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2007 Fiscal Year Final Research Report Summary

Study of structural fluctuation of nanomaterials by Cs-corrected electron lenses

Research Project

Project/Area Number 17201022
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Nanostructural science
Research InstitutionNagoya University

Principal Investigator

TANAKA Nobuo  Nagoya University, EcoTopia Science Institute, Professor (40126876)

Co-Investigator(Kenkyū-buntansha) SAITO Koh  Nagoya University, EcoTopia Science Institute, Lecturer (50292280)
YAMASAKI Jun  Nagoya University, EcoTopia Science Institute, Assistant professor (40335071)
SOMPYO Cho  Nagoya University, EcoTopia Science Institute, Research Specialist (90318783)
Project Period (FY) 2005 – 2007
KeywordsStructural fluctuation / Cs-corrected TEM / Nanostracture / Interface, Surface / TEM / STEM
Research Abstract

During the research period of three years (2005-07), the present group has published 19 original papers, 24 proceedings of international meetings, 4 reviews and 5 books including chapter-writing on the development of new measurement methods of structural fluctuation of nano-materials by using spherical aberration correction in transmission electron microscopy (TEM) as follows :
(1) Observation of 0.2nm resolution in lanthanide oxides high-k materials/silicon interfaces by Cs-corrected TEM.
(2) Observation of elemental fluctuation of the lanthanide oxide/silicon interfaces by using Cs-corrected TEM.
(3) Observation of six-member rings in single wall carbon nanotubes by Cs-corrected TEM. The result was reported on commercial news papers such as Asahi News Paper.
(4) Observation of oxygen-defect structures in photocatalytic titanium oxides caused by irradiation of light with shortage of oxygen.
(5) Visualization of aluminum atoms in AJNiCo quaicrystals by using Cs-corrected TEM and discussion of their stability with the structural fluctuation.
(6) Observation of a new interface structure between germanium quantum dos and slightly oxidized silicon.

  • Research Products

    (27 results)

All 2007 2006 2005 Other

All Journal Article (12 results) (of which Peer Reviewed: 6 results) Presentation (12 results) Book (2 results) Remarks (1 results)

  • [Journal Article] Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy2007

    • Author(s)
      Akihiko Hirata, Yoshihiko Hirotsu, T. G. Nieh, Tadakatsu Ohkubo, and Nobuo Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007

    • Author(s)
      Hirahara, K., Yamasaki, J., Saitoh, K. and Tanaka N
    • Journal Title

      Microscopy and Microanalysis

      Pages: 890CD-891CD

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2007

    • Author(s)
      J. Yamasaki, T. Kawai, N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54

      Pages: 209-214

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2007

    • Author(s)
      J. Yamasaki, H. Sawada, N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54

      Pages: 123-126

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Direct Imaging of Local Atomic Ordering in a Pd-Ni-P Bulk Metallic Glass Using Cs-Corrected Transmission Electron Microscopy2007

    • Author(s)
      Akihiko, Hirata, Yoshihiko, Hirotsu, T.G. Nieh, Tadakatsu, Ohkubo, Nobuo, Tanaka
    • Journal Title

      Ultramicroscopy 107

      Pages: 116-123

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Depth sensitivity of Cs-corrected TEM imaging2007

    • Author(s)
      Hirahara, K., Yamasaki, J., Saitoh, K., Tanaka, N
    • Journal Title

      Microscopy and Microanalysis 890CD-891CD

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Local atomic ordering and nanoscale phase separation in a Pd-Ni-P bulk metallic glass2006

    • Author(s)
      Yoshihiko Hirotsu, T. G. Nieh, Akihiko Hirata, Tadakatsu Ohkubo, and Nobuo Tanaka
    • Journal Title

      PHYSICAL REVIEW B73

      Pages: 012205

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM2006

    • Author(s)
      Kaori Hirahara, Koh Saitoh, Jun Yamasaki, and Nobuo Tanaka
    • Journal Title

      NANO LETTERS Vol.6, No.8

      Pages: 1778-1783

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Local atomic ordering and nanoscale phase separation in a Pd-Ni-P bulk metallic glass2006

    • Author(s)
      Yoshihiko, Hirotsu, T.G. Nieh, Akihiko, Hirata, Tadakatsu, Ohkubo, Nobuo, Tanaka
    • Journal Title

      PHYSICAL REVIEW 14

      Pages: 903-907

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Direct Observation of Six-Membered Rings in the Upper and Lower Walls of a Single-Wall Carbon Nanotube by Spherical Aberration-Corrected HRTEM2006

    • Author(s)
      Kaori, Hirahara, Koh, Saitoh, Jun, Yamasaki, Nobuo, Tanaka
    • Journal Title

      NANO LETTERS 6

      Pages: 1778-1783

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] A simple method for minimizing non-linear contrast in spherical aberration-corrected HRTEM2005

    • Author(s)
      J. Yamasaki, T. Kawai, and N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・3

      Pages: 209-214

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM2005

    • Author(s)
      J. Yamasaki, H. Sawada, and N. Tanaka
    • Journal Title

      Journal of Electron Microscopy 54・2

      Pages: 123-126

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001)surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      Tanaka, N., Cho, S. P., Shklyaev, A. A., Yamasaki, J., Okunishi, E and Ichikawa, M
    • Organizer
      ACSIN-9
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      20071111-15
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO_2 coverage2007

    • Author(s)
      Tanaka, N., Cho, S.P., Sbklyaev, A. A., Yamasaki, J., Okunishi, E, Icbikawa, M
    • Organizer
      ACSIN-9
    • Place of Presentation
      Tokyo, Japan
    • Year and Date
      20071111-15
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] Advanced electron microscopic characterization of nanometerials2007

    • Author(s)
      Tanaka, N
    • Organizer
      Extended abstract of the first Doyama Conference
    • Place of Presentation
      Tokyo
    • Year and Date
      20070905-09
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Advanced electron microscopic characterization of Nanometerials2007

    • Author(s)
      Tanaka, N
    • Organizer
      Extended abstract of the firs Extended abstract of the first Doyama Conference
    • Place of Presentation
      Tokyo
    • Year and Date
      20070905-09
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] Effectiveness of Cs-corrected TEM/STEM for nano-materials research2007

    • Author(s)
      Tanaka, N
    • Organizer
      Microscopy & Microanalysis
    • Place of Presentation
      Florida, US
    • Year and Date
      20070805-09
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007

    • Author(s)
      Yamasaki, J., Okunishi, E., Sawada, H and Tanaka, N
    • Organizer
      The NIMS Conference 2007 on Recent Breakthroughs in Materials Scienoe and Technology
    • Place of Presentation
      Tsukuba
    • Year and Date
      20070711-13
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Site hopping of individual dopant atoms in Si crystal observed by Cs-corrected ADF-STEM2007

    • Author(s)
      Yamasaki, J., Okunishi, E., Sawada, H, Tanaka, N
    • Organizer
      The NEVIS
    • Place of Presentation
      Tsukuba
    • Year and Date
      20070711-13
    • Description
      「研究成果報告書概要(欧文)」より
  • [Presentation] Spherical-aberration-corrected HRTEM of Al-Ni-Co Decagonal Quasicrystals2006

    • Author(s)
      Saitoh, K., Tanaka, N., Tsai, A. P. and Ishizuka, K
    • Organizer
      Joint Conference of the Asian Crystallographic Association and the Crystallographic Society of Japan
    • Place of Presentation
      Tsukuba
    • Year and Date
      20061120-23
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Direct Observation of Six-membered Rings in a Graphene Monolayer Constituting a Single Wall Carbon Nanotube by Using Cs-Corrected TEM2006

    • Author(s)
      Hirahara, K., Saitoh, K., Yamasaki, J and Tanaka, N
    • Organizer
      IMC 16
    • Place of Presentation
      Sapporo
    • Year and Date
      20060903-08
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] High-resolution TEM/STEM Analysis on La_2O_3/Si(100)interfaces2006

    • Author(s)
      Tanaka, N., Yamasaki, J and Saitoh, K
    • Organizer
      International Workshop on Nano-CMOS
    • Place of Presentation
      Mishima
    • Year and Date
      20060130-0201
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Cs-corrected HRTEM and advanced STEM of nano-structures and interfaces2005

    • Author(s)
      Tanaka, N
    • Organizer
      Beijing Conference and Exhibition on Instrumental Analysis
    • Place of Presentation
      Peking University, China
    • Year and Date
      20051020-23
    • Description
      「研究成果報告書概要(和文)」より
  • [Presentation] Recent development of spherical aberration corrected electron microscopy and its application to studies of nano-structures2005

    • Author(s)
      Tanaka, N., Yamasaki, J
    • Organizer
      International Symposium on Application of Quantum Beam 2005
    • Place of Presentation
      神戸大学
    • Year and Date
      20051018-19
    • Description
      「研究成果報告書概要(和文)」より
  • [Book] 「ナノテクのための物理入門」8章分担執筆2007

    • Author(s)
      田中信夫
    • Total Pages
      240
    • Publisher
      共立出版
    • Description
      「研究成果報告書概要(和文)」より
  • [Book] Introduction to physics for nanotechnology2007

    • Author(s)
      N, Tanaka
    • Total Pages
      240
    • Publisher
      Kyoritsu-syuppan
    • Description
      「研究成果報告書概要(欧文)」より
  • [Remarks] 「研究成果報告書概要(和文)」より

    • URL

      http://sirius.cirse.nagoya-u.ac.jp/~tanakalab/messages/index.html

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Published: 2010-02-04  

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