2017 Fiscal Year Final Research Report
In-situ structural analysis of organic semiconductor thin films by 2D X-ray diffraction
| Project/Area Number |
15K04647
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Applied materials
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| Research Institution | Iwate University |
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Principal Investigator |
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| Project Period (FY) |
2015-04-01 – 2018-03-31
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| Keywords | 有機半導体 / 結晶成長 / X線回折 |
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| Outline of Final Research Achievements |
In this study, we have clarified the crystal structures of dialkylated quterthiophenes (Cn-4T, n= 0, 4, 6, 8, 10, 12).) using in situ 2-dimensional grazing-incidence X-ray diffraction (2D-GIXD) during thin-film growth, and the effects of alkyl-chain length on the crystal growth mode, structure and transport properties are elucidated.
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| Free Research Field |
有機材料工学
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