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1997 Fiscal Year Final Research Report Summary

EMC-Conscious Designing Procedure of Digital Electronic Devices and the Development of EMI Simulators

Research Project

Project/Area Number 08555092
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 情報通信工学
Research InstitutionOkayama University

Principal Investigator

KOGA Ryuji  Okayama Univ.Faculty of Eng., Professor, 工学部, 教授 (20027147)

Co-Investigator(Kenkyū-buntansha) KAGAWA Naoki  Fukuyama Univ., Faculty of Eng., Lecturer, 工学部, 講師 (80258300)
WANG Ming  Okayama Univ., Grad.School of Natural Science, Assistant Professor, 大学院・自然科学研究科, 助手 (60253019)
WADA Osami  Okayama Univ.Faculty of Eng., Associate Professor, 工学部, 助教授 (10210973)
Project Period (FY) 1996 – 1997
Keywordsdigital electronic device / EMC / near-field electromagnetic field / radiated electromagnetic field / circuit current
Research Abstract

Suppression of unintentional electromagnetic radiation, EMC designing, is the most important subject on the development of the device. This processes have been achieved on a basis of trial and error, which do not meet industrial requirement even though a procedure based on Maxwell's equation which require prohibitively large amount of calculation cost. This research aimes to develop a new method to estimate the far field electromagnetic wave from measured near-field complex electromagnetic field.
A mathematical model of current distribution is necessary to be develop. A new method has been invented to cope with this object to apply for electric circuits of CMOS integrated circuits. (Miyashita, et al., IEC,Vol.116-C1996), and a simplified numerical method to calculate the electromagnetic wave emitted from the current. (Miyashita et al.IEICE,Trans.Comm., Vol.E80-B,1997).
A mechanism in which an electronic circuit should malfunction under electromagnetic-wave irradiation was investigated as well.

  • Research Products

    (10 results)

All Other

All Publications (10 results)

  • [Publications] 宮下 卓也 ほか3名: "ディジタルPCBからの放射EMIの高速シミュレータの開発" 回路実装学会誌. 11・2. 121-125 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 宮下 卓也 ほか7名: "放射電磁雑音予測のためのCMOS論理ICの出力等価回路モデルの簡易決定法" 電気学会論文誌C. 116-C・11. 1301-1306 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 宮下 卓也 ほか3名: "ディジタルプリント回路基板上の信号線からの放射スペクトルのモデル化" 電子情報通信学会論文誌. J79-B-II No.11. 805-811 (1996)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Torigoe ほか4名: "Prediction of Far-Field EMI Spectrum of Differential Mode Enission from a Digital PCB by Near-Field Measurement" IEICE Trans.Commun.E80-B No.11. 1633-1638 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Kagawa ほか2名: "Linear Equivalent Circuit of a Digital Gate for characterization of Malfunction Mechanism" IEICE Trans.Commun.E80-B No.11. 1652-1653 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Takuya Miyashita, Osami Wada, Ryuji Koga, and Hiroya Sano: "Development of High-Speed EMI Simulator for Electromagnetic Noise Emission from a Digital PCB" Circuit-Technology. Vol.11. 121 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Takuya Miyashita, Hiroshi Kubo, Osami Wada, Ming Wang, Ryuji Koga, Hiroyuki Ohnishi, Naoki Kagawa, Hiroya Sano: "Simple Identification of Equivalent Circuit of CMOS Logic IC for EMI Prediction" Trans.IEE of Japan. Vol.116-C. 1301 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Takuya Miyashita, Osami Wada, Ryuji Koga, Hiroya Sano: "Modeling of EMI Spectra Emitted from a Signal line on a Digital PCB" Trans.IEICE. Vol.J79-B-II. 805 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Makoto Torigoe, Takuya Miyashita, Osami Wada, Ryuji Koga and Tetsushi Watanabe: "Prediction of Far-Field EMI Spectrum of Differential Mode Emission from a Digital PCB by Near-Field Measurement" IEICE Trans.Commun.Vol.E80-B. 1633 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Naoki Kagawa, Osami Wada, and Ryuji Koga: "Linear Equivalent Circuit of a Digital Gate for Characterization of Malfunction Mechanism" IEICE Trans.Commun.Vol.E80-B. 1652 (1997)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1999-03-16   Modified: 2017-10-11  

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