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1997 Fiscal Year Final Research Report Summary

DEVELOPMENT OF AN IMAGING TECHNIQUE OF MAGNETIC FLUX PENETRATING THROUGH SUPERCONDUCTING FILM

Research Project

Project/Area Number 07650518
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 計測・制御工学
Research InstitutionOSAKA INSTITUTE OF TECHNOLOGY

Principal Investigator

KOTERA Masatoshi  OSAKA INSTITUTE OF TECHNOLOGY DEPARTMENT OF ENGINEERING PROFESSOR, 工学部, 教授 (40170279)

Project Period (FY) 1995 – 1997
KeywordsScanning Electron Microscopy / Type-I Magnetic contrast / Low Temperature SEM / Simulation of Electron Beam Trajectory / Design of the System
Research Abstract

The main theme of the present research is to observe the movement of magnetic flux that is penetrating through the type-II super-conducting film. We proposed to use the type-I magnetic contrast found in the scanning electron microscope (SEM) for observing the flux. It may be possible to find the causes of the pinning effect of the flux which influences the super-conductivity, such as the material, the structure, the imperfection in the specimen. Since the SEM has a spatial resolution of nm scale, this system may be used to probe the origin of the magnetic characteristics of the specimen.
In the present research, first, we assume a simple magnetic structure of the material. Then, the magnetic flux and the electric field, which is produced by the electron detector are calculated. The electron trajectories are calculated in this electromagnetic field, and the electron detection position distribution is obtained in three-dimension. By converting the movement of the distribution, the magnetic structure can be predicted.
The temperature of the specimen stage made in the present research in the SEM reaches down to 30K and the super-conductivity is confirmed. However, the magnetic contrast in the present system has not been observed yet. It may be because of the angular distribution and the energy distribution of electrons emitted from the surfacde. They cover the characteristic variation in the contrast. The simulation shows some preferable conditions to improve the signal to the noise ratio, and at the same time to improve the sensitivity. In the preliminary comparison between the experiment and the calculation, that is to observe the magnetic flux using ordinary magnetic films, the validity of the simulation is confirmed.

  • Research Products

    (20 results)

All Other

All Publications (20 results)

  • [Publications] 小寺 正敏: "Simulation of the Type-I Magnetic Contrast in the Scanning Election Microscope" Proc.of the 29th Am,Conf.on the Microbecn Aoalysis.Soc.379-379 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小寺 正敏: "Ob servation Technigue of Surface Magretic Structure Using Type- Magnetic Contrast in the Scanning Eledan Microscope" Jpn.J.Appl. Plys.34,12B. 6903-6906 (1995)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小寺 正敏: "Evaluation of the Motl Polarimater in the Electron Spin Polarization Scanning Electron Microscopy" Jpn.J.Appl. Plys.35,12B. 6614-6619 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小寺 正敏: "Motl電子スピン偏極検出器の性能解析" 真空. 40.3. 173-176 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小寺 正敏: "Type-I磁気コントラストを用いた磁性体表面の磁区構造解析" 真空. 40.3. 190-192 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小寺 正敏: "Estimation of the Suvface Magnetic Structure of Materials by Scanning Electron Microscopy" Jpn.J.Appl. Plys.36,12B. 7726-7731 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Kijima: "Monte Carlo Calculations on the Passage of Electrons through Thin Films Irradiated by 300keV Electrons" IEICE Trans.on Electronics. E78-C. 557-563 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Observation Technique of Surface Magnetic Structure Using Type-I Magnetic Contrast in the Scanning Electron Microscope" Digest of Papers Micro Process'95. 62-64 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Simulation of the Type-I Magnetic Contrast in the Scanning Electron Microscope" Proc.of the 29th Ann.Conf on the Microbeam Analysis Society. 379 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Kumano: "Feasibility of an Application of the Electron Beam in the Air" Memoirs of the Osaka Institute of Technology, Series A. 40,1. 39-47 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] G.Zhao: "Investigation of Electron Beam Analyzer for Observing the specimen in the Air." J.IEICE C-II. J78-C-II. 589-591 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Observation Technique of Surface Magnetic Structure using Type-I Magnetic Contrast in the Scanning Electron Microscop" Jpn.J.Appl.Phys. 34,12B. 6903-6906 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Tamura: "Performance Evaluation of the Mott Polarimeter in the Electron SPin Polarization Scanning Electron Microscopy" Digest of Papers Micro Process'96. 152-155 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Evaluation of the Mott Polarimeter in the Electron Spin Polarization Scanning Electron Microscopy" Jpn.J.Appl.Phys. 35,12B. 6614-6619 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Tamuta: "Performance Analysis of the Mott Polarimeter" J.Vac.Soc.of Japan. 40,3. 173-176 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A.Fujita: "Analysis of Surface Magnetic Structure Using Type-I Magnetic Contrast in the Scanning Electron Microscope" J.Vac.Soc.of Japan Intn.MicroProcess Conf.40,3. 190-192 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] G.Zhao: "Application of Oligo-Scattering Beam to Electron Beam Analyzer for Observing the Specimen in the Air-Monte Carlo Simulation of Oligo-Scattering Beam" J.IEICE C-II. J80-C-II. 196-205 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Estimation of the Internal Magnetization of Materials in the Scanning Electron Microscopy" Digest of Papers MicroProcesses and Nanotechnology'97. 156-157 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Simulation of the spin polarization transfer of electrons in a solid" Proc.of the Microscopy and Microanalysis'97. 511-512 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Kotera: "Estimation of the Surface Magnetic Structure of Materials by Scanning Electron Microscopy" Jpn.J.Appl.Phys.36. 7726-7731 (1997)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1999-03-16  

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