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2000 Fiscal Year Final Research Report Summary

Electron Wave Interference in Semiconductor Biprism of Tungsten Wire for Lateral Coherence Estimation

Research Project

Project/Area Number 10305024
Research Category

Grant-in-Aid for Scientific Research (A).

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionTOKYO INSTITUTE OF TECHNOLOGY

Principal Investigator

FURUYA Kazuhito  Graduate School of Science and Engineering TOKYO INSTITUTE OF TECHNOLOGY Professor, 大学院・理工学研究科, 教授 (40092572)

Co-Investigator(Kenkyū-buntansha) MACHIDA Nobuya  Graduate School of Science and Engineering TOKYO INSTITUTE OF TECHNOLOGY Research Assistant, 大学院・理工学研究科, 助手 (70313335)
SUHARA Michihiko  Graduate School of Engineering, Tokyo Metropolitan University Associate Professor, 工学研究科, 助教授 (80251635)
MIYAMOTO Yasuyuki  Graduate School of Science and Engineering, TOKYO INSTITUTE OF TECHNOLOGY Associate Professor, 大学院・理工学研究科, 助教授 (40209953)
Project Period (FY) 1998 – 2000
KeywordsTungsten Wire / Electron Wave / Biprism / Coherent Emitter / Lateral Coherence / OMVPE Embedding Tungsten / Attractive Potential / Double Barrier Resonant Emitter
Research Abstract

To estimate the lateral coherence of the electron wave, we have studied the semiconductor biprism device. The device consists of a metal wire embedded in the semiconductor and positive-biased. The electron wave propagating normally the wire is deflected by the attractive field around the wire to form the interference fringe. Towards the device, the following achievements have been obtained. (1) The electron wave propagation was simulated to reveal conditions for high contrast of the interference pattern. The coherent hot electron emitter was proposed where the Fermi energy could be adjusted within O.3meV.This emitter generates the electron wave with the wave front spread more than 100nm, that is, high lateral coherence. (2) Stencil lift-off was proposed as a new lithography process for the metal of high melting point to form tungsten wires as narrow as 20nm, the smallest in the world. (3) Conditions are studied experimentally to successfully embed the tungsten wire of 25nm width in GaInAs or GaAs with OMVPE with flat top surface. (4) GaAs/tungsten interface was characterized to achieve excellent Schottky contact by optimizing of surface treatments. (5) GaAs devices with embedded tungsten wires and double-barrier resonant-tunneling-emitters were fabricated. Their current-voltage characteristics were measured to indicate the formation of the attractive potential field around the wire. (6) Ultra-fine array electrodes of 80nm-pitch were fabricated for the observation of the interference pattern.
Summarizing above, we have made it possible to generate the electron wave with enough high lateral coherence, achieved experimentally to form the attractive potential distribution around the metal wire in the semiconductor. By combining all, we will be able to estimate the lateral coherence of the electron wave.

  • Research Products

    (76 results)

All Other

All Publications (76 results)

  • [Publications] N.Machida: "Coherent hot electron emitter"Japanese Journal of Applied Physics. 40・1. 64-68 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Y.Zhang: "A versatile hot electron emitter of InGaAs/AlAs heterostructure with wide energy range at high current density"Physica E. 7. 851-854 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Sakai: "Theoretical relation between spatial resolution and efficiency of detection in scanning hot electron microscope"Japanese Journal of Applied Physics. 39・9A. 5256-5260 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Gustafson: "Lateral current confinement in selectively grown resonant tunneling transistor with an embedded gate"Physica E. 7. 819-822 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Numerical simulation of hot electron interference in a solid state biprism : Conditions for interference observation"Journal of Applied Physics. 88. 2885-2891 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Nagase: "Peak width analysis of current-voltage characteristics of triple-barrier resonant tunneling diodes"Japanese Journal of Applied Physics. 39・6A. 3314-3318 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.A.M.Hansson: "Simulation of interference patterns in solid-state biprism devices"Solid-State Electronics. 44. 1275-1280 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "First Fabrication of GaInAs/InP Buried Metal Heterojunction Bipolar Transistor and Reduction of Base-Collector Capacitance"Japanese Journal of Applied Physics. 39・6A. L503-L505 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Fabrication and transport properties of 50-nm-wide Au/Cr/GaInAs electrode for electron wave interference device"Applied Surface Science. 150-160・1-4. 179-185 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "Toward nano-metal buried structure in InP-20nm wire and InP buried growth of tungsten"Physica E. 7・3-4. 896-901 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "GaAs buried growth over tungsten stripes using TEG and TMG"Journal of Crystal Growth. 221・1-4. 212-219 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Numerical simulation of hot electron interference in solid-state biprism"25^<th> International Conference on the Physics of Semiconductors. M261. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "CBC reduction in GaInAs/InP buried metal heterojunction bipolar transistor"12^<th> International Conference on Indium Phosphide and Related Materials. TuB1.6. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "GaAs buried growth over tungsten stripes using TEG and TMG"10^<th> International Conference on Metalorganic Vapor Phase Epitaxy. Tue-3. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Very shallow n-GaAs ohmic contact with 10nm-thick GaInAs layer"19^<th> Electronic Materials Symposium. B2. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Nagase: "Phase breaking effect appearing in I-V characteristics of double-barrier resonant-tunneling diodes-Theoretical fitting over four orders of magnitude"2000 International Conference on Solid State Devices and Materials. D-6-5. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "Characterization of hot electron transmission tunneling through the gap potential in scanning hot electron microscopy"10^<th> International Conference on Solid Films and Surface. Mo-P-167. (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Analysis of phase-breaking effects in triple-barrier resonant-tunneling diodes"Japanese Journal of Applied Physics. 38・7A. 4017-4020 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Analysis of electron incoherence effects in solid-state biprism devices"Physics B. 272. 82-84 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] L.E.Wernersson: "Lateral confinement in a resonant tunneling transistor with a buried metallic gate"Applied Physics Letters. 74・2. 311-313 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Suhara: "Gated tunneling structures with buried tungsten grating adjacent to semiconductor hetrostructures"Japanese Journal of Applied Physics. 38・6A. 3466-3469 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Barrier thickness dependence of peak current density in GaInAs/lAlAs/InP resonant tunneling diodes by MOVPE"Solid-State Electronics. 43. 1395-1398 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Kikegawa: "Shortening of detection time for observation of hot electron spatial distribution by scanning hot electron microscopy"Japanese Journal of Applied Physics. 38・4A. 2108-2113 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "Comparison between Fermi-Dirac and Boltzmann methods for band-bending calculations of Si/CaF_2/Au hot electron emitter"Japanese Journal of Applied Physics. 38・4A. 1905-1908 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "Design and experimental characteristics of n-Si/CaF_2/Au hot electron emitter for use in scanning hot electron microscopy"Japanese Journal of Applied Physics. 38・8. 4887-4892 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "Theoretical and experimental characterizations of hot electron emission of n-Si/CaF_2/Au emitter used in hot electron detection experiment"Physica B. 272. 425-427 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Analysis of electron coherence effects in solid-state biprism devices"The 11^<th> International Conference on Nonequilibrium Carrier Dynamics in Semiconductors(HCIS-11). MoP-21. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Gustafson: "Lateral quantum confinement in selectively grown resonant tunneling transistor with an embedded gate"The 9^<th> International Conference on Modulated Semiconductor Structures(MSS9). G09. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Suhara: "A study of the regrown semiconductor interface including patterned metal using resonant tunneling structures fabricated in the overgrown process"7^<th> Internatioanl Conference on the Formation of Semiconductor Interfaces(ICFSI7). 0Fr02. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "A versatile hot electron emitter of InGaAs/AlAs heterostructure with wide energy range at high current density"The 9^<th> International Conference on Modulated Semiconductor Structures(MSS9). N13. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.Zhang: "Theoretical and experimental characterizations of hot electron emission of n-Si/CaF2/Au emitter used in hot electron detection experiment"The 11^<th> International Conference on Nonequilibrium Carrier Dynamics in Semiconductors(HCIS-11). ThP-18. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "Proposal of buried metal heterojunction bipolar transistor and fabrication of HBT with buried tungsten"International Conference on Indium Phosphide and Related Materials. TuA1-4. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Anomalous current in 50 nm width Au/Cr/GaInAs electrode for electron wave interference device"3^<rd> International Symposium on Control of Semiconductor Interfaces. A5-6. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Arai: "Toward nano-metal buried in InP structure-20 nm wide tungsten wire and InP buried growth of tungsten-"The 9^<th> International Conference on Modulated Semiconductor Structures(MSS9). D21. (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Oobo: "Effect of spacer layer thickness in energy level width narrowing in GaInAs/InP resonant tunneling diodes grown by OMVPE"Japanese Journal of Applied Physics. 37・2. 445-449 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Metal-Insulator-Semiconductor emitter with epitaxial CaF_2 layer as insulator"Journal of Vacuum Science and Technology. B16. 851-854 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Sub-micron GaInAs/InP hot electron transistors by EBL process and size dependence of current gain"Solid State Electronics. 42・7-8. 1467-1470 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Proposal for a solid state biprism device"Japanese Journal of Applied Physics. 37・8. 4311-4315 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Kikegawa: "Characteristics and reduction of noise in scanning hot electron microscopy"Japanese Journal of Applied Physics. 37. 6580-6584 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] H.Hongo: "Wrapped alignment mark for fabrication of interference/diffraction hot electron devices"Japanese Journal of Applied Physics. 37・3B. 1518-1521 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Kokubo: "25nm pitch GaInAs/InP buried structure by calixarene resist"Japanese Journal of Applied Physics. 37・7A. L827-L829 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "25nm pitch buried structure : Improvement by calixarene as EB resist and TBP as P source in OMVPE regrowth"Journal of Vacuum Science and Technology. 16・6. 3894-3898 (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "Analysis of deflection sub-milimeter-wave amplifier"11^<th> International Vacuum Microelectornics Conference. (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "GaInAs/AlAs/InP resonant tunneling diodes by MOVPE"Topical Workshop on Heterostructure Microelectronics(TWHM'98). (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Suhara: "Evaluation of phase coherent length at high temperature up to 180 K using triple barrier resonant tunneling diode"25^<th> International Symposium on Compound Semiconductor. We-P23. (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Suhara: "Gated resonant tunneling structures with buried tungsten grating adjacent to semiconductor heterostructure"International Conference on Solid State Devices and Materials. C-2-2. (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida: "Analysis of phase breaking effect in triple-barrier resonant-tunneling diodes"6^<th> International Workshop on Computational Electronics(IWCE-6). TuE14. (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Miyamoto: "25nm pitch GaInAs/InP buried structure by calixarene resist"42^<nd> International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication. (1998)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Machida and K.Furuya: "Coherent hot-electron emitter"Jpn.J.Appl.Phys.. vol.40 [1]. 64-68 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.Y.Zhang, Y.Ikeda, Y.Miyamoto, K.Furuya, and N.Kikegawa: "A versatile hot electron emitter of InGaAs/AlAs heterostructure with wide energy range at high current density"Physica E. vol., 7. 851-854 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Sakai, K.Furuya, B.Y.Zhang, and S.Karas: "Theoretical relation between spatial resolution and efficiency of detection in scanning hot electron microscope"Jpn.J.Appl.Phys.. vol.39 [9A]. 5256-5260 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.Gustafson, M.Suhara, K.Furuya, L.Samuelson, and W.Seifert: "Lateral current confinement in selectively grown resonant tunneling transistor with an embedded gate"Physica E. vol.7. 819-822 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Machida and K.Furuya: "Numerical simulation of hot electron interference in a solid state biprism : Conditions for interference observation"J.Appl.Phys.. vol.88. 2885-2891 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Nagase, M.Suhara, Y.Miyamoto, and K.Furuya: "Peak width analysis of current-voltage characteristics of triple-barrier resonant tunneling diodes"Jpn. J.Appl. Phys.. vol.39[6A]. 3314-3318 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.A.M.Hansson, N.Machida, K.Furuya, L.Wernnerson, and L.Samuelson: "Simulation of interference patterns in solid-state biprism devices"Solid-State Electronics. vol.44. 1275-1280 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Arai, Y.Harada, S.Yamagami, Y.Miyamoto, and K.Furuya: "First Fabrication of GaInAs/InP Buried Metal Heterojunction Bipolar Transistor and Reduction of Base-Collector Capacitance"Jpn.J.Appl.Phys.. vol.39 [6A]. L503-L505 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Miyamoto, A.Kokubo, H.Oguchi, M.Kurahashi and K.Furuya: "Fabrication and transport properties of 50-nm-wide Au/Cr/GaInAs electrode for electron wave interference device"Applied Surface Science. vol.150-160 [1-4]. 179-185 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Arai, H.Tobita, Y.Harada, M.Suhara, Y.Miyamoto, and K.Furuya: "Toward nano-metal buried structure in InP-20 nm wire and InP buried growth of tungsten"Physica E. vol.7[3-4]. 896-901 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Arai, H.Tobita, Y.Miyamoto, and K.Furuya: "GaAs buried growth over tungsten stripes using TEG and TMG"Journal of Crystal Growth. vol.221[1-4]. 212-219 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Machida and K.Furuya: "Analysis of phasebreaking effects in triple-barrier resonant-tunneling diodes"Jpn.J.Appl.Phys.. vol.38 [7A]. 4017-4020 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Machida and K.Furuya: "Analysis of electron incoherence effects in solid-state biprism devices"Physica B. vol.272. 82-84 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] L.E.Wernersson, M.Suhara, N.Carlsson, K.Furuya, B.Gustafson, A.Litwin, L.Samuelson, and W.Seifert: "Lateral confinement in a resonant tunneling transistor with a buried metallic gate"Appl.Phys.Lett.. vol.74 [2]. 311-313 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Suhara, L.E.Wernersson, b.Gustafson, N.Carlsson, W.Seifert, A.Gustafson, J.O.Malm, A.Litwin, L.Samuelson, and K.Furuya: "Gated tunneling structures with buried tungsten grating adjacent to semiconductor hetrostructures"Jpn.J.Appl.Phys.. vol.38 [6A]. 3466-3469 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Miyamoto, H.Tobita, K.Oshima, and K.Furuya: "Barrier thickness dependence of peak current density in GaInAs/1AlAs/InP resonant tunneling diodes by MOVPE"Solid-State Electronics. vol.43. 1395-1398 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Kikegawa, B.Y.Zhang, Y.Ikeda, N.Sakai, K.Furuya, M.Asada, M.Watanabe, and W.Saito: "Shortening of detection time for observation of hot electron spatial distribution by scanning hot electron microscopy"Jpn.J.Appl.Phys.. vol.38 [4A]. 2108-2113 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.Zhang, K.Furuya, Y.Ikeda, and N.Kikegawa: "Design and experimental characteristics of n-Si/CaF_2/Au hot electron emitter for use in scanning hot electron microscopy"Jpn.J.Appl.Phys.. vol.38 [8]. 4887-4892 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.Zhang, Y.Ikeda, K.Furuya, and N.Kikegawa: "Comparison between Fermi-Dirac and Boltzmann methods for band-bending calculations of Si/CaF_2/Au hot electron emitter"Jpn.J.Appl.Phys.. vol.38 [4A]. 1905-1908 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B.zhang, Y.Ikeda, K.Furuya, and N.Kikegawa: "Theoretical and experimental characterizations of hot electron emission of n-Si/CaF_2/Au emitter used in hot elcetron detection experiment"Physica B. vol.272. 425-427 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Oobo, R.Takemura, K.Sato, M.Suhara, Y.Miyamoto, and K.Furuya: "Effect of spacer layer thickness in energy level width narrowing in GaInAs/InP resonant tunneling diodes grown by OMVPE"Jpn.J.Appl.Phys.. vol.37 [2]. 445-449 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Miyamoto, A.Yamaguchi, K.Oshima, W.Saitoh, and M.Asada: "Metal-Insulator-Semiconductor emitter with epitaxial CaF_2 layer as insulator"Journal of Vacuum Science and Technology B. vol.16. 851-854 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Miyamoto, J.Yoshinaga, H.Toda, T.Arai, H.Hongo, T.Hattori, A.Kokubo, and K.Furuya: "Submicron GaInAs/InP hot electron transistors by EBL process and size dependence of current gain"Solid-State Electronics. vol.42[7-8]. 1467-1470 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Machida, B.Hansson, K.Furuya, L.-E, Wernersson, and L.Samuelson: "Proposal for a solid state biprism device"Jpn.J.Appl.Phys.. vol.37 [8]. 4311-4315 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Kikegawa, K.Furuya, F.Vazquez, and Y.Ikeda: "Characteristics and reduction of noise in scanning hot electron microscopy"Jpn.J.Appl.Phys.. vol.37. 6580-6584 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] H.Hongo, y.Miyamoto, J.Suzuki, M.Suhara, and K.Furuya: "Wrapped alignment mark for fabrication of interference/diffraction hot electron devices"Jpn.J.Appl.Phys.. vol.37 [3B]. 1518-1521 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A.Kokubo, T.Hattori, H.Hongo, M.Suhara, Y.Miyamoto, and K.Furuya: "25 nm pitch GaInAs/InP buried structure by calixarene resist"Jpn.J.Appl.Phys.. vol.37 [7A]. L827-L829 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Miyamoto, A.Kokubo, T.Hattori, H.Hongo, M.Suhara, and K.Furuya: "25 nm pitch buried structure : Improvement by calixarene as EB resist and TBP as P source in OMVPE regrowth"Journal of Vacuum Science and Techonology B. vol.16[6]. 3894-3898 (1998)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2002-03-26  

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