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1997 Fiscal Year Final Research Report Summary

Development of nano-CMM (Coordinate Measuring Machine with Nanometer Resolution)

Research Project

Project/Area Number 07455109
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Intelligent mechanics/Mechanical systems
Research InstitutionThe University of Tokyo

Principal Investigator

TAKAMASU Kiyoshi  The University of Tokyo, Graduate School of Engneering, Department of Precision Engineering, Associate Professor, 大学院・工学研究科, 助教授 (70154896)

Project Period (FY) 1995 – 1997
KeywordsCoordinate Measureing Machine / Nanometer Measurement / Thermal Force Analysis / Precision Instrument / 精密測定機
Research Abstract

New X table of nano-CMM which made of iron and added newly parts for improvements was designed and made. The performances of the table was tested by the laser interferometer. Then, the thermal force properties of the bable were investigated by the series of thermal tests. A probing system for SMM was installed on Z table and three dimensional measureing tests were carried out.
From these tests, we an reach the following results,
(1) We estimate the straightness of X table is 100 nm and the repeatability is 20nm, from the testes by the laser intrferometer and measuring an optical flat.
(2) New Z table with parallel springs was designed.
(3) We estimate the straightness of Z table is 400 nm and the repeatability is 40 nm.
(4) using a probing system was installed on Z table, it is found that three dimensional measuring tests with nanometer resolution can be done in the systam.
(5) The accuracy of the system is most influenced by the probing system.
(6) From thermal analysis, the material and the thermal circumstance of the instruments are important for nanameter measurements.

  • Research Products

    (16 results)

All Other

All Publications (16 results)

  • [Publications] 高増 潔: "nano-CMMの研究開発" 機械と工具. 39. 28-32 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 高増 潔: "形状測定におけるソフトウェアの問題点" 精密工学会誌. 61. 1049-1053 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coordinate Metrology" Proc.4th CIRP Seminar Computer Aided Tolerancing. 301-311 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Japan-China Bilateral Symposium. 155-158 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Takamasu: "Development of Nano-CMM(Coordinate Measuring Machine with Nanometer Resolution)" Proc.IMEKO World Congress ΞV. 8. 34-39 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Takamasu: "Statistical Evaluation of Form Deviations in Coordinate Metrology" Proc.9th IPES. 255-258 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 高増 潔: "座標計測における形体パラメータの信頼性" 精密工学会誌. 63. 1594-1598 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Takamasu: "Development of nano-CMM" Tool Engineer. Vol.39. 28-32 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Software for Profile Measurements" Journal of JSPE. Vol.61. 1049-1053 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coodinate Metrology" Proc.4th CIRP Semina Computer Aided Tolerancing. 301-311 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Japan-China Bilateral Symposium. 155-158 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Development of Nano-CMM (Coordinate Measuring Macchine with Nanometer Resolution)" Proc.IMEKO World Congress XIV. Vol.18. 34-39 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Statistical Evaluation of Form Deviations in Coordinate Metrology" Proc.9th IPES. 255-258 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Takamasu: "Reliability of Parameters for Associated Features in Coordinate Metrology" Journal of JSPE. Vol.63. 1594-1598 (1997)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1999-03-16  

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