2000 Fiscal Year Final Research Report Summary
Development of Two Beam Total-Reflection X-Ray Fluorescence and its evaluation of Analytical Performance
| Project/Area Number |
11650828
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
工業分析化学
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| Research Institution | Tohoku University |
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Principal Investigator |
TSUJI Kouichi Institute for Materials Research, Tohoku University, Research Associate, 金属材料研究所, 助手 (30241566)
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| Co-Investigator(Kenkyū-buntansha) |
WAGATSUMA Kazuaki Institute for Materials Research, Tohoku University, Professor, 金属材料研究所, 教授 (30158597)
MATSUDA Hideyuki Institute for Materials Research, Tohoku University, Research Associate, 金属材料研究所, 助手 (00181735)
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| Project Period (FY) |
1999 – 2000
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| Keywords | X-Ray Fluorescence / Total Reflection / Surface analysis / Thin-fim Analysis / Non-destructive Analysis |
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| Research Abstract |
I developed a new equipment "2 x-ray beams excitation total reflection x-ray fluorescence (TXRF)" by modified the large goniometer that was developed by previous grant (A, 07555260). This goniometer was placed on the table of an x-ray generator of anode-rotating type (Rigaku, RU-200). The incident angle of the x-rays from this x-ray generator was changed by tilting one axis (φ) of the goniometer. A sealed-type x-ray tube was attached on another arm of the goniometer. The incident angle (χ) of the sealed-type x-ray tube was changed by moving this arm. By using this system, TXRF analysis was possible with two different x-ray beams, whose incident angle were independently controlled. Due to my long stay in Belgium and England, it took 1 year and a half to develop the above special equipment. Therefore, the term of project was not enough to finish the evaluation of the proposed method. However, it was confirmed that x-ray fluorescent intensity was enhanced by two x-ray beams irradiation. I will continuously investigate the analytical performance of this method.
During the term of this project, another method : "grazing-exit electron probe microanalysis (GE-EPMA)" was also proposed. This method enables surface-sensitive microanalysis. GE-EPMA was applied to particle analysis and thin-film analysis. The parts of the results obtained by this method were included in the report booklet of this project.
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