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2009 Fiscal Year Final Research Report

Development of Atomically Controlled Plasma Processing for GroupIV Quantum Device Fabrication

Research Project

  • PDF
Project/Area Number 18063001
Research Category

Grant-in-Aid for Scientific Research on Priority Areas

Allocation TypeSingle-year Grants
Review Section Science and Engineering
Research InstitutionTohoku University

Principal Investigator

SAKURABA Masao  Tohoku University, 電気通信研究所, 准教授 (30271993)

Co-Investigator(Kenkyū-buntansha) MUROTA Junichi  東北大学, 電気通信研究所, 教授 (70182144)
Project Period (FY) 2006 – 2009
Keywords量子へテロ構造 / プラズマ / エピタキシャル成長 / 原子層制御 / IV族半導体
Research Abstract

By utilizing surface reaction of reactant gases under ECR Ar plasma irradiation without substrate heating, epitaxial growth of atomically flat highly strained films of Ge and Si as well as B atomic-layer doped Si were demonstrated. Moreover, by lowering of the plasma energy in the epitaxial growth, it was clarified that plasma damage and surface B reduction by Ar plasma irradiation can be effectively suppressed and it is quite important to increase of strain and B concentration in the B atomic-layer doped films.

  • Research Products

    (32 results)

All 2010 2009 2008 2007 2006

All Journal Article (9 results) (of which Peer Reviewed: 8 results) Presentation (23 results)

  • [Journal Article] Electrical Characteristics of Thermal CVD B-Doped Si Films on Highly Strained Si Epitaxially Grown on Ge(100) by Plasma CVD without Substrate Heating2010

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Journal Title

      Thin Solid Films Vol.518

      Pages: S57-S61

    • Peer Reviewed
  • [Journal Article] Heavy B Atomic-Layer Doping in Si Epitaxial Growth on Si(100) Using Electron-Cyclotron-Resonance Plasma CVD2010

    • Author(s)
      T. Nosaka、M. Sakuraba、B. Tillack, J. Murota
    • Journal Title

      Thin Solid Films Vol.518

      Pages: S140-S142

    • Peer Reviewed
  • [Journal Article] Improvement in Negative Differential Conductance Characteristics of Hole Resonant-Tunneling Diodes with High Ge Fraction Si/Strained Si1-xGex/Si(100) Heterostructure2009

    • Author(s)
      T. Seo、K. Takahashi、M. Sakuraba, J. Murota
    • Journal Title

      Solid-State Electron Vol.53

      Pages: 912-915

    • Peer Reviewed
  • [Journal Article] Very Low-Temperature Epitaxial Growth of Silicon and Germanium Using Plasma-Assisted CVD2008

    • Author(s)
      M. Sakuraba, D. Muto, M. Mori, K. Sugawara, J. Murota
    • Journal Title

      Thin Solid Films Vol.517

      Pages: 10-13

    • Peer Reviewed
  • [Journal Article] Impact of Ge Fraction Modulation upon Electrical Characteristics of Hole Resonant Tunneling Diodes with Si/Strained Si1-xGex/Si(100) Heterostructure2008

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Journal Title

      Thin Solid Films Vol.517

      Pages: 110-112

    • Peer Reviewed
  • [Journal Article] Electrical Characteristics of Hole Resonant Tunneling Diodes with High Ge Fraction (x>0. 4) Si/Strained Si1-xGex/Si(100) Heterostructure2008

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Journal Title

      Appl. Surf. Sci Vol.254

      Pages: 6265-6267

  • [Journal Article] Fabrication of Hole Resonant Tunneling Diodes with Nanometer Order Heterostructures of Si/Strained Si1-xGex Epitaxially Grown on Si(100) (Invited Paper)2007

    • Author(s)
      M. Sakuraba、R. Ito、T. Seo, J. Murota
    • Journal Title

      ECS Trans Vol.11

      Pages: 131-139

    • Peer Reviewed
  • [Journal Article] Hole tunneling properties in resonant tunneling diodes with Si/Strained Si0. 8Ge0. 2 heterostructures grown on Si(100) by low-temperature ultraclean LPCVD2007

    • Author(s)
      R. Ito, M. Sakuraba, J. Murota
    • Journal Title

      Semicond. Sci. Technol Vol.22

      Pages: S38-S41

    • Peer Reviewed
  • [Journal Article] Epitaxial growth of highly strained Si on relaxed Ge/Si(100) using ECR plasma CVD without substrate heating2007

    • Author(s)
      K. Sugawara, M. Sakuraba, J. Murota
    • Journal Title

      Semicond. Sci. Technol Vol.22

      Pages: S42-S45

    • Peer Reviewed
  • [Presentation] Epitaxial Growth of Group IV Semiconductor Nanostructures Using Atomically Controlled Plasma Processing (Invited Paper)2010

    • Author(s)
      M. Sakuraba、T. Nosaka、K. Sugawara, J. Murota
    • Organizer
      5th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20100129-20100130
  • [Presentation] Mobility Enhancement by Highly Strained Si on Relaxed Ge(100) Buffer Grown by Plasma CVD2010

    • Author(s)
      K. Sugawara, M. Sakuraba, J. Murota
    • Organizer
      5th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20100129-20100130
  • [Presentation] Resonant Tunneling Diodes with Highly Strained Heterostructures of Si/Si1-xGex Epitaxially Grown on Si(100)2009

    • Author(s)
      M. Sakuraba, J. Murota
    • Organizer
      2nd French Research Organizations-Tohoku University Joint Workshop on Frontier Materials
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20091129-20091203
  • [Presentation] Atomically Controlled Plasma Processing for Epitaxial Growth of Group IV Semiconductor Nanostructures2009

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Organizer
      2nd French Research Organizations-Tohoku University Joint Workshop on Frontier Materials
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20091129-20091203
  • [Presentation] Atomically Controlled Plasma Processing for Epitaxial Growth of Group IV Semiconductor Nanostructures2009

    • Author(s)
      M. Sakuraba, K. Sugawara, J. Murota
    • Organizer
      Symp. E10: ULSI Process Integration 6、(216th Meeting of the Electrochem. Soc. )
    • Place of Presentation
      Vienna、Austria
    • Year and Date
      20091004-20091009
  • [Presentation] Resonant Tunneling Diodes with Highly Strained Heterostructures of Si/Si1-xGex Epitaxially Grown on Si(100) (Invited Paper)2009

    • Author(s)
      M. Sakuraba, J. Murota
    • Organizer
      1st Int. Workshop on Si Based Nano-Electronics and -Photonics (SiNEP-09)
    • Place of Presentation
      Vigo、Spain
    • Year and Date
      20090920-20090923
  • [Presentation] Electrical Characteristics of B-Doped Highly Strained Si Films Epitaxially Grown on Ge(100) Formed by Plasma CVD2009

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Organizer
      6th Int. Conf. on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles、USA
    • Year and Date
      20090517-20090522
  • [Presentation] Heavily B Atomic-Layer Doping Characteristics in Si Epitaxial Growth on Si(100) Using Electron-Cyclotron-Resonance Ar Plasma2009

    • Author(s)
      T. Nosaka、M. Sakuraba、B. Tillack, J. Murota
    • Organizer
      6th Int. Conf. on Silicon Epitaxy and Heterostructures
    • Place of Presentation
      Los Angeles、USA
    • Year and Date
      20090517-20090522
  • [Presentation] Heavily B Atomic-Layer Doping in Si Epitaxial Growth Using Electron-Cyclotron-Resonance Plasma2008

    • Author(s)
      T. Nosaka、M. Sakuraba, J. Murota
    • Organizer
      Int. Union of Mat. Res. Soc. - Int. Conf. in Asia 2008 (IUMRS-ICA 2008)
    • Place of Presentation
      Nagoya、Japan
    • Year and Date
      20081209-20081213
  • [Presentation] Epitaxial Growth of Highly Strained B Doped Si on Relaxed Ge/Si(100)2008

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Organizer
      Int. Union of Mat. Res. Soc. - Int. Conf. in Asia 2008 (IUMRS-ICA 2008)
    • Place of Presentation
      Nagoya、Japan
    • Year and Date
      20081209-20081213
  • [Presentation] Fabrication of Hole Resonant Tunneling Diodes Utilizing Nanometer-Order Strained SiGe/Si(100) Heterostructures with High Ge Fraction2008

    • Author(s)
      M. Sakuraba、R. Ito、T. Seo, J. Murota
    • Organizer
      4th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20080925-20080927
  • [Presentation] Application of Relaxed Ge/Si(100) by ECR Plasma CVD to Highly Strained B Doped Si2008

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Organizer
      4th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20080925-20080927
  • [Presentation] Epitaxial Growth of B Atomic-Layer Doped Si Film on Si(100) Using Electron-Cyclotron-Resonance Ar Plasma2008

    • Author(s)
      T. Nosaka、M. Sakuraba, J. Murota
    • Organizer
      4th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20080925-20080927
  • [Presentation] Hole Resonant Tunneling Diodes Utilizing High Ge Fraction (x>0. 5) Si/Strained Si1-xGex/Si(100) Heterostructure with Improved Performance at Higher Temperature above 200 K2008

    • Author(s)
      K. Takahashi、T. Seo、M. Sakuraba, J. Murota
    • Organizer
      4th Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20080925-20080927
  • [Presentation] Improvement in Negative Differential Conductance Characteristics of Hole Resonant Tunneling Diodes with High Ge Fraction Si/Strained Si1-xGex/Si(100) Heterostructure2008

    • Author(s)
      T. Seo、Takahashi, M. Sakuraba, J. Murota
    • Organizer
      4th Int. SiGe Technology and Device Meeting (ISTDM2008)
    • Place of Presentation
      Hsinchu, Taiwan
    • Year and Date
      20080511-20080514
  • [Presentation] Electrical Characteristics of Hole Resonant Tunneling Diodes with High Ge Fraction (x>0. 4) Si/Strained Si1-xGex/Si(100) Heterostructure2007

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Organizer
      5th Int. Symp. Control of Semiconductor Interfaces (ISCSI-V)
    • Place of Presentation
      Hachioji, Japan
    • Year and Date
      20071112-20071114
  • [Presentation] Characterization of Temperature-Dependent Hole Resonant Tunneling Properties with High Ge Fraction (x>0. 4) Si/Strained Si1-xGex/Si(100) Heterostructure2007

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Organizer
      3rd Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20071108-20071109
  • [Presentation] Fabrication of Hole Resonant Tunneling Diodes with Nanometer Order Heterostructures of Si/Strained Si1-xGex Epitaxially Grown on Si(100) (Invited Paper)2007

    • Author(s)
      M. Sakuraba、R. Ito、T. Seo, J. Murota
    • Organizer
      Symp. E9: ULSI Process Integration 5 (212th Meeting of the Electrochem. Soc. )
    • Place of Presentation
      Washington, DC、USA
    • Year and Date
      20071007-20071012
  • [Presentation] Very Low-Temperature Epitaxial Growth of Silicon and Germanium Using Plasma-Assisted CVD (Invited Paper)2007

    • Author(s)
      M. Sakuraba、D. Muto、M. Mori、K. Sugawara、J. Murota
    • Organizer
      5th Int. Conf. Silicon Epitaxy and Heterostructures (ICSI-5)
    • Place of Presentation
      Marseille、France
    • Year and Date
      20070520-20070524
  • [Presentation] Impact of Ge Fraction Modulation upon Electrical Characteristics of Hole Resonant Tunneling Diodes with Si/Strained Si1-xGex/Si(100) Heterostructure2007

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Organizer
      5th Int. Conf. Silicon Epitaxy and Heterostructures (ICSI-5)
    • Place of Presentation
      Marseille, France
    • Year and Date
      20070520-20070524
  • [Presentation] Highly Strained-Si/Relaxed-Ge Epitaxial Growth on Si(100) by ECR Plasma CVD and Evaluation of Thermal Stability2006

    • Author(s)
      K. Sugawara、M. Sakuraba, J. Murota
    • Organizer
      Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20061002-20071003
  • [Presentation] Electrical Characteristics of Hole Resonant Tunneling Diodes with High Ge Fraction Si/Strained Si1-xGex Heterostructures on Si(100) Grown by Low-Temperature Ultraclean LPCVD2006

    • Author(s)
      T. Seo、M. Sakuraba, J. Murota
    • Organizer
      Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20061002-20061003
  • [Presentation] Epitaxial Growth of Group IV Semiconductor in ECR Plasma Enhanced CVD2006

    • Author(s)
      M. Sakuraba、D. Muto、M. Mori、K. Sugawara、J. Murota
    • Organizer
      Abstracts of 2nd Int. Workshop on New Group IV Semiconductor Nanoelectronics
    • Place of Presentation
      Sendai、Japan
    • Year and Date
      20061002-20061003

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Published: 2011-06-18   Modified: 2016-04-21  

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