• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2002 Fiscal Year Final Research Report Summary

Development of nm-scale soft-X-ray spectroscopy electron microscope and its application to BN materials

Research Project

Project/Area Number 12440079
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field 固体物性Ⅰ(光物性・半導体・誘電体)
Research InstitutionTohoku University

Principal Investigator

TERAUCHI Masami  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Professor, 多元物質科学研究所, 教授 (30192652)

Co-Investigator(Kenkyū-buntansha) SAITOH Koh  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Research Associate, 多元物質科学研究所, 助手 (50292280)
TSUDA Kenji  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Associate Professor, 多元物質科学研究所, 助教授 (00241274)
Project Period (FY) 2000 – 2002
KeywordsSof-X-ray spectroscopy / Transmission electron microscope / BN / DOS of valence bands / loco-regional
Research Abstract

We have developed a high energy-resolution soft-X-ray spectrometer for a transmission electron microscope to obtain the information of the density of states(DOS)of the valence band (occupied states) from identified small specimen areas
The spectrometer was composed of varied-line-spacing(VLS)gratings and a CCD detector. An energy range from 60eV to 1200eV was accessible by using two VLS gratings, which have line densities of 1200 and 2400 lines/mm. the size of the CCD detector was 27.6x27.6mm2,which corresponds to a collection angle of 6.5x10.^<-4>sr. By introducing X-ray reflection flat mirrors, spectral intensity was improved by 2.2 times. Thus, the effective collection angle of the spectrometer was 1.4x10.^<-3>sr. Energy resolutions of this spectrometer for Si L-emission(〜100eV),B K-emission(〜180eV)and Cu L-emission(〜930eV)were evaluated to be 0.1,0.4 and 1.4eV, respectively.This spectrometer successfully obtained the DOS of the valence band from specified amall specimen areas of h,c,w-BN,α, βboron, Si, carbon allotropes and quasicrystals
We have been designing a new VLS grating to improve the energy resolution with a help of another Grant-in-Aid for Scientific research(B). The new spectrometer will give us an energy resolution of about 0.7eV at 1000eV

  • Research Products

    (12 results)

All Other

All Publications (12 results)

  • [Publications] M.Terauchi: "Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope"Microscopy and Microanalysis. suppl 2. 644-645 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] S.-K.Hong: "Control of crystal polarity in a wurtzite crystal : ZnO films grown by plasma-assisted molecular-beam epitaxy on GaN"Phys.Rev.B. 65. 115331-1-115331-10 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] A.Ohtake: "Strain-induced surface segregation in In0.5Ga0.5As/GaAs heteroepitaxy"Applied Physics Letters. 80・21. 3931-3933 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 寺内正己: "EELSで何が分かるのか?"日本結晶学会誌. 44・5. 277-283 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 寺内正己: "EELSを用いた電子構造解析"日本結晶学会誌. 44・6. 347-354 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M.Tanaka: "Convergent-Beam Electron Diffraction IV"JEOL-Maruzen. 352 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] M,Terauchi, M,Kawana: "Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope"Microscopy & Microanalysis. 12,supple.2. 644-645 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] A.Ohtake, M.Ozeki, M.Terauchi, F.Sato, M.Tanaka: "Strain-indused surface segregation in In0.5Ga0.5As/GaAs heteroepitaxy"Applied Physics Letters. 180,Number 21. 3931-3933 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] S.-K.Hong, T.Hanada, H.J.KO, Y.Chen, T.Yao, D.Imai, K.Araki, M.Shinohara, K.Saitoh, M.Terauchi: "Control of crystal polarity in a wurtzite crystal:ZnO films grown by plasma-assisted molecular-beam epitaxy on GaN"Phys,Rev.B. 65. 115331-1-10 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Terauchi: "Electron Energy-Loss Spectroscopy Based on Transmission Electron Microscope"Journal of the Crystallographic Society of Japan. 44 Number 5. 277-283 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Terauchi: "Electronic Structure Analyses by Electron Energy-Loss Spectroscopy"Journal of the Crystallographic Society of Japan. 44 Number 6. 347-354 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] M.Tanaka, M.Terauchi, K.Tsuda, K.Saitoh: "Convergrnt-Beam Electron Diffraction IV"JEOL-Maruzen. Tokyo. 352 (2002)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 2004-04-14  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi