• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2000 Fiscal Year Final Research Report Summary

Development of Electrostatic Force Microscope with Spatial Resolution For Elementary Charge

Research Project

Project/Area Number 11554013
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section展開研究
Research Field 固体物性Ⅰ(光物性・半導体・誘電体)
Research InstitutionOsaka University

Principal Investigator

SUGAWARA Yasuhiro  Department of Electronic Engineering, Graduate School of Engineering, Osaka University Associate Professor, 大学院・工学研究科, 助教授 (40206404)

Project Period (FY) 1999 – 2000
Keywordsatomic force microscope / atomic force / electrostatic force microscope / electrostactic force / well-defined surface / atomic resolution / semiconductor surface / charge
Research Abstract

The electrostatic force microscope (EFM) offers new opportunity to measure a variety of electrostatic properties on the surface on a sub-micron scale, which result from nonuniform charge distribution and variations in surface work function. For example, potentiometry, imaging of contact-electrified charge and its dissipation process on insulating surfaces and so on have been demonstrated. Unfortunately, so far, the lateral resolution of the EFM has been insufficient. This is due to the following two main reasons : (i) It is rather difficult to measure weak distance dependence of the electrostatic force with a good signal-to-noise (S/N) ratio.(ii) It is much difficult to separate the electrostatic force from the van der Waals force.
In this project, we developed a novel method to detect the van der Waals and the electrostatic force interactions simultaneously, which was based on the Frequency modulation (FM) detection method in UHV.For the first time, the surface structure and the surface charge at atomic-scale point defects on the GaAs (110) surface were clearly resolved with true atomic resolution. The contrast of the electrostatic force image at a point defect showed monotonous change in the positive sample bias region, while it complicatedly changed in the negative sample bias region. From this bias voltage dependence, we could verify that the sign of the atomically resolved surface charge at the point defect was positive. Furthermore, we investigated the measurement condition of the atomic resolution imaging of the charge using the EFM.

  • Research Products

    (46 results)

All Other

All Publications (46 results)

  • [Publications] S.Morita and Y.Sugawara: "Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy"Appl.Surf.Sci.. 140・3-4. 406-410 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Minobe et.al: "Distance dependence of noncontact -AFM image contrast on Si(111)√3x√3-Ag structure"Appl.Surf.Sci.. 140・3-4. 298-303 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Orisaka et.al: "The atomic resolution imaging of metallic Ag(111)surface by noncontact atomic force microscope"Appl.Surf.Sci.. 140・3-4. 243-246 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Uchihashi et.al.: "Imaging of chemical reactivity and buckled dimers on Si(100)2x1 reconstructed surface with noncontact AFM"Appl.Sur.Sci.. 140・3-4. 304-308 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Sugawara et.al.: "True atomic resolution imaging of surface structure and surface charge on the GaAs(110)"Appl.Sur.Sci.. 140・3-4. 371-375 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Tomitori and T.Arai: "Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum"Appl.Sur.Sci.. 140・3-4. 432-438 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Sugawara et.al.: "Non-contact AFM Images Measured on Si(111)√3x√3-Ag and Ag(111) surfaces"Surface and Interface Analysis. 27・5-6. 456-461 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Uchihashi et.al.: "Self-Assembled Monolayer of Adenine Base on Graphite Studied by Noncontact Atomic Force Microscopy"Phys.Rev.B. 60・11. 8309-8313 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Morita et.al.: "Missing Ag Atom on Si(111)√3x√3-Ag Surface Observed Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 38・11B. L1342-L1344 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Yokoyama et.al.: "Atomically Resolved Silver Imaging on the Si(111)-(√3x√3)-Ag Surface Using a Noncontact Atomic Force Microscope"Phys.Rev.Lett.. 83・24. 5023-5026 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Yokoyama et.al.: "Optical beam deflection noncontact atomic force microscope with three dimensional beam adjustment mechanism"Rev.Sci.Instrum.. 71・1. 128-132 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Yokoyama et.al.: "Atomic Resolution Imaging on Si(100)2x1 and Si(100)2x1 : H Surfaces with Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 39・2A. L113-L115 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Uchihashi et.al.: "Identification of B-Form DNA in an Ultrahigh Vacuum by Noncontact-Mode Atomic Force Microscopy"Langmuir. 16・3. 1349-1353 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Morita et.al.: "Defects and Its Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy"Journal of Crystal Growth. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Morita et.al.: "Correlation of frequency shift discontinuity to atomic positions on a Si(111)7x7 surface by noncontact atomic force microscopy"Nanotechnology. Vol.11(In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Y.Sugawara et.al.: "Noncontact AFM imaging on Al-adsorbed Si(111)surface with an empty orbital"Appl.Surf.Sci.. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] T.Uchihashi et.al.: "High-resolution imaging of organic monolayers using noncontact AFM"Appl.Surf.Sci.. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] N.Suehira et.al.: "Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever"Appl.Surf.Sci.. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] R.Nishi et.al.: "Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy"Appl.Surf.Sci.. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Ashino et.al.: "Atomic-scale structure on a non-stoichiometric TiO_2(110)surface studied by noncontact AFM"Appl.Surf.Sci.. (In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 森田清三,菅原康弘: "AFMの現状と展開"表面科学. 20・5. 352-357 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 菅原康弘,森田清三: "非接触原子間力顕微鏡による単一分子解析"蛋白質 核酸 酵素. 44・14. 2119-2123 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 森田清三,菅原康弘: "原子間力顕微鏡による原子レベルの物性評価と計測"電気学会論文誌C. 119-C・10. 1109-1112 (1999)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 森田清三,菅原康弘: "ナノ力学に基づいた原子分子技術"生産と技術. 52・2(In press). (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 森田清三 編著 他: "走査型プローブ顕微鏡-基礎と未来予測-"丸善株式会社. 181 (2000)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.Orisaka, T.Minobe, Y.Sugawara and S.Morita: "The Atomic Resolution Imaging of Metallic Ag (111) Surface by Noncontact Atomic Force Microscope"Appl.Sur.Sci.. Vol.140, No.3-4. 243-246 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Minobe, T.Uchihashi, T.Tsukamoto, S.Orisaka, Y.Sugawara and S.Morita: "Distance Dependence of Noncontact AFM Image Contrast on Si (111) √<3>×√<3>-Ag Structure"Appl.Sur.Sci.. Vol.140, No.3-4. 298-303 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Uchihashi, Y.Sugawara, T.Tsukamoto, T.Minobe, S.Orisaka, T.Okada and S.Morita: "Imaging of Chemical Reactivity and Buckled Dimers on Si (100) 2×1 Reconstructed Surface with Noncontact AFM"Appl.Sur.Sci.. Vol.140, No.3-4. 304-308 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Sugawara, T.Uchihashi, M.Abe and S.Morita: "True Atomic Resolution Imaging of Surface Structure and Surface Charge on the GaAs (110)"Appl.Sur.Sci.. Vol.140, No.3-4. 371-375 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Abe, Y.Sugawara, K.Sawada, Y.Andoh and S.Morita: "Near-field Optical Imaging Using Force Detection with New Tip-Electrode Geometry"Appl.Sur.Sci.. Vol.140, No.3-4. 383-387 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Morita and Y.Sugawara: "Guidelines for the Achievement of True Atomic Resolution with Noncontact Atomic Force Microscopy"Appl.Sur.Sci.. Vol.140, No.3-4. 406-410 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Sugawara, T.Minobe, S.Orisaka, T.Uchihashi, T.Tsukamoto and S.Morita: "Non-contact AFM Images Measured on Si (111) √<3>×√<3> and Ag (111) Surfaces"Surface and Interface Analysis. Vol.27, No.5-6. 456-461 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Uchihashi, Y.Sugawara, K.Yokoyama, S.Morita and T.Okada: "Self-Assembled Monolayer of Adenine Base on Graphite Studied by Noncontact Atomic Force Microscopy"Phys.Rev.B. Vol.60, No.11. 8309-8313 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Morita, Y.Sugawara, S.Orisaka and T.Uchihashi: "Missing Ag Atom on Si (111) √<3>×√<3>-Ag Surface Observed by Noncontact Atomic Force Microscope"Jpn.J.Appl.Phys.. Vol.38, No.11B. L1342-L1344 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Yokoyama, T.Ochi, Y.Sugawara amd S.Morita: "Atomically Resolved Ag Imaging on Si (111) √<3>×√<3>-Ag Surface with Noncontact Atomic Force Microscope"Phys.Rev.Lett.. Vol.83, No.24. 5023-5026 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Yokoyama, T.Ochi, T.Uchihashi, M.Ashino, Y.Sugawara, N.Suehira and S.Morita: "Optical Beam Deflection Noncontact Atomic Force Microscope Optimized with Three-Dimensional Beam Adjustment Mechanism"Rev.Sci.Instru.. Vol.71, No.1. 128-132 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K.Yokoyama, T.Ochi, A.Yoshimoto, Y.Sugawara, S.Morita: "Atomic Resolution Imaging on Si (100) 2×1 and Si (100) 2×1-H Surfaces with Noncontact Atomic Force Microscope"Jpn.J.Appl.Phys.. Vol.39, No.2A. L113-L115 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Uchihashi, M.Tanigawa, M.Ashino, Y.Sugawara, K.Yokoyama, S.Morita and M.Ishikawa: "Identification of B-form DNA in an Ultrahigh Vacuum by Noncontact-mode Atomic Force Microscopy"Langmuir. Vol.16, No.3. 1349-1353 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Morita, M.Abe, K.Yokoyama and Y.Sugawara: "Defects and its Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy"J.Cryst.Growth. Vol.210. 408-415 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y.Sugawara, S.Orisaka and S.Morita: "Noncontact AFM Imaging on Al-adsorbed Si (111) Surface with an Empty Orbital"Appl.Sur.Sci.. Vol.157, No.4. 239-243 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] N.Suehira, K.Sugiyama, S.Watanabe, T.Fujii, Y.Sugawara and S.Morita: "Development of Low-Temperature Ultrahigh-Vacuum Noncontact Atomic Force Microscopy with PZT-lever and Scanning Tunneling Microscope"Appl.Sur.Sci. Vol.157, No.4. 343-348 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] R.Nishi, I.Houda, T.Aramata, Y.Sugawara and S.Morita: "Phase change Detection of Attractive Force Gradient by Using a Quartz Resonator in Noncontact Atomic Force Microscopy"Appl.Sur.Sci. Vol.157, No.4. 332-336 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T.Uchihashi, M.Ashino, T.Ishida, Y.Sugawara, M.Komiyama, W.Mizutani, Y.Yokoyama, S.Morita, H.Tokumoto and M.Ishikawa: "High Resolution Imaging of Organic Monolayers Using Noncontact AFM"Appl.Sur.Sci. Vol.157, No.4. 244-250 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita, and M.Ishikawa: "Atomic-Scale Structures on a Non-Stoichiometric TiO_2 (110) Surface Studied by Noncontact AFM"Appl.Sur.Sci. Vol.157, No.4. 212-217 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.Morita, Y.Sugawara, K.Yokoyama and T.Uchihashi: "Correlation of Frequency Shift Discontinuity to Atomic Position on a Si (111) 7×7 Surface by Non-Contact Atomic Force Microscopy""Nanotechnology. Vol.11. 120-123 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita and M.Ishikawa: "Atom-Resolved Images of Defect-Induced Structure on Non-stoichiometric TiO_2 Surface by STM and Noncontact AFM"Phys.Rev.B. Vol.61, No.20. 13955-13959 (2000)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 2002-03-26  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi