2002 Fiscal Year Final Research Report Summary
Development of high-energy X-ray fluorescence analysis and application to the study of origin of earth and planetary materials
| Project/Area Number |
12554020
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
Petrology/Mineralogy/Science of ore deposit
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| Research Institution | Tokyo University of Science |
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Principal Investigator |
NAKAI Izumi Department of Applied Chemistry, Faculty of Sciences, Tokyo University of Science, Professor, 理学部, 教授 (90155648)
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| Co-Investigator(Kenkyū-buntansha) |
SAKURAI Yoshiharu Spring-8, JASRI, Senior Researcher, 主幹研究員
NAKAMAURA Tomoki Department of Earth and Planetary Sciences, Faculty of Sciences, Kyushu University Associate Professor, 大学院・理学研究, 助教授 (20260721)
TERADA Yasuko Spring-8, JASRI, Researcher, 研究員 (90307695)
NINOMIYA Toshio Forensic Science Laboratory, Hyogo Prefectural Police Headquarters, Director, 所長
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| Project Period (FY) |
2000 – 2002
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| Keywords | X-ray fluorescence analysis / synchrotron radiation / high-energy X-ray / heavy element analysis / trace element analysis / geological application / archaeological application / forensic application |
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| Research Abstract |
Traditionally, the X-ray fluorescence (XRF) analysis of heavy elements is based on their L-series spectral lines. This is because the K-lines of these elements are difficult to excite by commercially available XRF spectrometers. A typical energy dispersive X-ray fluorescence spectrum of a multi-component material in energy regions of less than 20 keV is usually crowded with an overlap of the K, L, and M emission lines of the component elements. In contrast, the XRF spectrum above 20keV contains only K lines, and the spectrum becomes simple. Therefore, the use of the K-lines is ideal for the analysis of heavy elements of atomic number Z ≧45 (=Rh Kα_1=20.12 KeV). We have developed for the first time high energy XRF analysis utilizing 116keV X-rays from synchrotron radiation source of Spring-8 and found that this technique enables us to determine all heavy elements with sufficient sensitivity. The minimum detection limit was at a sub-ppm level. This technique has been successfully applied to two-dimensional analysis of zoning of heavy elements in garnet, forensic identification of automobile paints, provenance analysis of old-china wares from Kutani and Arita and the potential advantages of this technique have been elucidated. High-energy XRF analyses will become a powerful tool for analyzing environmental samples, archaeological samples, forensic samples, geochemical samples, and high-tech materials containing heavy elements such as rare earth elements. It is expected that the utilization of high-energy X-rays will open new application fields for X-ray fluorescence analyses
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Research Products
(17 results)
