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1998 Fiscal Year Final Research Report Summary

Development of New Plasma Diagnostics Detectors for the Purpose of the Simultaneous Detection of X-rays, Electrons, Neutral Particles, and Ions with Their Species Resolution Having High Outputs in Wide Energy Ranges

Research Project

Project/Area Number 09558054
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field プラズマ理工学
Research InstitutionUniversity of Tsukuba

Principal Investigator

CHO Teruji  Univ.Tsukuba, Institute of Physics, Professor, 物理学系, 教授 (80171958)

Co-Investigator(Kenkyū-buntansha) TANAKA Shigetoshi  Kyoto University, Professor Emeritus, 名誉教授 (20025240)
KOHAGURA Junko  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Research Associate, プラズマ研究センター・物理学系, 助手 (60302345)
SATO Kenji  SII,Development of Semiconductor Processes, Researcher, 技術本部・開発課, 研究員
NAKASHIMA Yousuke  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Assistant Prof., プラズマ研究センター・物理学系, 講師 (00188939)
KONDOH Mafumi (HIRATA Maf)  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Assistant Prof., プラズマ研究センター・物理学系, 講師 (70222247)
Project Period (FY) 1997 – 1998
KeywordsNeutral Particle Diagnostics / Electron Diagnostics / X-ray Diagnostics / Semiconductor Detectors / Electron Temperatere Diagnostics / Ion Temperature Diagnosdics / Wide Energy Range Detectors / Plasma Diagnostics
Research Abstract

Our newly proposed theory on the x-ray-energy response of semiconductor detectors is applied for the design and fabrication of new semiconductor plasma detectors for simultaneously measurable x rays, electrons, neutral particles, and ions with their species resolution.
This new detector is applied as a new collector using the application and combination with our developed differential-spectrum ion-energy analyzer with electrostatic slanted grids [see Rev. Sci. Instrum. 66 (1995) 4928]. This special detection structure is applied for distinguishing ions with positive charges and electrons with negative charges curved under the detector fields, as well as x rays and neutral particles with straight trajectories in the detector fields because of no charges.
In addition, a semiconductor detector collector is used for distinguishing the x rays and neutral particles on the basis of the difference of the mean free path in the semiconductor detector (i.e., shorter struggling distance for neutral particles and longer penetration length for x rays.
These differences are newly utilized by this research program for constructing new formula and computer simulation. These results for the new calculation method are based on the nuclear and electron interaction with the incident particles ; these details will be published in journals.
Several papers have already been published in journals ; the references are listed in this report sheet (see the rear side of this short summary report). As shown in the papers, these methods have already been verified in plasma experiments and routinely applied in actual plasma diagnostics.

  • Research Products

    (12 results)

All Other

All Publications (12 results)

  • [Publications] T.Cho et al.: "Development and Characterization of Semiconductor Ion Detectors for Plasma Diagnostics in the Range over 0.3 keV" Review of Scientific Instruments. 68. 324-327 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Cho et al.: "Characterization of New Semiconductor Detectors for X-ray Tomography in the ASDEX Upgrade Tokamak and Its Generalized Physics Interpretations" Review of Scientific Instruments. 68. 774-777 (1997)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Cho et al.: "Characterization and Interpretation of the Quantum Efficiencies of Multilayer Semiconductor Detectors Using a New Theory" Journal of Synchrotron Radiation. 5. 877-879 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] J.Kohagura et al.: "Alternative Principle and Method in X-ray Diagnostics for Plasma Electron Temperatures" Physical Review E. 56. 5884-5893 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] J.Kohagura et al.: "International Collaboration Researches on the Effects of a New Theory on the Plasma X-ray Diagnostics Using Semiconductor X-ray Detectors" Plasma Physics Reports (Fizika Plazmy). 24. 218-221 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Sakamoto et al.: "Characterization of a Semiconductor Detector and Its Application for Ion Diagnostics Using a Novel Ion Energy Spectrometer" Review of Scientific Instruments. 70. 857-860 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Cho et al.: "Development and Characterization of Semiconductor Ion Detectors for Plasma Diagnostics in the Range over 0.3keV" Review of Scientific Instruments. 68. 324-327 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Cho et al.: "Characterization of New Semiconductor Detectors for X-ray Tomography in the ASDEX Upgrade Tokamak and Its Generalized Physics Interpretations" Review of Scientific Instruments. 68. 774-777 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Cho et al.: "Characterization and Interpretation of the Quantum Efficiencies of Multilayer Semiconductor Detectors Using a New Theory" Journal of Synchrotron Radiation. 5. 877-879 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] J.Kohagura et al.: "Alternative Principle and Method in X-ray Diagnostics for Plasma Electron Temperatures" Physical Review E. 56. 5884-5893 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] J.Kohagura et al.: "International Collaboration Researches on the Effects of a New Theory on the Plasma X-ray Diagnostics Using Semiconductor X-ray Detectors" Plasma Physics Reports (Fizika Plazmy). 24. 218-221 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Sakamoto et al.: "Characterization of a Semiconductor Detector and Its Application for Ion Diagnostics Using a Novel Ion Energy Spectrometer" Review of Scientific Instruments. 70. 857-860 (1999)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1999-12-08  

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