1996 Fiscal Year Final Research Report Summary
Developement of in situ structural analyzes of bonding between different materials
| Project/Area Number |
06555209
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 試験 |
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| Research Field |
Material processing/treatments
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| Research Institution | Nagoya University |
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Principal Investigator |
KIZUKA Tokushi Nagoya University School of Engineering, Research Associate, 工学部, 助手 (10234303)
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| Co-Investigator(Kenkyū-buntansha) |
ISHIDA Yoichi Tokyo University Faculty of Engineering, Professor, 工学部, 教授 (60013108)
TANAKA Nobuo Nagoya University School of Engineering, Associate Professor, 工学部, 助教授 (40126876)
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| Project Period (FY) |
1994 – 1996
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| Keywords | bonding / Transmission electron microscopy / hetero bonding / in situ analysis / atomic resolution |
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| Research Abstract |
Atomic scale solid state direct bonding in time-resolved high-resolution transmission electron microscopy was realized by using the piezodriven specimen holder. The structural variations of atomic arrangements in approach, contact, bonding and separation processes between two gold tips were observed at atomic scale. It was found that the nanometer-sized gold tips contact spontaneously when the tips approach at the critical distance corresponding to a few atomic distance underi intense electron irradiation. The crystallographic boundary forms after the contact. A few layrs near the surfaces and bonding-boundaries are responsible for the bonding and separation processes. New kinds of atomic scale mechanical tests such as the friction test, the compressing, tensile and shear deformation tests were proposed.
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