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2001 Fiscal Year Final Research Report Summary

Single Electron Devices Based on NeoSilicon Materials

Research Project

Project/Area Number 11355014
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Electronic materials/Electric materials
Research InstitutionTokyo Institute of Technology

Principal Investigator

ODA Shunri  Tokyo Institute of Technology, Research Center for Quantum Effect Electronics, Professor, 量子効果エレクトロニクス研究センター, 教授 (50126314)

Co-Investigator(Kenkyū-buntansha) SHIMADA Toshikazu  Hitachi Central Research Lab, Researcher, 中央研究所, 企画室長
TSUCHIYA Yoshishige  Tokyo Institute of Technology, Research Center for Quantum Effect Electronics, Research Associate, 量子効果エレクトロニクス研究センター, 助手 (80334506)
Project Period (FY) 1999 – 2001
Keywordsnanocrystalline silicon / pulsed plasma processing / interface / nano-technology / single electron tunneling / single electron memory / ballistic transport / surface electron emitter
Research Abstract

A novel man-made material, NeoSilicon, is proposed. In NeoSilicon, both particle size and interparticle distance of nanocrystalline silicon quantum dots are precisely controlled. New functions in electron transport, photon emission and electron emission are expected due to quantum effect at room temperature and large interaction between dots. The bandgap is determined by the particle size. The conductivity is controlled mainly by tunneling distance. The transport characteristics are also controlled by charge quantization effect.
NeoSilicon is expected to be widely applicable to the key devices in electronics, including ultra-large-scale-integrated circuits, thin-film-transistors for liquid crystal displays and solar cells. Moreover, new field in electronics by using single electron devices, light emitting diodes, laser diodes, flat field-emission-devices and quantum cellular automata would be realized by NeoSilicon.
In order to implement NeoSilicon, precise control of particle size of 3- … More 5 nm and interparticle distance of 1-2 nm is essential. Using pulsed plasma processes, we have successfully prepared nanocrystalline silicon particles of 8 nm in diameter with size dispersion of 1nm, whose surfaces are covered by naturally formed oxide of 1.5 nm thickness. Major challenges include reduction of particle size by means of variation of pulsed-plasma processing conditions. Direct nitridation would be a promising method for the formation of tunneling barrier, since lower barrier height for nitride allows larger tunneling probability and self-limiting mechanism of nitride formation provides high accuracy control of interparticle distance.
Electrical properties of nanocrystalline silicon particles have been investigated by employing nanoscale electrodes, both planar and vertical configurations, prepared by electron-beam lithography. Coulomb blockade and Coulomb oscillations predominantly due to a single quantum dot are readily modeled as well as interactions of electrons between neighboring dots. Less

  • Research Products

    (55 results)

All Other

All Publications (55 results)

  • [Publications] D.F.Moore, W.I.Milne, S.Oda: "Nanostructured materials and devices for sensor and electronic applications"Power Engineering Journal. 13. 89-93 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Dutta, S.P.Lee, S.Hatatani, S.Oda: "Silicon Based Single Electron Memory Using Multi-Tunnel Junction Fabricated by Electron Beam Direct Writing"Applied Physics Letters. 75(10). 1422-1424 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Oda, D.F.Moore, W.I.Milne: "The nanostructuring of materials for device and sensor applications"IEE Engineering Science and Education Journal. 8(6). 281-285 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, S.Hara, T.Amano, S.Hatatani, S.Oda: "Preparation of Nanocrystalline Silicon Quantum Dots by Pulsed Plasma Processes with High Deposition Rates"Materials Research Society Symposium Proceedings. 571. 43-48 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Dutta, S.P.Lee, Y.Hayafune, S.Hatatani, S.Oda: "Single Electron Tunneling Devices Based on Silicon Quantum Dots Fabricated by Plasma Process"Japanese Journal of Applied Physics. 39(1). 264-267 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] F.Yun, B.J.Hinds, S.Hatatani, S.Oda, Q.X.Zhao, M.Willander: "Study of Structural and Optical Properties of Nanocrystalline Silicon Embedded in SiO2"Thin Solid Films. 375(1-2). 137-141 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Dutta, S.P.Lee, Y.Hayafune, S.Oda: "Electron-Beam Direct-Writing using RD2000N for Fabrication of Nano-Devices"Journal of Vacuum Science and Technology. 18(6). 2857-2861 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, S.Oda: "Conductance quantization in nanoscale vertical-structure silicon field-effect transistors with a wrap gate"Applied Physics Letters. 76(20). 2922-2924 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Fu, M.Willander, A.Dutta, S.Oda: "Carrier conduction in Si-nanocrystal-based single electron transistor-I. Effect of a gate bias"Superlattices and Microstructures. 28(3). 177-187 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Dutta, S.Oda, Y.Fu, M.Willander: "Electron Transport in Nanocrystalline-Si Based Single Electron Transistors"Japanese Journal of Applied Physics. 39(7B). 4647-4650 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.J.Hinds, K.Nishiguchi, A.Dutta, T.Yamanaka, S.Hatatani, S.Oda: "Two-Gate Transistor for the Study of Si/SiO2 Interface in SOI Nano-Channel and Nanocrystalline Si memory Device"Japanese Journal of Applied Physics. 39(7B). 4637-4641 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, S.Oda: "Electron transport in a single silicon quantum structure using a vertical silicon probe"Journal of Applied Physics. 88(7). 4186-4190 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Amit Dutta, Yoshinori Hayafune, Shunri Oda: "Single Electron Memory Devices Based on Plasma Derived Silicon Nanocrystals"Japanese Journal of Applied Physics. 39(8B). L855-L857 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] F.Yun, B.J.Hinds, S.Hatatani, S.Oda: "Room temperature single-electron narrow channel memory with silicon nanodots embedded in SiO2 matrix"Japanese Journal of Applied Physics. 39(8A). L792-L795 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Kastsuyama, K.Hosomi, M, Shirai, T.Shimada: "Polariton Quantum Wave Devices"The Symposium Future Electron Devices 2000. 54-59 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小田俊理: "21世紀への道 電子材料-ナノシリコンとネオシリコン-"Electrochemistry. 68(12). 294-296 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Fu, M.Willander, A.Dutta, S.Oda: "Carrier conduction in Si-nanocrystal-based single electron transistor-II. Effect of a drain bias"Superlattices and Microstructures. 28(3). 189-198 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 小田俊理: "21世紀の単電子デバイス"電気学会論文誌C. 121-C(1). 19-22 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, S.Oda: "A self-aligned two-gate single-electron transistor derived from 0.12μm lithography"Applied Physics Letters. 78(14). 2070-2072 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.J.Hinds, T.Yamanaka, S.Oda: "Charge Storage Mechanism in Nano-Crystalline Si Based Single Electron Memories"Materials Research Society Symposium Proceedings. 638. F2.2.1-F2.2.6 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] J.Omachi, R.Nakamura, K.Nishiguchi, S.Oda: "Retardation in the oxidation rate of nanocrystalline silicon quantum dots"Meterials Research Society Symposium Proceedings. 638. F5.3.1-F5.3.6 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, X.Zhao, S.Oda: "Fabrication and characterization of cold electron emitterbased on nanocrystalline silicon quantum dots"Materials Research Society Symposium Proceedings. 638. F5.9.1-F5.9.6 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Arai, J.Omachi, K.Nishiguchi, S.Oda: "Photoluminescence study of the self-limiting oxidation in nanocrystalline silicon quantum dots"Materials Research Society Symposium Proceedings. 664. A20.6.1-A20.6.6 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Oda, K.Nishiguchi: "Nanocrystalline silicon quantum dots prepared by VHF plasma enhanced chemical vapor deposition"Journal de Physique IV. 11(Pr.3). 1065-1071 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] B.J.Hinds, T.Yamanaka, S.Oda: "Emission Lifetime of Polarizable Charge Stored in Nano-Crystalline Si Based Single Electron Memory"Journal of Applied Physics. 90(12). 6402-6408 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Nishiguchi, S.Oda: "Proceedings of the 25th International Conference on the Physics of Semiconductors"Springer, Berlin. 1037-1038 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Oda: "APPC 2000, Electron transport in silicon nanodevices"World Scientific, Singapore. 67-72 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S. Oda, D. I. Moore and W. I. Milne: "The nanostructuring of materials for device and sensor applications"IEE Engineering Science and Education Journal. 281-285 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A. Dutta, S. P. Lee, S. Hatatani and S. Oda: "Silicon Based Single Electron Memory Using Multi-Tunnel Junction Fabricated by Electron Beam Direct Writing"Applied Physics Letters. 75(10). 1422-1424 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] D. F. Moore, W. I. Milne and S. Oda: "Nanostructured materials and devices for sensor and electronic applications"Power Engineering Journal. 13. 89-93 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Toshikazu Shimada, Genshiro Kawachi, Masahiko Ando and Yoshinobu Kimura: "Preliminary Discussion on Neosilicon for Device Applications"The First CREST Symposium on "Function Evolution of Materials and Devices based on Electron/Photon Related Phenomena". (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Katsuyama, K. Hosomi, M, Shirai and T, Shimada: "Polariton Quantum Wave Devices"The Symposium on Future Electron Devices 2000. 54-59 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] F. Yun, B. J. Hinds, S. Hatatani, S. Oda, Q. X. Zhao and M. Willander: "Study of Structural and Optical Properties of Nanocrystalline Silicon Embedded in SiO2"Thin Solid Films. 375(1-2). 137-141 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Fu, M. Willander, A. Dutta and S. Oda: "Carrier conduction in Si-nanocrystal-based single electron transistor-l. Effect of a gate bias"Superlattices and Microstructures. 28(3). 177-187 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Fu, M. Willander, A. Dutta and S. Oda: "Carrier conduction in Si-nanocrystal-based single electron transistor-ll. Effect of a drain bias"Superlattices and Microstructures. 28(3). 189-198 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi, S. Hara, T. Amano, S. Hatatani and S. Ode: "Preparation of Nanocrystalline Silicon Quantum Dots by Pulsed Plasma Processes with High Deposition Rates"Materials Research Society Symposium Proceedings. 571. 43-48 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Amit Dutta, S. P. Lee, Y. Hayafune and S. Oda: "Electron-Beam Direct-Writing using RD2000N for Fabrication of Nano-Devices"Journal of Vacuum Science and Technology. 18(6). 2857-2861 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi and S. Oda: "Electron transport in a single silicon quantum structure using a vertical silicon probe"Journal of Applied Physics. 88 (7). 4186-4190 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Amit Dutta, Yoshinori Hayafune and Shunri Oda: "Single Electron Memory Devices Based on Plasma Derived Silicon Nanocrystals"Japanese Journal of Applied Physics. 39(8B). L855-L857 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] F. Yun, B. J. Hinds, S. Hatatani and S. Oda: "Room temperature single-electron narrow channel memory with silicon nanodots embedded in SiO2 matrix"Japanese Journal of Applied Physics. 39(8A). L792-L795 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A. Dutta, S. Oda, Y. Fu and M. Willander: "Electron Transport in Nanocrystalline-Si Based Single Electron Transistors"Japanese Journal of Applied Physics. 39(7B). 4647-4650 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B. J. Hinds, K. Nishiguchi, A. Dutta, T. Yamanaka, S. Hatatani and S. Oda: "Two-Gate Transistor for the Study of Si/SiO2 Interface in SOl Nano-Channel and Nanocrystalline Si memory Device"Japanese Journal of Applied Physics. 39(7B). 4637-4641 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A. Dutta, S. P. Lee, Y. Hayafune, S. Hatatani and S. Oda: "Single Electron Tunneling Devices Based on Silicon, Quantum Dots Fabricated by Plasma Process"Japanese Journal of Applied Physics. 39(1). 264-267 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi and S. Oda: "Conductance quantization in nanoscale vertical-structure silicon field-effect transistors with a wrap gate"Applied Physics Letters. 76(20). 2922-2924 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Shimada: "Electron Transfer Characteristics and Potential Applications of Silicon-Based Nanostructures"Sixth China-Japan Symposium on Thin-Films. (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Toshikazu Shimada, Masahiko Ando and Shinya Yamaguchi: "Potential Device Applications of Neo-silicon and its Material Characterization"The 2^<nd> CREST Symposium on FEMD. (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Arai, J. Omachi, K. Nishiguchi and S. Oda: "Photoluminescence study of the self-limiting oxidation in nanocrystalline silicon quantum dots"Materials Research Society Symposium Proceedings. 664. A20.6.1-A20.6.6 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi, X. Zhao and S. Oda: "Fabrication and characterization of cold electron emitter based on nanocrystalline silicon quantum dots"Materials Research Society Symposium Proceedings. 638. F5.9.1-F5.9.6 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] J. Omachi, R. Nakamura, K. Nishiguchi and S. Oda: "Retardation in the oxidation rate of nanocrystalline silicon quantum dots"Materials Research Society Symposium. Proceedings. 638. F5.3.1-F5.3.6 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B. J. Hinds, T. Yamanaka and S. Oda: "Charge Storage Mechanism in Nano-Crystalline Si Based Single Electron Memories"Materials Research Society Symposium Proceedings. 638. F2.2.1-F2.2.6 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] B. J. Hinds, T. Yamanaka and S. Oda: "Emission Lifetime of Polarizable Charge Stored in Nano-Crystalline Si Based Single Electron Memory"Journal of Applied Physics. 90(12). 6402-6408 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Oda and K. Nishiguchi: "Nanocrystalline silicon quantum dots prepared by VHP plasma enhanced chemical vapor deposition"Journal de Physique IV. 11(Pr.3). 1065-1071 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi and S. Oda: "A self-aligned two-gate single-electron transistor derived from 0.12mm lithography"Applied Physics Letters. 78(14). 2070-2072 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishiguchi and S. Oda: "Ballistic transport under magnetic field in silicon vertical transistors, Proceedings of the 25th International Conference on the Physics of Semiconductors"Eds by N. Miura and T. Ando (Springer, Berlin, 2001). 1037-1038 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S. Oda: "Electron transport in silicon nanodevices, APPC 2000"Eds by Y. D. Yao et al (World Scientific, Singapore, 2001 ). 67-72 (2001)

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2003-09-17  

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