Identifications of electron capture sites in molecules induced by collision of highly charged ions

2017 Fiscal Year Final Research Report

• Project/Area Number: 15K05231
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Atomic/Molecular/Quantum electronics
• Research Institution: Tokyo Metropolitan University
• Principal Investigator: Matsumoto Jun 首都大学東京, 理工学研究科, 助教 (10443029)
• Project Period (FY): 2015-04-01 – 2018-03-31
• Keywords: 多価イオン / 分子解離

Outline of Final Research Achievements

Multiply ionization and the following dissociation induced by highly charged ions (HCIs) (1.5 keV/u Ar4+ and 3.0 keV/u Ar8+) with carbonyl sulfide, OCS, and ethylene, C2H4, were studied. Fragment ion pairs from highly-charged target molecular ions were analyzed by using multi-hit position-sensitive time-of-flight devices. The trigger of the TOF measurements was detection of the scattered projectile ions charge-selected by electrostatic fields.
At the OCS experiments, a strong correlation is found for triple capture collisions, between fragmentation with high kinetic energy and events when Auger electron emission take places. At the C2H4 experiments, delayed dissociation processes, which are induced only by collisions with large impact parameters, are well described by the power-law decay, rather than the exponential decay.

Free Research Field

物理化学