Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array

2017 Fiscal Year Final Research Report

• Project/Area Number: 15H03970
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Electronic materials/Electric materials
• Research Institution: Tokyo University of Agriculture and Technology
• Principal Investigator: SHIRAKASHI JUN-ICHI 東京農工大学, 工学(系)研究科(研究院), 教授 (00315657)
• Project Period (FY): 2015-04-01 – 2018-03-31
• Keywords: マイクロ・ナノデバイス / FPGA / エレクトロマイグレーション / 単原子トランジスタ / 原子接合 / 原子ギャップ

Outline of Final Research Achievements

A field-programmable gate array (FPGA) contains a matrix of reconfigurable gate array logic circuitry. FPGA-based systems can thus perform deterministic closed-loop control tasks at extremely fast loop rates. In this study, we presented the design of a new feedback-controlled electromigration (FCE) system using an FPGA. In addition, we applied the system for fabrication of Au atomic junctions and atomic gaps. Single-electron transistors (SETs) arrays operating at room temperature were also fabricated using the method. These results clearly imply that FPGA-based electromigration procedure is suitable for formation of Au atomic junctions, atomic gaps and SET arrays.

Free Research Field

ナノエレクトロニクス、ナノテクノロジー