appl. Phys.34. L1506-L1508 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 辻幸一: "STM装置を用いたX線励起電流の測定" 表面科学. 17. 161-166 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K. Tsuji: "Glancing-Incidence-Take off X-Ray Fluorescence and Scanning Tunneling Microscopy of Thir Films under X-Ray Irradiation" Surf. Interface Anal.24. 286-289 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K,Tsuji: "X-ray Excited Current Detected with Scanning Tunnoling Microscope Equipment" Jpn. J.Appl. Phys. 34. L1506-L1508 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K,Tsuji: "X-ray Excited Current from Solid Surfaces Measured by using a STM Apparatus" J.Surf. Sci. Soc. Jpn. 17. 161-166 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K,Tsuji: "Glancing-Incidence -Take off x-Ray Fluorescence and Scanning Tunneling Microscopy of Thin Films under X-ray Irradiation" Surf. Interface Aral. 24. 286-189 (1996)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1997-03-04  

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