Understanding the role of the interface oxide layer in the multiferroicity at the ferromagnet/insulator junctions

2016 Fiscal Year Final Research Report

• Project/Area Number: 15K17684
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Condensed matter physics I
• Research Institution: High Energy Accelerator Research Organization
• Principal Investigator: SAKAMAKI Masako 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 助教 (90598880)
• Research Collaborator: AMEMIYA Kenta 高エネルギー加速器研究機構, 物質構造科学研究所, 教授 (80313196)
• Project Period (FY): 2015-04-01 – 2017-03-31
• Keywords: 深さ分解 / X線吸収分光 / 電界効果 / X線磁気円二色性

Outline of Final Research Achievements

In this proposal, we have developed fluorescence-yield depth-resolved x-ray magnetic circular dichroism (XMCD) measurement system by using soft x-ray camera, and performed a study on the multiferroicity at the ferromagnet/insulator junction. By placing the permanent magnet next to the sample and irradiating the circularly polarized synchrotron soft x ray on it, the depth-resolved XMCD measurement under the magnetic field has been realized. Its depth resolution is estimated to be sub nm. We furthermore developed the sample holder so that the depth-resolved XMCD measurement under the electric field has realised, as well.

Free Research Field

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