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1999 Fiscal Year Final Research Report Summary

ULTRA-LOW-POWER SILICON LSI DESIGN BASED ON Eb/No-BER CHARACTERISTICS

Research Project

Project/Area Number 08405027
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field 電子デバイス・機器工学
Research InstitutionTOHOKU UNIVERSITY

Principal Investigator

MASU Kazuya  Res. Inst. Elect. Commun., TOHOKU UNIV., Associate Professor, 電気通信研究所, 助教授 (20157192)

Co-Investigator(Kenkyū-buntansha) NAKASE Hiroyuki  Res. Inst. Elect. Commun., TOHOKU UNIV., Research Associate, 電気通信研究所, 助手 (60312675)
YOKOYAMA Michio  Res. Inst. Elect. Commun., TOHOKU UNIV., Research Associate, 電気通信研究所, 助手 (40261573)
TSUBOUCHI Kazuo  Res. Inst. Elect. Commun., TOHOKU UNIV., Professor, 電気通信研究所, 教授 (30006283)
Project Period (FY) 1996 – 1999
KeywordsEb / No-BER characteristics / ultra-low-power design / CMOS circuits / single electron transistor / cross talk noise / low supply voltage / CSET inverter / matched filter / 高速RFバス
Research Abstract

The purpose of this research project is to establish the basis of ultra low power design of nano-scale devices on the basis of "Eb/No-BER characteristics."
1. Silicon CMOS test chips have been fabricated and their Eb/No-BER characteristics have been evaluated for the first time. Base on the measurement results, the minimum supply voltage for miniaturized CMOS circuits is proposed. Furthermore, cross-talk noises among the wiring interconnects have been estimated.
2. "Eb/No-BER characteristics" was applied to a design of single electron transistors (SET). From simulation results, peripheral parasitic capacitance and interconnect layout have been proposed as a guiding principle of nano-scale devices based on the "Eb/No-BER characteristics".
3. Complementary SET (CSET) inverter circuits were investigated from the viewpoint of room temperature operation. From the "Eb/No-BER characteristics", it has been found that room-temperature CSET is hardly implemented under up-to-date manufacturing technology.
4. Instead of normal CSET, novel matched filter type CSET has been proposed for the first time from a concept of S/N recovery. CSET which consists of 3chip matched filter has been evaluated at room temperature. Although matched filter type CSET has been proved to be effective for S/N recovery, total power consumption is found to go up. After all, it is confirmed from the "Eb/No-BER characteristics" that SET circuits is applicable to low-temperature operation.
Furthermore, ultra high-speed high-capacity bus lines for the next generation have been proposed and investigated.
We believe that the above achievements of this research fulfill the requirements for the next generation ultra low-power high-speed ULSI circuits design.

  • Research Products

    (16 results)

All Other

All Publications (16 results)

  • [Publications] S.Shimano: "Reliability of Single Electron Transistor Circuits Based onEb/No-BER Characteristics"Jpn.J.Appl.Phys.. 38(1B). 403-405 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Masu: "A Novel Guiding Principle to Low Power ULSI Design : From the System Error Evaluation of Eb/No-BER"IEEE Electron Device Letters(to be summitted). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Masu: "Matched Filter Type SE Circuit for Room Temperature Operation"Ext.Abst.1999 Int.Conf.on Solid State Devices and Materials,Tokyo. 82-83 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Shimano: "Reliability of SET Circuits Based on Eb/No-BER Characteristics"1998 Int.Symp.on Formation,Physics and Device Application of Quantum Dot Structures(QDS'98),Sapporo. Mo2-8. 16 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 益一哉: "GHz高速配線技術"応用物理学会シリコンテクノロジー研究会. 15. 26 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 鷺谷剛: "Eb/No-BER特性によるLSI評価"電子情報通信学会(集積回路工学研究会). ICD96-132. 85-92 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 島野哲: "マッチトフィルタ型SET論理回路の動作温度改善"平成11年春季第46回応用物理学関係連合講演会予稿集. 28zZ M-6 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 島野哲: "Eb/No-BER特性によるSET回路動作信頼性の評価"平成10年秋季第59回応用物理学会学術講演会予稿集. 17pZ K-14 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S. Shimano: "Reliability of Single Electron Transistor Circuits Based on Eb/No-BER"Jpn. J. Appl. Phys.. 38(1B). 403-405 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Masu: "A Novel Guiding Principle to Low Power ULSI Design : From the System Error Evaluation of Eb/No-BER"Submitted to IEEE Electrion Device Letters..

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Shimano: "Reliability of SET Circuits Based on Eb/No-BER Characteristics"1998 Int. Symp. On Formation, Physics and Device Application of Quantum Dot Structures (QDS'98) Sapporo. Mo2-8. 16 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Masu: "Matched Filter Type SE Circuit for Room Temperature Operation"Ext. Abst. Of 1999 Int. Conf. On Solid State Devices and Materials, Tokyo. 82-83 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Sagitani: "Low-Power ULSI Design using the Eb/No-BER Characteristics"Technical report of IEICE.. ICD96-132. 85-92 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Masu: "ULSI GHz Interconnect"Silicon technology symposium, Japan Applied Physics. (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Shimano: "Nobel matched filter type SET logic circuits for room temperature operation"Extended Abstracts (The 46th Spring Meeting, 1999) ; The Japan Society of Applied Physics and Related Societies. 28aZM-6

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Shimano: "Reliability of SET Circuit Based on Eb/No-BER Characteristics"Extended Abstracts (The 59th Autumn Meeting, 1998) ; The Japan Society of Applied Physics. 17pZK-14

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2001-10-23  

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