2006 Fiscal Year Final Research Report Summary
A study about universal design of sidewalk space in snow cold districts
| Project/Area Number |
15360326
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (B)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Town planning/Architectural planning
|
|---|
| Research Institution | Hokkaido Institute of Technology |
|---|
Principal Investigator |
TOMABECHI Tsukasa Hokkaido Institute of Technology, The Faculty of Engineering, Professor, 工学部, 教授 (40102785)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
KAMEYAMA Shuichi Hokkaido Institute of Technology, The Faculty of Engineering, Professor, 工学部, 教授 (30295894)
KAWABATA Shinichiro Hokkaido Institute of Technology, The Faculty of Engineering, Associate Professor, 工学部, 准教授 (10224833)
ISHIDA Shinji Hokkaido Institute of Technology, The Faculty of Engineering, Associate Professor, 工学部, 准教授 (20347751)
HOSOKAWA Kazuhiko Hokkaido Institute of Technology, The Faculty of Engineering, Associate Professor, 工学部, 准教授 (10347750)
|
|---|
| Project Period (FY) |
2003 – 2006
|
| Keywords | GIS / Barrier free / Dijkstra model / Optimal path / Sidewalk / Evenness / wheelchair / profile |
|---|
| Research Abstract |
A new guideline for sidewalk design has been published, based on the transportation accessibility improvement law legislated in 2000. Since then, incline, cross slope, faulting, and evenness of sidewalks have become important issues in Japan. To detect these barriers for users and to evaluate sidewalk accessibility, it is necessary to easily, rapidly and accurately measure the longitudinal and lateral profiles of the sidewalk. Three portable profilers for measurement of road surfaces have recently been developed in Japan, so we tried to use them for measurement of sidewalk profiles. This paper presents the mechanism of these portable profilers and the methodology for calculating sidewalk profiles from measured data. It also discusses the accuracy and repeatability of portable profilers using data obtained from on-site measurements.
|
