2006 Fiscal Year Final Research Report Summary
Effect of structures of Mg-Si thin films on static and dynamic strength of Mg alloys
| Project/Area Number |
17560063
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (C)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Materials/Mechanics of materials
|
|---|
| Research Institution | Osaka University (2006)
The University of Tokyo (2005) |
|---|
Principal Investigator |
KONDOH Katsuyoshi Osaka University, Joining and Welding Research Institute, Professor, 接合科学研究所, 教授 (50345138)
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
KAWABATA Kenshi Osaka University, Joining and Welding Research Institute, Specially Appointed Instructor, 接合科学研究所, 特任助手(常勤) (50432422)
|
|---|
| Project Period (FY) |
2005 – 2006
|
| Keywords | Mg-Si sputtered thin film / tensile strength / amorphous / hydrogen gas / thermal damage |
|---|
| Research Abstract |
RF sputtering process to prepare Mg-Si thin films on the surface of magnesium alloys has been established because Mg2Si intermetallic compounds reveal superior corrosion resistance to the conventional stainless steels. In particular, the effect of crystal structure of the films on the static and dynamic mechanical properties of Mg-Si coated magnesium alloys was evaluated. Two kind of sputtering targets were employed; elementally Mg-Si composed target and Mg2Si sintered one. The former easily accelerate to produce amorphous structure films under the conventional sputtering conditions. In employing AZ31 alloy and AZ91 alloy disks as the base material of elementally composed targets, AZ91 alloy, including much amount of aluminum element, assists the formation of amorphous sputtered films. There is no remarkable difference of tensile strength when using amorphous and crystal structured Mg-Si films, and no microstructure change, in particular grain growth, at the interface of the magnesium base alloy and the film. Pin-on-disk type wear test results show the stable friction coefficient in using amorphous structure film because of higher hardness of the film than that of the crystal one. They also indicated high enough bonding strength between the film and magnesium matrix.
|
Research Products
(6 results)
