| Research Abstract |
An atomic force microscope (AFM) is the apparatus that can measure in-situ both surface structure and interaction forces, and is imrortant as a prototype for new compounded equipment development used for interface research in the future. As the first step, using AFM used from the former, AFM images and surface force profiles of mica surfaces on which surfactants and polymers adsorb in their aqueous solutions are measured and their adsorption mechanisms are investigated. A new apparatus, which is combined optical microscope and AFM and can measure surface force and optical image at the interface simultaneously, is developed. By using this apparatus, the existence of air bubbles of nano size is checked on the hydrophobic surface in aqueous solution, and presumption of the origin of the long-range attractive force between hydrophobic surfaces is investigated. Next, using the scanning near field optical microscope (SNOM) that has a similar scanning mechanism to AFM, in-situ surface observa
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tion in liquid is tried. For this trial, using argon laser for the source of luminescence from the probe, in-situ observation of the glass surface in solution is successfully carried out and a surface image and a surface optical image are obtained. For about other systems, it is found out that aqueous solutions of electrolyte, surfactant, polymer, etc., and transparent samples such as quarts and glass are applicable. And it is found out that a surface fluorescence image may be obtained if the fluorescence probe is introduced onto the surface and an excitation light is employed for a light source. As these applications, a fine spectroscopic analysis can be developed. However, since the weak point where S/N ratio is bad because of weak light source is expected, the sensitivity of usual FTIR is examined first. Consequently, it is found out that influence of trace contamination cannot be disregarded and devices, such as employing vacuumed sample room and pure optical fiber, are required. Therefore, the application to a fine spectroscopic analysis needs to wait for improvement of future equipment. Less
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