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2004 Fiscal Year Final Research Report Summary

Development of 3-D DX-ray Analytical Microscope and micro-nano analysis under actual environment

Research Project

Project/Area Number 15350048
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Analytical chemistry
Research InstitutionOsaka City University

Principal Investigator

TSUJI Kouichi  Osaka City University, Associate Professor, 大学院・工学研究科, 助教授 (30241566)

Project Period (FY) 2003 – 2004
Keywordsmicro analysis / x-ray fluorescence / elemental analysis / elemental mapping / 3 dimension
Research Abstract

By using a polycapillary x-ray lens, micro-XRF instrument was developed. This polycapillary x-ray lens enables us make a micro x-ray beam of about several tens micro meters, leading to elemental analysis of micro region. Using this instrument, following research subjects were studied :
1) Elemental x-ray mapping with changeable area
The spot size obtained by polycapillary lens critically depends on distance from the output end of the lens. Therefore, it is possible to change the spot size by changing the distance from the lens. Thus, we proposed that a large area could be measured a large spot size, while a small area could be measured by a small spot size. BY using this technique, a total measuring time could be reduce,
2) Elemental mapping of quinoa seed
XRF has unique advantages : non-destructive elemental analysis at ambient air pressure (that is, high vacuum conditions are not required). This advantages are very helpful for analysis of living sample, because the living sample cannot be installed in vacuum condition. Thus, we took the x-ray elemental maps for quinoa seed at ambient air pressure during growth. The seed was put on the cotton on the sample holder, whose end was put into the water tank ; therefore, the seed could grow up during the x-ray measurement. As a result, it was found that K moved from the seed to stem, while Ca still remained in the seed during the growth.
3) Combination of micro XRF with AFM
AFM (atomic force microscope) enables us take surface morphology with atomic level ; however, it is difficult to take chemical information, that is, distinguish of elements. Therefore, it is very attractive to combine AFM and XRF. Actually, we demonstrated that the combined instrument worked well.
4) 3-D XRF instrument
We prepared two polycapillalry lens for excitation and detection. By adjusting the focusing points of two lens exactly at one position, it is possible to analyze a small region in 3 dimensional space. We have investigated this technique.

  • Research Products

    (21 results)

All 2005 2004 2003 Other

All Journal Article (18 results) Book (2 results) Patent(Industrial Property Rights) (1 results)

  • [Journal Article] キノア種子のX線元素マッピングにおける自己呼吸の影響の低減2005

    • Author(s)
      江本哲也, 小西洋太郎, X. Ding, 辻 幸一
    • Journal Title

      X線分析の進歩 36

      Pages: 267-274

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] 全反射蛍光X線分析のための血液試料サンプリング方法の検討2005

    • Author(s)
      松岡代志子, 細川好則, 日野雅之, 辻 幸一
    • Journal Title

      分析化学 (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] 全反射蛍光X線分析のためのグロー放電スパッタリングによる試料作成2005

    • Author(s)
      中田 宗寛, 辻 幸一
    • Journal Title

      J. Surf. Anal. (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Characterization of X-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis.2005

    • Author(s)
      T.Tetsuoka, T.Nagamura
    • Journal Title

      X-Ray Spectrom (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Grazing-exit micro X-ray fluorescence analysis for chemical microchip2005

    • Author(s)
      K.Tsuji, T.Emoto, Y.Nishida, E.Tamaki, Hibara, T.Kitamori
    • Journal Title

      Anal. Sci. 21

      Pages: 799-803

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] 蛍光X線分析における近年の要素技術の進歩と特殊な測定方法2005

    • Author(s)
      辻 幸一
    • Journal Title

      X線分析の進歩 36

      Pages: 63-74

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Micro-XRF Instrument Developed in Combination with Atomic Force Microscope2005

    • Author(s)
      K.Tsuji, T.Emote, Y.Matsuoka, Y.Miyatake, T.Nagamura X.Ding
    • Journal Title

      Powder Diffraction 20

      Pages: 137-140

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Grazing-exit micro x-ray fluorescence analyses for chemical microchip2005

    • Author(s)
      K.Tsuji, T.Emote, Y.Nishida, E.Tamaki, Y.Kikutani, A.Hibara, T.Kitamori
    • Journal Title

      Anal.Sci. 21

      Pages: 799-803

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Development and applications of a grazing exit micro x-ray fluorescence (GE-□-XRF) instrument using a polycapillary x-ray lens2004

    • Author(s)
      T.Emoto., Y.Sato., Y.Konishi, X.Ding, K.Tsuji
    • Journal Title

      Spectrochim. Acta B 59

      Pages: 1291-1294

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Grazing-exit electron probe x-ray micro analysis of light element2004

    • Author(s)
      Z.Spolnik, K.Tsuji, R.Van, Grieke N.
    • Journal Title

      X-Ray Spectrom. 33

      Pages: 16-20

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Characterization of X-ray emerging from between reflector and sample carrier in reflector-assisted TXRF analysis2004

    • Author(s)
      K.Tsuji, F.Delaieux
    • Journal Title

      X-Ray Spectrom. 33

      Pages: 281-284

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Micro-Trace Analysis-Development of Grazing-Exit-Micro X-Ray Fluorescence (GE-μ-XRF) in Combination with Atomic Force Microscope2004

    • Author(s)
      K.Tsuji
    • Journal Title

      The proceedings of the 12^<th> Osaka City University, International Symposium 12

      Pages: 137-142

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Development and applications of a grazing exit micro x-ray fluorescence (GE-μ-XRF) instrument using a polycapillary x-ray lens2004

    • Author(s)
      T.Emote, Y.Sato, Y.Konishi, X.Ding, K.Tsuji
    • Journal Title

      Spectrochim.Acta B 59

      Pages: 1291-1294

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Grazing-exitelectron probe x-ray micro analysis of light elements2004

    • Author(s)
      Z.Spolnik, K.Tsuji, R.Van Grieken
    • Journal Title

      X-Ray Spectrom. 33

      Pages: 16-20

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Micro-Trace X-ray Analysis -Development of Grazing-Exit-Micro X-Ray Fluorescence (GE-□-XRF) in Combination with Atomic Force Microscope (AFM)-2004

    • Author(s)
      K.Tsuji
    • Journal Title

      The proceedings of the 12^<th> Osaka City University, International Symposium, 27-29 October, 2004

      Pages: 137-142

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Characterization of X-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis2004

    • Author(s)
      K.Tsuji, F.Delalieux
    • Journal Title

      X-Ray Spectrom. 33

      Pages: 281-284

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Micro-XRF Instrument Developed in Combination with Atomic Force Microscope2003

    • Author(s)
      K.Tsuji, T.Emoto, Y.Matsuoka, Y.Miyatake, T.Nagamura, X.Ding
    • Journal Title

      Powder Diffraction 20

      Pages: 137-140

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Improvement ofreproducibility in grazing-exit EPMA (GE-EPMA)

    • Author(s)
      T.Tetsuoka, T.Nagamura, K.Tsuji
    • Journal Title

      X-Ray Spectrom. (in press)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Book] X-Ray Spectrometry : Recent Technological Advances2004

    • Author(s)
      K.Tsuji, J.Injuk, R.E.Van Grieken
    • Total Pages
      603
    • Publisher
      John Wiely & Sons, Ltd.
    • Description
      「研究成果報告書概要(和文)」より
  • [Book] 「放射光科学入門」、「蛍光X線分析」(分担執筆)2004

    • Author(s)
      辻 幸一
    • Total Pages
      274-279
    • Publisher
      エヌ・ティー・エス(日本表面科学会編)
    • Description
      「研究成果報告書概要(和文)」より
  • [Patent(Industrial Property Rights)] 蛍光X線分析装置2004

    • Inventor(s)
      辻 幸一, 細川好則
    • Industrial Property Rights Holder
      辻 幸一, 株式会社エックスレイプレシジョン
    • Patent Publication Number
      特開2003-337110
    • Filing Date
      2004-06-15
    • Description
      「研究成果報告書概要(和文)」より

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Published: 2007-12-13  

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