2017 Fiscal Year Final Research Report
3D morphometry of synapses with focused ion beam-scanning electron microscopy
| Project/Area Number |
16K14767
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Morphology/Structure
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| Research Institution | Nagoya University |
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Principal Investigator |
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| Research Collaborator |
深澤 有吾 福井大学, 教授
上田 奈津実 (石原 奈津実) 名古屋大学, 講師
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| Project Period (FY) |
2016-04-01 – 2018-03-31
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| Keywords | シナプス / 形態計測 / ノックアウトマウス / 電子顕微鏡 |
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| Outline of Final Research Achievements |
In this study we acquired serial 2D images from conventionally prepared tissue samples from wild type and genetically engineered mouse brain and compared 3D reconstructed images by using conventional ssTEM and FIB-SEM (in collaboration with the Fukazawa lab at Fukui Univ.). FIB-SEM, but not ssTEM, found a unique anomaly in synapse morphology, mainly due to the thickness along Z-axis (5nm vs. 50nm), whereas ssTEM could cover wider volume than FIB-SEM. Comparison of the two methods with immunogold-labeled samples is under investigation.
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| Free Research Field |
分子神経生物学
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