2006 Fiscal Year Final Research Report Summary
Study of Undercooled Melt and Solidification Using Synchrotron Radiation and Electrostatic Levitation Technique
| Project/Area Number |
16206062
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| Research Category |
Grant-in-Aid for Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Physical properties of metals
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| Research Institution | University of Tokyo |
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Principal Investigator |
NANAO Susumu University of Tokyo, Inst. of Industrial Science, Professor, 生産技術研究所, 教授 (60013231)
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| Co-Investigator(Kenkyū-buntansha) |
KURIBAYASHI Kazuhiko Japan Aerospace Exploration Agency, Inst. of Space and Astronautical Science, Professor, 宇宙科学研究本部, 教授 (70092195)
WATANABE Masato Gakusyuin Univ., Dept. of Physics, Associate Professor, 理学部, 助教授 (40337902)
YOKOYAMA Yoshihiko Tohoku Univ., Inst. materials Research, Associate Professor, 金属材料研究所, 助教授 (00261511)
OKADA Junpei Univ. Tokyo, School of Engineering, Research Asistant, 大学院新領域創成科学研究科, 助手 (90373282)
MASAKI Tadahiko Japan Aerospace Exploration Agency, Inst. of Space and Astronautical Science, Research Asistant, 宇宙科学研究本部, 助手 (00360719)
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| Project Period (FY) |
2004 – 2006
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| Keywords | melt / x-ray / atomic structure / electronic structure / containerless melting / electrostatic levitation / undercooling |
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| Research Abstract |
Our project, which is the realization of a compact electrostatic levitator for the measurements using synchrotron radiation and measurements of x-ray diffraction, Compton scattering and high resolution x-ray inelastic scattering at Spring-8 has been fulfilled nearly as planned.
(1) X-ray diffraction:
High energy x-ray diffraction profiles have been precisely measured for the melts and undercooled melts of Zr, Si and Ba-Ge compunds using electrostatic levitation technique. And their structures were analyzed partly with Monte Carlo simulation.
For the melt of icosahedral ALPdMn alloy, the first peak in low angle region has been clearly detected for the first time in the x-ray diffraction profile, which confirms the existence of order structure in the scale of 0.35nm in the melt.
(2) Compton scattering and high resolution x-ray inelastic scattering:
Compton scattering profiles for Si melt was measured at BLO8W in Spring-8. The analyses of the obtained momentum distribution of valence electrons have demonstrated the existence of covalent bonds for the first time.
High resolution x-ray inelastic scattering profiles were measured for Si melt and Si undercooled melt of 1517K, and dynamic structure factor has found clearly different between them.
This is the first case in the world that a profile of Compton scattering and/or high resolution x-ray inelastic scattering is successfully measured. The present studies are to be pioneering work that shows it is really possible to study dynamics and electronic structures of high temperature melt and undercooled melt.
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[Journal Article] Compact Electrostatic Levitator for Diffraction Measurements with a Two Axis Diffractormeter and a Laboratory X-ray source2007
Author(s)
Tadahiko Masaki, Takehiko Ishikawa, Paul-Francois Paradis, Shinichi Yoda, Junpei T.Okada, Yasuhiro Watanabe, Susumu Nanao, Akiko Ishikura, Kensuke Higuchi, Akitoshi Mizuno, Masata Watanabe, Shinji Kohara
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Journal Title
Rev. Sci. Instruments 78
Pages: 026102-1-3
Description
「研究成果報告書概要(和文)」より
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[Journal Article] Compact Electrostatic Levitator for Diffraction Measurements with a Two Axis Diffractormeter and a Laboratory X-ray source2007
Author(s)
Tadahiko Masaki, Takehiko Ishikawa, Paul-Francois Paradis, Shinichi Yoda, Junpei T.Okada, Yasuhiro Watanabe, Susumu Nanao, Akiko Ishikura, Kensuke Higuchi, Akitoshi Mizuno, Masata Watanabe, Shinji Kohara
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Journal Title
Rev.Sci.Instruments 78
Pages: 026102-1-3
Description
「研究成果報告書概要(欧文)」より
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[Journal Article] 静電浮遊法を用いた放射光X線散乱実験2005
Author(s)
樋口健介, 小池大輔, 渡辺匡人, 片山芳則, 岡田純平, 渡辺康裕, 七尾進, 西村孝浩, 津丸雅代, 江頭正和, 木口屋誠悟, 原田匡
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Journal Title
Space Utiliz. Res. 21
Pages: 29-30
Description
「研究成果報告書概要(和文)」より
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[Journal Article] Synchrotron Radiation X-ray Scattering Measurements with Electrostatic Levitation Technique (静電浮遊法を用いた放射光X線散乱実験)2005
Author(s)
K.Higuchi, D.Koike, M.Watanabe, Y.Katayama, J.T.Okada, Y.Watanabe, S.Nanao, T.Nishimura, M.Tsumaru M.Egashira, S.Kigutiya, T.Harada
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Journal Title
Space Utiliz.Res. 21
Pages: 29-30
Description
「研究成果報告書概要(欧文)」より
