2000 Fiscal Year Final Research Report Summary
Digital angle reference by referring atomic array on crystalline surface
Project/Area Number |
11650119
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
機械工作・生産工学
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Research Institution | Nagaoka University of Technology |
Principal Investigator |
AKETAGAWA Masato Faculty of Engineering, Nagaoka University of Technology, Associate Professor, 工学部, 助教授 (10231854)
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Co-Investigator(Kenkyū-buntansha) |
TAKADA Koji Faculty of Engineering, Nagaoka University of Technology, Professor, 工学部, 教授 (80126474)
|
Project Period (FY) |
1999 – 2000
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Keywords | angle measurement / scanning tunneling microscope / regular crystalline lattice / 2 dimensional symmetry |
Research Abstract |
An atomic array on crystalline surface is stable and uniform over wide area when the crystal is stress free. Therefore, the atomic array on crystalline surface is also thought to be a kind of angle-reference due to its 2-dimensional symmetry. Using a scanning tunneling microscope (STM), it is possible to obtain an atomic image on crystalline surface in air. An ultra precision unit-angle- reference and digital angle scale by referring a crystalline array on a crystalline surface can be achieved by combining it and STM. With the research fund, we have constructed an ultra precision unit-angle-rotation stage by combining a crystalline array on crystalline surface as a reference and a STM as a detector. Graphite crystal is selected as a reference crystal, an angle between the two neighboring crystalline orientation on the graphite crystalline surface, which should be 60 degree, is chosen as reference unit-angle. Using the ultra precision unit-angle-rotation stage, the angle between the two neighboring crystalline orientation is compared with calibrated angle of polygon mirror.
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