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[Publications] A.Ichimiya,K.Hayashi,E.D.Williams,T.L.Einstein,M.Uwaha and K.Watanabe: "Decay of Silicon Mound : Scaling Laws and Description with Continuum Step Parameters."Phys.Rev.Lett.. 84. 3662-3665 (2000)
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[Publications] K.Hayashi and A.Ichimiya: "Formation and Decay Processes of Three-Dimensional Silicon Islands on the Si(111)7×7 Surface."Appl.Surf.Sci.. 162/163. 37-41 (2000)
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[Publications] A.Ichimiya and K.Hayashi,: "Thermal Decay of Isolated Single Silicon Mounds on Si(111) Surfaces"Surface Rev.Lett.. 7. 571-576 (2000)
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[Publications] 一宮彪彦,林和彦: "シリコン表面に形成されたナノ構造の安定性と崩壊"応用物理. 69. 1330-1334 (2000)
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[Publications] A.Ichimiya,M.Suzuki and S.Nishida,: "Thermal Relaxation of Isolated Silicon Pyramids on the Si(100)2×1 Surface."Surf.Sci.. (印刷中). (2001)
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[Publications] H.Suzuki,H.Nakahara,S.Miyata and A.Ichimiya,: "Surface Morphology of Ga-Adsorbed Si(113) Surface."Surface Science,. (印刷中). (2001)
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[Publications] M.Uwaha and K.Watanabe: "Decay of an Island on a Facet via Surface Diffusion"J.Phys.Soc.Jpn.. 69. 497-503 (2000)
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[Publications] M.Sato,M.Uwaha and Y.Saito: "Instabilities of Steps Induced by the Drift of Adatoms and Effect of the Step Permeability"Phys.Rev.. B62. 8452-8472 (2000)
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[Publications] M.Sato,M.Uwaha and Y.Saito: "Instabilities of Permeable Steps Induced by the Drift of Adatoms"Surf.Rev.Lett.. 7-5/6. 607-611 (2000)
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[Publications] R.Held,B.Ishaug,A.M.Dabiran,A.Parkhomovsky,and P.I.Cohen,: "Rate equation model of GaN epitaxy on GaN B by Molecular Beam Epitaxy,"J.Appl.Phys.,. V87. 1219-1223 (2000)
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[Publications] R.Held,G.Nowak,A.M.Dabiran,B.Ishaug,A.Parkhomovsky,and P.I.Cohen,I.Grzegory,and S.Porowski,: "Structure and composition of GaN(0001) A and B surfaces,"J.Appl.Phys.,. V85. 7697-7701 (1999)
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[Publications] A.Parkhomovsky,B.Ishaug,A.M.Dabiran,and P.I.Cohen,: "Growth of Hf and HfN on GaN by molecular beam epitaxy,"J.Vac.Sci.Technol.,. VA17. 2162-2166 (1999)
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[Publications] N.Li,T.Yoshinobu and H.Iwasaki: "Scanning tunneling microscopy nanofabricatin of electronic industry compatible thermal Si oxide"Ultramicroscopy,. 82,1-4. 97-101 (2000)
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[Publications] K.Sudoh and H.Iwasaki: "Nanopit Formation and Manipulation of Steps on Si(001) at High Temperatures with a Scanning Tunneling Microscope"Jpn.J.Appl.Phys.,. 39. 4621-4623 (2000)
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[Publications] M.Gotoh,K.Sudoh and H.Iwasaki: "Roughening of the Si/SiO2 interface during SC1-chemical treatment studied by scanning tunneling microscopy"J.Vac.Sci.Technol.. B18(4)Jul/Aug. 2165-2163 (2000)
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[Publications] H.Minoda,T.Shimakura,K.Yagi,F-J Meyer zu Herringdorf and M.Horn von Hoegen: "Formation of hill and valley structures on Si(111) vicinal surfaces studied by spot-profile-analyzing LEED,"Phys.Rev.. B61. 5672-5678 (2000)
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[Publications] M.Degawa,K.Thuermer,Morishima,H.Minoda,K.Yagi and E.D.Williams :: "Initial stage of in-phase step wandering on Si(111) vicnal surfaces"Surface Sci.. (印刷中). (2001)
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[Publications] D.Degawa,H.Minoda,Y.Tanishiro and K.Yagi: "In-phase step wandering on Si(111) vicinal surfaces : Effect of direct current heating tilted from the step-dwon direction."Phys.Rev.. (印刷中). (2001)
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[Publications] K.Sudoh,H.Iwasaki,and E.D.Williams,: "Facet Growth due to attractive step-step interactions on vicinal Si(113),"Surface Science. 452. L273-L278 (2000)
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[Publications] S.Aggarwal,A.P.Monga,S.R.Perusse,R.Ramesh,V.Ballarotto,E.D.Williams,B.R.Chalamala,Y.Wei,and R.H.Reuss,: "Spontaneous Ordering of Oxide Nanostructures,"Science. 287. 2235-2237 (2000)
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[Publications] J.-Y.Park,R.J.Phaneuf,and E.D.Williams,: "Variation of Threshold Field in Field-Induced Fabrication of Au Nanodots on Ultrathin in-situ Grown Silicon Oxide,"Surface Science. 470. L69-L74 (2000)
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[Publications] M.Giesen and T.L.Einstein,: "Analysis of Terrace Width Distributions on Vicinal CopperSurfaces Using the Wigner Surmise : Comparison with Gaussian Approximation"Surface Sci.. 449. 191-206 (2000)
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[Publications] H.L.Richards,Saul D.Cohen,T.L.Einstein,and M.Giesen,: "Extraction of Step-Repulsions Strengths from Terrace Width Distributions : Statistical and Analytic Considerations,"Surface Sci.. 453. 59-74 (2000)
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[Publications] O.Pierre-Louis and T.L.Einstein,: "Electromigration of Single-Layer Clusters,"Phys.Rev.. B・62. 13697-13706 (2000)