Development of Random Loading Test by Parallel Micro-Processor

1997 Fiscal Year Final Research Report Summary

• Project/Area Number: 08555244
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 展開研究
• Research Field: 船舶工学
• Research Institution: Yokohama National University
• Principal Investigator: ISHIZUKA Tetsuo Yokohama National University, Faculty of Education and Human Sciences, Associate Professor, 教育人間科学部, 助教授 (50017927)
• Project Period (FY): 1996 – 1997
• Keywords: Random Fatigue / Gaussian Random Load / Stress Indtensity Factor / K Cotrol

Research Abstract

Structures of large size as ships, airplanes and with ocmplicated system as nuclear power plant have been built recently, it has been frequent that they cause a terrible accidents by metal fatigue. Load they have been given is generally random load, to prevent accidents, random fatigue test takes on importance.
When a load profile can be approximated by a narrow band stationary Gaussian random process, it has been pointed out that random fatigue tests are easiliy done with a personal computer. In this study, we wrote random fatigue test program by simulating the the envelope of the narrow band random process by FFT for personal computer.