• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2002 Fiscal Year Final Research Report Summary

Study on aberration-free focal-depth-extended dark-field microscopy and non-linear imaging analysis

Research Project

Project/Area Number 13650057
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied physics, general
Research InstitutionOsaka Electro-Communication University

Principal Investigator

IKUTA Takashi  Osaka Electro-Communication University, Faculty of Engineering, Professor, 工学部, 教授 (20103343)

Co-Investigator(Kenkyū-buntansha) KISHIOKA Kiyoshi  Osaka Electro-Communication University, Faculty of Engineering, Professor, 工学部, 教授 (50109881)
Project Period (FY) 2001 – 2002
KeywordsActive image processing / Aberration-free observation / Aberration correction / Wave aberration / Spherical aberration / Linear imaging / Non-linear imaging / Transmission microscope
Research Abstract

The first aim of this study is the development of practical aberration correction techniques based on the focal-depth-extended dark-field microscopy, applicable to both optical and electron microscopes. And also, the theoretical analysis on non-linear imaging phenomena is the second aim, to interpret observed images.
According to these aims, the generalized imaging theory including non-linear imaging effects, is developed in the first stage (2001), which is the extension of the three dimensional (3D) imaging theory. Under the basis of this theory, image simulation programs to evaluate the aberration-free observation were then coded. The design and construction of an aberration-free focal-depth-extended dark-field microscope were simultaneously carried out in this first stage. In addition, required additional control hardware and processing programs were also made and these were included in the present microscope system.
In the next stage (2002) of the study, the evaluation of the aberration free observation under the bases of the focal-depth-extended dark-field microscopy was first examined. Results show that the separation of amplitude and phase components is possible even for dark-field images by the use of the dynamic hollow-cone illumination and the proper image processing. From the evaluation for dark-field images using the present microscope, it is concluded that the effect of the spherical aberration is easily corrected. The separation of the amplitude and the phase components is, however, very difficult and severe for the defocus. In practice, it may be applicable for only very thin samples under the severe focus setting. Finally, the present techniques for the aberration-free focal-depth-extended dark-field microscope can be applicable to microscopes such as fluorescent and self-emission microscopes possess similar 3D imaging characteristics.

  • Research Products

    (12 results)

All Other

All Publications (12 results)

  • [Publications] Nishikata K, Kimura Y, Takai Y, Ikuta T, Shimizu R: "Real-time lock-in imaging by a newly developed high-speed image-processing CCD video camera"Rev.Sci.Instrum.. Vol.74(印刷中). (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Nishikata K, Shimazaki Y, Kimura Y, Takai Y, Ikuta T, Yumen H: "Real-time lock-in energy loss imaging with a novel high-speed image-processing CCD video camera"Surf.Interface Anal.. Vol.35(印刷中). (2003)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] 生田 孝: "無収差位相差顕微鏡法に関する新しい理論"応用物理. 71巻. 389-400 (2002)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Ikuta T: "Aberration free imaging technique based on focal depth extension"Proc. of Atomic Level Characterizations for New Materials and Devices '01. 119-122 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Kawasaki T, Takai Y, Ikuta T, Shimizu R: "Wave field reconstruction using three-dimensional Fourier filtering method"Ultramicrosc. Vol.90. 47-59 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Takai Y, Kawasaki T, Kimura Y, Ikuta T, Shimizu R: "Dynamic observation of an atom-sized gold wire by phase electron microscopy"Phys.Rev.Lett.. Vol.87. 106105-1-106105-4 (2001)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K. Nishikata, Y. Kimura, Y. Takai, T. Ikuta and R. Shimizu: "Real-time lock-in imaging by a newly developed high-speed image-processing CCD video camera"Rev. Sci. Instrum.. 74 (in press). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Nishikata, Y. Shimazaki, Y. Kimura, Y. Takai, T. Ikuta and Yumen H: "Real-time lock-in energy loss imaging with a novel high-speed image-processing CCD video camera"Surf. Interface Anal.. 35 (in press). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Ikuta: "New theory of aberration free phase microscopy for charged particle optics (in Japanese)"Oyo Buturi. 71. 389-400 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Ikuta: "Aberration free imaging technique based on focal depth extension"Proc. of Atomic Level Characterizations for New Materials and Devices '01. 119-122 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] T. Kawasaki, Y. Takai, T. Ikuta and R. Shimizu: "Wave field reconstruction using three-dimensional Fourier filtering method"Ultramicrosc.. 90. 47-59 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Y. Takai, T. Kawasaki, Y. Kimura, T. Ikuta and R. Shimizu: "Dynamic observation of an atom-sized gold wire by phase electron microscopy"Phys. Rev. Lett.. 87. 106105-1-106105-4 (2001)

    • Description
      「研究成果報告書概要(欧文)」より

URL: 

Published: 2004-04-14  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi