1998 Fiscal Year Final Research Report Summary
Study on ICP Mass Spectrometry with Solutions capturing Solid-Sample Particles generated by Laser Ablation
| Project/Area Number |
09650889
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
工業分析化学
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| Research Institution | Nagoya University |
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Principal Investigator |
TANAKA Tomokazu Nagoya Univ., Graduate School of Engineering, Research Associate, 工学研究科, 助手 (40236609)
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| Project Period (FY) |
1997 – 1998
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| Keywords | ICP mass spectrometry / Laser Ablation / Solid Samples / Direct Analysis / Trace Analysis / Fine Ceramics / Steel Samples |
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| Research Abstract |
In order to improve the characteristics of quantitative analysis in laser ablation (LA)/ICP-MS, we investigated the utilization of solutions in which solid-sample particles generated by LA were collected. In our first method, sample solutions were prepared by irradiating laser pulses on the surface of a series of standard steel samples in pure water. A good linearity could be obtained when ion intensities of analytes in sample solutions were plotted against each concentration for standard steel samples. Compared to standard solutions prepared from reagents, however, the differences in the slope of calibration curves between sample and standard solutions were found. An increase in the difference was observed for elements with higher boiling points ; i. e., selective vaporization between elements was recognized. By using predetermined factors for compensating the selective vaporization another steel samples could be analyzed only with standard solutions.
As a second method, solid-sample particles, which were generated by a conventional LA system, were transferred into 0.1 mol/L HN0_3 solution with carrier gas. Calibration curves were obtained by plotting ion intensities of analytes in sample solutions against each concentration for standard steel samples. The calibration curves, however, differed from those for standard solutions in terms of the slope, and furthermore, the plotted points scattered. By applying an internal standard method, the calibration curves for Co and Mo overlapped between sample and standard solutions. In an application to the analysis for a standard sample of sintered silicon nitride. both accuracy and precision were almost satisfactory. The possibility of analyzing sintered fine-ceramics in an extremely short time was found.
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