1996 Fiscal Year Final Research Report Summary
Development of Charging Device for Superfine Particles Using UV/Photoelectron Method
Project/Area Number |
07555261
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Research Category |
Grant-in-Aid for Scientific Research (A)
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Allocation Type | Single-year Grants |
Section | 試験 |
Research Field |
工業分析化学
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Research Institution | Saitama University |
Principal Investigator |
SAKAMOTO Kazuhiko Saitama University, Graduate School of Science and Engineering, Professor, 理工学研究科, 教授 (20111411)
|
Co-Investigator(Kenkyū-buntansha) |
FUJII Toshiaki Ebara Research Co.Ltd., Team leader, 流体研究所, チームリーダー
|
Project Period (FY) |
1995 – 1996
|
Keywords | Super-fine Particle / External Protoelectric Effect / Charging / Ultra-viclet Ray / Negative Ion |
Research Abstract |
UV/photoelectron method developed by us is a unique charging technique using the photoelectrons/negative ions emitted from a photoelectron emitter by UV irradiation under an application of weak electric field. In this work, the new type charger of cylindrical photoelectron emitter coated on 254nm of UV-lamp was developed ; cylindrical germicidal lamp with photoelectron emitter composed of Au (10nm) and tin-doped In_2O_3 (ITO) (5nm) was used as UV-light source to generate the photoelectrons/negative ions. Mono-dispersed NaCl particles (particle diameter : 24 and 56nm) were used as sample aerosols in our charging experiments. Superfine NaCl particles were charged with a box type charger developed previously and the above new type charger applying this charging technique and, the validity was examined based on the number concentration measured by a condensation nuclei counter. The considerable predominance of the new type charger over the box type charger was found in comparison of charging ratio and penetration ratio of uncharged superfine particles and, penetration ratio of charged particles (charging-penetration ratio) under the application of direct electric field. Although charging ratio was decreased by the application of alternating electric field in the charging region, charging-penetration ratio, the most important thing in counting the number of charged particles, was increased.
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Research Products
(12 results)