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2005 Fiscal Year Final Research Report Summary

Electrical Testing of Open Defects in Deep Sub-micron CMOS Logic Circuits

Research Project

Project/Area Number 15500041
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Computer system/Network
Research InstitutionThe University of Tokushima

Principal Investigator

HASHIZUME Masaki  The University of Tokushima, Faculty of Engineering, Professor, 工学部, 教授 (40164777)

Project Period (FY) 2003 – 2005
Keywordselectrical test / CMOS / supply current / open defect / lead open / current test
Research Abstract

CMOS technology is used for implementing logic circuits. Open defects have often occurred in the circuits. However, open defects are hard to be detected with conventional test methods. The purpose of this study is to develop new test methods for detecting open defects in deep sub-micron CMOS ICs and CMOS circuits fabricated on printed circuit boards with such ICs. The following studies have been done in this study.
(1)Electrical tests of CMOS logic ICs
Two kinds of high speed IDDQ test methods and the test circuits have been developed. Also, an electrical test method based on dynamic supply current has been proposed. Furthermore, since analog circuits have been implemented in an IC, open defect detection methods and the DFTs have been proposed for the following typical analog circuits ; AGCs, D/A converters and CCDs.
(2)Lead open detection
I have proposed an electrical test method to detect lead opens. The test method is based on supply current under AC electric field application. In this study, I have examined what AC electric field is suitable for detecting open leads. Also, I have developed a supply current test method, in which AC signal is provided directly to targeted leads. The proposed methods needs test vector generation process. It has become difficult to generate test vectors. Thus, I have developed two kinds of supply current test methods that do not depend on test vectors.

  • Research Products

    (44 results)

All 2006 2005 2004 2003 2002

All Journal Article (42 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] Open Lead Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 2006 International Conference on Electronics Packaging (to appear)

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Open Leads Detection Based on Supply Current of CMOS Logic Circuits by AC Voltage Signal Application2006

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of International Conference on Electronics Packaging (to appear)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Test Equipment for CMOS Lead Open Detection Based on Supply Current under AC Electric Field Application2005

    • Author(s)
      M.Ichimiya
    • Journal Title

      Proc. of Electronic Circuits World Convention 10

      Pages: 03.5.1-5.5

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Electrical Detection of Pin Shorts by Supply Current of PIC2005

    • Author(s)
      S.Nishimoto
    • Journal Title

      Proc. of RISP International Workshop in Nonlinear Circuits and Signal Processing

      Pages: 171-174

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the IEEE International Symposium on Circuits and Systems

      Pages: 2995-2998

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Vectorless Open Pin Detection Method for CMOS Logic Circuits2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 2005 International Conference on Electronics Packaging

      Pages: 391-396

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Current Testable Design of Register String DACs2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the IEEE International Workshop on Electronic Design, Test and Applications

      Pages: 197-200

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Test Equipment for CMOS Lead Open Detection Based on Supply Current under AC Electric Field Application2005

    • Author(s)
      M.Ichimiya
    • Journal Title

      Proc.of Electronic Circuits World Convention 10

      Pages: P03.5.1-P03.5.5

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Electrical Detection of Pin Shorts by Supply Current of PIC2005

    • Author(s)
      S.Nishimoto
    • Journal Title

      Proc.of RISP International Workshop in Nonlinear Circuits and Signal Processing

      Pages: 171-174

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Vectorless Open Pin Detection Method for CMOS Logic Circuits2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of International Conference on Electronics Packaging

      Pages: 391-396

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Electric Field for Detecting Open Leads in CMOS Logic Circuits by Supply Current Testing2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of IEEE International Symposium on Circuits and Systems

      Pages: 2995-2998

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Current Testable Design of Register String DACs2005

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of IEEE International Workshop on Electronic Design, Test and Applications

      Pages: 197-200

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Test Sequence Generation for Test Time Reduction of IDDQ Testing2004

    • Author(s)
      H.Yotsuyanagi
    • Journal Title

      IEICE Transaction on Information and Systems E87-D・3

      Pages: 537-543

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Identification and Frequency estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits2004

    • Author(s)
      M.Hashizume
    • Journal Title

      IEICE Transaction on Information and Systems E87-D・3

      Pages: 571-579

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] CMOS Open Fault Detection by Appearance Time of Switching Supply Current2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the second IEEE International Workshop on Electronic Design, Test, and Applications

      Pages: 183-188

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Lead Open Detection Based on Supply Current of CMOS LSIs2004

    • Author(s)
      M.Takagi
    • Journal Title

      IEICE Transaction on Fundamentals E87-A・6

      Pages: 1330-1337

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] AC Electric Field for Detecting Pin Opens by Supply Current of CMOS ICS2004

    • Author(s)
      M.Takagi
    • Journal Title

      Proc. of the 2004 International Conference on Electronics Packaging

      Pages: 217-222

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the IEEE 47-th Midwest Symposium on Circuits and Systems

      Pages: 1557-1560

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 13-th IEEE Asian Test Symposium

      Pages: 112-117

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Test Sequence Generation for Test Time Reduction of IDDQ Testing2004

    • Author(s)
      H.Yotsuyanagi
    • Journal Title

      IEICE Transactions on Information and Systems Vol.E87-D, No.3

      Pages: 537-543

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits2004

    • Author(s)
      M.Hashizume
    • Journal Title

      IEICE Transactions on Information and Systems Vol.E87-D, No.3

      Pages: 571-579

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] CMOS Open Fault Detection by Appearance Time of Switching Supply Current2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the second IEEE International Workshop on Electronic Design, Test, and Applications

      Pages: 183-188

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Lead Open Detection Based on Supply Current of CMOS LSIs2004

    • Author(s)
      M.Takagi
    • Journal Title

      IEICE Transaction on Fundamentals Vol.E87-A, No.6

      Pages: 1330-1337

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] AC Electric Field for Detecting Pin Opens by Supply Current of CMOS ICs2004

    • Author(s)
      M.Takagi
    • Journal Title

      Proc.of the 2004 International Conference on Electronics Packaging

      Pages: 217-222

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Test Circuit for CMOS Lead Open Detection by Supply Current Testing under AC Electric Field Application2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the IEEE 47-th Midwest Symposium on Circuits and Systems

      Pages: 1557-1560

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] IDDQ Test method Based on Wavelet Transformation for Noisy Current Measurement Environment2004

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the 13-th IEEE Asian Test Symposium

      Pages: 112-117

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] CMOS論理ICの交流電界印加時の電源電流測定によるピン浮き検出法2003

    • Author(s)
      一宮 正博
    • Journal Title

      エレクトロニクス実装学会誌 6・2

      Pages: 140-146

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] CMOS論理回路の発振を生じるICピン短絡故障検出回路2003

    • Author(s)
      一宮 正博
    • Journal Title

      電子情報通信学会論文誌D-I 86-D-I・2

      Pages: 402-411

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] CMOSマイクロコンピュータ回路の電源電流によるブリッジ故障検出法2003

    • Author(s)
      橋爪 正樹
    • Journal Title

      エレクトロニクス実装学会誌 6・7

      Pages: 564-572

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field2003

    • Author(s)
      H.Yotsuyanagi
    • Journal Title

      IEICE Transaction on Information and Systems E86-D・12

      Pages: 2666-2673

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 2003 International Conference on Electronics Packaging

      Pages: 75-80

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Testability of Pin Open in Small Outline Package ICs by Supply Current Test2003

    • Author(s)
      M.Takagi
    • Journal Title

      Proc. of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications

      Pages: 832-835

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Testability of Supply Current Test in an AGC2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications

      Pages: 836-839

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] A BIST Circuit for IDDQ Tests2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc. of the 12-th IEEE Asian Test Symposium

      Pages: 390-395

    • Description
      「研究成果報告書概要(和文)」より
  • [Journal Article] Pin Open Detection for CMOS Logic ICs by Measuring Supply Current under AC Electric Field2003

    • Author(s)
      M.Ichimiya
    • Journal Title

      Journal of Japan Institute of Electronics Packaging Vol.6, No.2

      Pages: 140-146

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] A Test Circuit for Pin Shorts Generating Oscillation in CMOS Logic Circuits2003

    • Author(s)
      M.Ichimiya
    • Journal Title

      IEICE Transactions on Information and Systems Vol.J86-D-I, No.6

      Pages: 402-411

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] A Supply Current Test Method for Bridging Faults in CMOS Microprocessor Based Circuits2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Journal of Japan Institute of Electronics Packaging Vol.6, No.7

      Pages: 564-572

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field2003

    • Author(s)
      H.Yotsuyanagi
    • Journal Title

      IEICE Transactions on Information and Systems Vol.E86-D, No.12

      Pages: 2666-2673

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Electric Field Application Method Effective for Pin Open Detection Based on Supply Current in CMOS Logic Circuits2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the 2003 International Conference on Electronics Packaging

      Pages: 75-80

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Testability of Pin Open in Small Outline Package ICs by Supply Current Test2003

    • Author(s)
      M.Takagi
    • Journal Title

      Proc.of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications

      Pages: 832-835

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Testability of Supply Current Test in an AGC2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the 2003 International Technical Conference on Circuits/Systems, Computers and Communications

      Pages: 836-839

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] A BIST Circuit for IDDQ Tests2003

    • Author(s)
      M.Hashizume
    • Journal Title

      Proc.of the 12-th IEEE Asian Test Symposium

      Pages: 390-395

    • Description
      「研究成果報告書概要(欧文)」より
  • [Patent(Industrial Property Rights)] 固体撮像装置およびその特性検査方法2006

    • Inventor(s)
      山達正明, 橋爪正樹
    • Industrial Property Rights Holder
      シャープ, 徳島大学
    • Industrial Property Number
      特願2006-032796
    • Filing Date
      2006-02-09
    • Description
      「研究成果報告書概要(和文)」より
  • [Patent(Industrial Property Rights)] 回路検査装置2002

    • Inventor(s)
      一宮正博, 橋爪正樹
    • Industrial Property Rights Holder
      一宮正博, 橋爪正樹
    • Industrial Property Number
      特許権
    • Filing Date
      2002-03-30
    • Description
      「研究成果報告書概要(和文)」より

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Published: 2007-12-13  

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