Development and characterization of an atomic device by the manipulation

2007 Fiscal Year Final Research Report Summary

• Project/Area Number: 17310083
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Microdevices/Nanodevices
• Research Institution: Osaka University
• Principal Investigator: YI Insook Osaka University, Graduate School of Engineering, Lecturer (40379128)
• Project Period (FY): 2005 – 2007
• Keywords: Scanning Probe Microscope / Micro-Nano device / Nano contact

Research Abstract

To form the basic technique for an atomic device, we study the identification of single atoms by the chemical interaction force, the movement of individual atoms by the vertical and lateral manipulation, and the construction of nano-scale device using the non-contact atomic force microscope (NC-AFM) with the performance of the highest class in the world (vertical resolution 1 pm, lateral resolution 10 pm). Concrete targets are ; the formation of the high dielectric and semiconducting surfaces controlled at an atomic level, the formation of the electrodes on macro, micro, and nano scale on the flat semiconductor and insulator (ionic single crystal or high dielectric material) surfaces at an atomic level, and the creation of the structure of an atomic device by the RT manipulation of Si, Ge, and Sn atoms (in IV group) deposited on the step edge, and verification of the device functions.
(1) Formation of nanostructures (Nano-metal wires) on Si (100) semiconductor surface
(2) Nano-clusters, Nano-islands formed for nano-electrodes use on Si (111) semiconductor surface
(3) NC-AFM study in atomic steps of high dielectric material SrTiO3
(4) Force and potential mappings on insulator surface (ionic crystal, KC1)

Research Products

• [Journal Article] Non-Acontact AFM observation of the(□3×□3)to(3×3)phase transition on Sn/Ge(111)and Sn/Si(111)surfaces (2007)
  • Author(s): Insook Yi, R. Nishi, Y. Sugimoto, M. Abe and S. Morita
  • Journal Title: Applied Surface Science 253 Pages: 3072-3076
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Atomic structure of Ge clusters on Si(111)-(7×7)by non-contact AFM (2007)
  • Author(s): Insook Yi, Y. Sugimoto, R. Nishi, M. Abe and S. Morita
  • Journal Title: Nanotechnology, 18 Pages: 84013-84016
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Non-Acontact AFM observation of the (√3x√3) to (3x3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces (2007)
  • Author(s): Insook, Yi, R., Nishi, Y., Sugimoto, M., Abe, S., Morita
  • Journal Title: Applied Surface Science vol.253 Pages: 3072-3076
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] Atomic structure of Ge clusters on Si(111)-(7x7) by non-contact AFM (2007)
  • Author(s): Insook, Yi, Y., Sugimoto, R., Nishi, M., Abe, S., Morita
  • Journal Title: Nanotechnology vol.18 Pages: 84013-84016
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] Non-contact atomic force microscopy study of atomic manipulation on in sulator surface by nanoindentation (2006)
  • Author(s): Ryuji Nishi, Daisuke Miyagawa, Yoshihide Seino, Insook Yi, and Seizo Morita
  • Journal Title: Nanotechnology 17 Pages: S142-S147
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Discrimination of individual atoms on Ge/Si(111)-(7×7)intermixed surface (2006)
  • Author(s): Insook Yi, R. Nishi, Y. Sugimoto, M. Abe and S. Morita
  • Journal Title: Surf. Sci 600 Pages: 2766-2770
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Study on various contrast of topographic images on Sn/Si(111)-(□3×□3)R30°surface by a non-contact AFM (2006)
  • Author(s): Insook Yi, Y. Sugimoto, R. Nishi, M. Abe and S. Morita
  • Journal Title: Surf. Sci 600 Pages: 3382-3387
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Non-contact atomic force microscopy study of atomic manipulation on insulator surface by nanoindentation (2006)
  • Author(s): Ryuji, Nishi, Daisuke, Miyagawa, Yoshihide, Seino, Insook, Yi, Seize, Morita
  • Journal Title: Nanotechnology vol.17 Pages: S142-S147
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface (2006)
  • Author(s): Insook, Yi, R., Nishi, Y., Sugimoto, M., Abe, S., Morita
  • Journal Title: Surf. Sci vol.600 Pages: 2766-2770
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] Study on various contrast of topographic images on Sn/Si(111)-(√3x√3) R30° surface by a non-contact AFM (2006)
  • Author(s): Insook, Yi, Y., Sugimoto, R., Nishi, M., Abe, S., Morita
  • Journal Title: Surf. Sci vol.600 Pages: 3382-3387
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] Mechanical Distinction and Manipulation of Atoms Based on Noncontact Atomic Force Microscopy (2005)
  • Author(s): Seizo Morita, Insook Yi, Yoshiaki Sugimoto, Noriaki Oyabu, and Ryuji Nishi
  • Journal Title: Applied Surface Science 241 Pages: 2-8
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Non-contact atomic force microscopy study of the Sn/Si(111)mosaic phase (2005)
  • Author(s): Y. Sugimoto, M. Abe, K. Yoshimoto, O. Custance, Insook. Yi, and Seizo Morita
  • Journal Title: Applied Surface Science 241 Pages: 23-27
  • Description: 「研究成果報告書概要(和文)」より
  • Peer Reviewed
• [Journal Article] Mechanical Distinction and Manipulation of Atoms Based on Noncontact Atomic Force Microscopy (2005)
  • Author(s): Seizo, Morita, Insook, Yi, Yoshiaki, Sugimoto, Noriaki, Oyabu, Ryuji, Nishi
  • Journal Title: Applied Surface Science vol.241 Pages: 2-8
  • Description: 「研究成果報告書概要(欧文)」より
• [Journal Article] Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase (2005)
  • Author(s): Y., Sugimoto, M., Abe, K., Yoshimoto, O., Custance, Insook., Yi, Seizo, Morita
  • Journal Title: Applied Surface Science vol.241 Pages: 23-27
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] Toward assembly of complex nanostructures at room temperature; observation, discrimination and manipulation of single atoms by force (2007)
  • Author(s): S. Morita, et. al.
  • Organizer: 10th APPC
  • Place of Presentation: Pohang, Korea
  • Year and Date: 2007-08-21
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] Toward assembly of complex nanostructures at room temperature ; observation, discrimination and manipulation of single atoms by force (2007)
  • Author(s): S., Morita, et. al.
  • Organizer: APPC
  • Year and Date: 2007-08-21
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] Atomic structure of Ge clusters on Si(111)-(7x7)by non-contact AFM (2006)
  • Author(s): Insook Yi, Y. Sugimoto, R. Nishi, M. Abe and S. Morita
  • Organizer: 9th NC-AFM
  • Place of Presentation: Kobe, Japan
  • Year and Date: 2006-07-16
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] Lateral manipulation of single atomic defect on ionic crystal surface (2006)
  • Author(s): R. Nishi, D. Miyagawa, H. Etou, Insook Yi, and S. Morita
  • Organizer: 9th NC-AFM
  • Place of Presentation: Kobe, Japan
  • Year and Date: 2006-07-16
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] Atomic structure of Ge clusters on Si(111)-(7x7) by non-contact AFM (2006)
  • Author(s): Insook, Yi, Y., Sugimoto, R., Nishi, M., Abe, S., Morita
  • Organizer: Proc. 9th NC-AFM, Kobe
  • Place of Presentation: Japan
  • Year and Date: 2006-07-16
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] Lateral manipulation of single atomic defect on ionic crystal surface (2006)
  • Author(s): R., Nishi, D., Miyagawa, H., Etou, Insook, Yi, S., Morita
  • Organizer: Proc. 9th NC-AFM, Kobe
  • Place of Presentation: Japan
  • Year and Date: 2006-07-16
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] NC-AFM study on atomic defects formed on ionic crystal by nanoindentation, (2005)
  • Author(s): R. Nishi, D.Miyagawa, H. Etou, Insook Yi, and S. Morita
  • Organizer: 8th NC-AFM
  • Place of Presentation: Bad Essen, Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] NC-AFM observation on cleavage surfaces of the mixed alkali halide crystal (2005)
  • Author(s): H. Etou, D. Miyagawa, R. Nishi, Insook Yi, and S. Morita
  • Organizer: 8th NC-AFM
  • Place of Presentation: Bad Essen, Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] , Atomic step structure formed by nanoscraching on alkali halide surface using an AFM (2005)
  • Author(s): D. Miyagawa, H. Etou, R. Nishi, Insook Yi, and S. Morita
  • Organizer: 8th NC-AFM
  • Place of Presentation: Bad Essen, Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(和文)」より
• [Presentation] NC-AFM study on atomic defects formed on ionic crystal by Nanoindentation (2005)
  • Author(s): R., Nishi, D., Miyagawa, H., Etou, Insook, Yi, S., Morita
  • Organizer: Proc. 8th NC-AFM, Bad Essen
  • Place of Presentation: Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] NC-AFM observation on cleavage surfaces of the mixed alkali halide crystal (2005)
  • Author(s): H., Etou, D., Miyagawa, R., Nishi, Insook, Yi, S., Morita
  • Organizer: Proc. 8'h NC-AFM, Bad Essen
  • Place of Presentation: Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(欧文)」より
• [Presentation] Atomic step structure formed by nanoscraching on alkali halide surface using an AFM (2005)
  • Author(s): D., Miyagawa, H., Etou, R., Nishi, Insook, Yi, S., Morita
  • Organizer: Proc. 8th NC-AFM, Bad Essen
  • Place of Presentation: Germany
  • Year and Date: 2005-08-15
  • Description: 「研究成果報告書概要(欧文)」より