2006 Fiscal Year Final Research Report Summary
Study of Multiscale Contact between solid surfaces
Project/Area Number |
17560114
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Design engineering/Machine functional elements/Tribology
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Research Institution | Utsunomiya University |
Principal Investigator |
KAWAGUCHI Takahisa Utsunomiya University, Faculty of Engineering, Research Associate Assistant, 工学研究科, 助手 (60234043)
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Co-Investigator(Kenkyū-buntansha) |
HATAZAWA Tetsuzo Utsunomiya University, Faculty of Engineering, Professor, 工学部, 教授 (30114169)
FUJIMOTO Takashi Yuge National College of Maritime Technology, Department of Electronic-Mechanical Engineering, Associate Professor, 電子機械工学科, 助教授 (30332076)
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Project Period (FY) |
2005 – 2006
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Keywords | real contact area / solid surface / sputtered thin films / multi-scale / hertzian contact / SPM / MD method |
Research Abstract |
It is difficult to detect the real contact area with lateral size of less than several μm by existing methods. In this study, a technique is proposed to realize the detection of the micro-contacts. Furthermore the Molecular dynamics (MD) simulation method applicable to micro-scale contacts is proposed. 1. In order to clear the detecting accuracy of the method, the micro-contacts between both surfaces of a smooth steel ball and a smooth glass flat were observed and measured, under several humidity of the surrounding environment. A measured mean radius of the circle of Hertz contact tends to become larger than a calculation value of hertzian equation when environment humidity is larger than 70%RH. It seems that this cause is the influence of the meniscus power by a water molecule of a contact interface. However, it may be expected from the experimental result that this method is able to detect the real contact area by elastic or plastic contact with high accuracy. 2. The measurement principle is based on the fact that the interaction force between cantilever and gold substrate, which can be detected and used for force-curve. The obtained data were processed through a microcomputer system. From the result, it is found that the adhesion force changes with the distance between cantilever and substrate. Using the MD simulation, the adhesion force may be expected to be seen at the range of-25〜-390nN. However, remarkable agreement between the MD simulation results and the experimental results was not obtained.
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Research Products
(9 results)