1999 Fiscal Year Final Research Report Summary
Development of Dynamic Measurement techniques for Thermophyscal Properties using Optical Method
| Project/Area Number |
09555076
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (B)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 展開研究 |
|---|
| Research Field |
Thermal engineering
|
|---|
| Research Institution | Keio University |
|---|
Principal Investigator |
NAGASAKI Yuji Keio University, System Design Eng., Professor, 理工学部, 教授 (40129573)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
NAGASHIMA Akira Keio University, System Design Eng., Professor, 理工学部, 教授 (80051514)
|
|---|
| Project Period (FY) |
1997 – 1999
|
| Keywords | Thermophysical Properties / Measurement Techniques / Remote Sensing / Surface Tension / Viscosity / Diffusion Coefficient |
|---|
| Research Abstract |
The results obtained from the present research are summarized as follows.
(1) Surface Laser-Light scattering Method (Surface Tension and Viscosity)
(a) High Temperature Melts: In order to improve and evaluate the accuracy of the surface laser-light scattering (SLLS) apparatus, we have measured the surface tension and viscosity of molten NaCl in the temperature range up to 1243 K. The accuracy of the measured surface tension is estimated to be ±4.1%. The surface tension and viscosity of molten silicon (99.9995%) have been measured in the temperature range from 1685 to 1850 K. The obtained surface tension has been correlated by the following equation: σ= 800-0.13(T-1685) mNmィイD1-1ィエD1.
(b) Xe-Water: By using the developed apparatus, we observed variations of surface tension and viscosity of the Xe aqueous solution before formation and after decomposition of the hydrate crystals by varying the system pressure at constant temperature.
(2) Dynamic Light scattering Method (Viscosity and Diffusion Coefficient)
We have attempted to apply the dynamic light scattering method to observe the viscous behavior near the melting point of LiィイD22ィエD2BィイD24ィエD2OィイD27ィエD2 in the temperature range above 1000 K. We have also attempted to apply the technique in order to detect the change of diffusion coefficient before hydrate formation of Xe-water system.
|
