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2008 Fiscal Year Final Research Report

Scanning atom probe analyses of photocatalytic decomposition process of organic molecules on titanium oxide surface

Research Project

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Project/Area Number 18310072
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Nanostructural science
Research InstitutionKanazawa Institute of Technology

Principal Investigator

TANIGUCHI Masahiro  Kanazawa Institute of Technology, バイオ・科学部, 教授 (30250418)

Co-Investigator(Kenkyū-buntansha) NISHIKAWA Osamu  金沢工業大学, バイオ・科学部, 教授 (10108235)
YAMAGISHI Akihiko  お茶の水女子大学, 理学部, 客員教授 (70001865)
Project Period (FY) 2006 – 2008
Keywords走査型アトムプローブ / 光励起触媒 / 酸化チタン / 炭素材料 / カーボンナノチューブ / グラファイトナノファイバー / クラスターイオン
Research Abstract

走査型アトムプローブ(Scanning Atom Probe, SAP)の特性を活かすことで酸化チタンによる有機分子の分解を個々の原子のレベルで解析する事に成功した。また、金属状態のチタンの表面に生成する酸化膜も酸化チタンの純粋な試料と同様に有機分子の光分解活性を示すことを見出した。また、有機分子が解析出来るという利点を生かして、生体分子の分析を試み、いくつかのアミノ酸を構成する原子群を直接検出する事に成功した。

  • Research Products

    (28 results)

All 2009 2008 2007 2006 Other

All Journal Article (10 results) (of which Peer Reviewed: 10 results) Presentation (14 results) Book (1 results) Remarks (1 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] "Metal Ion Sensing by Luminescence from an Ionexchange Adduct of Clay and Cationic Cyclo-metalated Iridium (III) Complex"2009

    • Author(s)
      H. Sato, A. Yamagishi
    • Journal Title

      Chemistry Letters 38

      Pages: 1415

    • Peer Reviewed
  • [Journal Article] "Syntheses and Photophysical Properties of Optical-active Blue-phosphorescent Iridium Complexes bearing Asymmetric ridentate Ligand"2009

    • Author(s)
      M. Ashizawa, A. Yamagishi
    • Journal Title

      Dalton Transactions

      Pages: 1700-1702

    • Peer Reviewed
  • [Journal Article] "A New Approach for the Mass Analysis of Biomolecules at Atomic Level Utilizing the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Microscopy and Microanalysis 14

      Pages: 1244-1245

    • Peer Reviewed
  • [Journal Article] "Study of Characteristic Fragmentation of Nanocarbon by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Journal of Vacuum Science and Technology A 26

      Pages: 1074-1078

    • Peer Reviewed
  • [Journal Article] "Scanning Atom Probe Study of Graphite Naofibers"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi
    • Journal Title

      Journal of Vacuum Science and Technology B 26

      Pages: 735-737

    • Peer Reviewed
  • [Journal Article] "Study on Imidazolium-based Ionic Liquids with Scanning Atom Probe and Knudsen Effusion Mass Spectrometry"2008

    • Author(s)
      A. Tolstoguzov O. Nishikawa, M. Taniguchi
    • Journal Title

      Surface and Interface Analysis 40

      Pages: 1614-1618

    • Peer Reviewed
  • [Journal Article] "Study of Graphite Nanofibers by the Scanning Atom Probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, and M. Ushirozawa
    • Journal Title

      e-Journal of Surface Science and Nanotechnology 6

      Pages: 41-44

    • Peer Reviewed
  • [Journal Article] "Scanning atom probe study of graphite nanofibers"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi andM. Ushirozawa
    • Journal Title

      Journal of Vacuum Science & Technology B 26・2

      Pages: 735-737

    • Peer Reviewed
  • [Journal Article] Study of Molecular Reaction on Titanium Oxide by the Scanning Atom Probe2006

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Komata, S. Watanabe,A. Yamagishi and T. Sasaki
    • Journal Title

      e-Journal of Surface Science and Nanotechnology 4

      Pages: 521-527

    • Peer Reviewed
  • [Journal Article] "Scanning Atom Probe Study of Dissociation of Organic Molecules on Titanium Oxide"2006

    • Author(s)
      O. Nishikawa, M. Taniguchi, S. Wawtanabe, A. Yamagishi and T. Sasaki
    • Journal Title

      Japanese Journal of Applied Physics Vol.45. No 3B

      Pages: 1892-1896

    • Peer Reviewed
  • [Presentation] 「走査型アトムプローブによるポリチオフェンの原子レベルの分析」2009

    • Author(s)
      西川治, 谷口昌宏,早坂健,石田龍平,角崎顕一,神戸裕晃,竹村進,加藤ひとし
    • Organizer
      第56 回応用物理学関係連合講演会
    • Place of Presentation
      茨城県つくば市
    • Year and Date
      2009-03-30
  • [Presentation] 「粘土-イリジウム錯体付加物からの発光を用いたキラルセンシング」2009

    • Author(s)
      山岸晧彦
    • Organizer
      第89 回日本化学会第89回春季年会
    • Place of Presentation
      日本大学(東京都)
    • Year and Date
      2009-03-23
  • [Presentation] "Atomic Level Analysis of Non-metallic Specimens by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M.Taniguchi
    • Organizer
      4th Vacuum and Surface Science Conference of Asia and Australia
    • Place of Presentation
      島根県松江市
    • Year and Date
      2008-10-29
  • [Presentation] "Quantitative Evaluation of Carbon Nano Tubes by the Scanning AtomProbe"2008

    • Author(s)
      O. Nishikawa, M.Taniguchi
    • Organizer
      AVS(American Vacuum Society) 55th International Symposium & Exhibition
    • Place of Presentation
      Boston, USA.
    • Year and Date
      2008-10-01
  • [Presentation] 「走査型アトムプローブ(3D- SAP)によるCNT の分析」2008

    • Author(s)
      谷口昌宏,西川治,竹谷慎介,田中慎哉
    • Organizer
      第2 回分子科学討論会
    • Place of Presentation
      福岡県福岡市
    • Year and Date
      2008-09-27
  • [Presentation] 「走査型アトムプローブによるカーボンナノチューブの原子レベルでの組成評価」2008

    • Author(s)
      西川治,谷口昌宏
    • Organizer
      第69 回応用物理学学術講演会
    • Place of Presentation
      愛知県名古屋市
    • Year and Date
      2008-09-02
  • [Presentation] "Carbon Material Analysis by using the Scanning Atom Probe" Material Analysis by using the Scanning Atom Probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Taktani, S. Tanaka, M.Ushirozawa
    • Organizer
      The 10th Int. Symposium on SIMS and Related Tech. Based on Ion-Solid Interactions (SISS-10)
    • Place of Presentation
      成蹊大学(東京都武蔵野市)
    • Year and Date
      2008-07-17
  • [Presentation] "Scannng atom Probe Study of Characteristic Fragmentation of Biomolecules"2008

    • Author(s)
      O. Nishikawa
    • Organizer
      International Conference on Nanoscience Technology 2008
    • Place of Presentation
      Keystone, Colorado, USA.
    • Year and Date
      2008-07-01
  • [Presentation] "Atomic Level Evaluation of Carbon Nanotubes by the Scanning Atom Probe"2008

    • Author(s)
      O. Nishikawa, M. Taniguchi, S. Taketani, S. Tanaka
    • Organizer
      21st International Vacuum Nanoelectronics Conference
    • Place of Presentation
      Wroclaw, Poland
    • Year and Date
      2008-07-01
  • [Presentation] "Characterization of carbon nanotubes by the scanning atom probe"2008

    • Author(s)
      M. Taniguchi, O. Nishikawa, S. Takeuchi, S.Tanaka
    • Organizer
      The 51st International Field Emission Symposium
    • Place of Presentation
      Rouen, France
    • Year and Date
      2008
  • [Presentation] "Study of graphite nanofibers by the scanning atom probe"2007

    • Author(s)
      M. Taniguchi, O. Nishikawa, M. Ushirozawa
    • Organizer
      6th International Symposium on Atomic Level Characterizations for New Materials and Devices`07
    • Place of Presentation
      金沢市
    • Year and Date
      2007-10-30
  • [Presentation] "Study on Imidazoliumbased Ionic Liquids with Scanning Atom Probe and Knudsen Effusion Mass Spectrometry"2007

    • Author(s)
      A. Tolstoguzov, U. Bardi, O. Nishikawa, M. Taniguchi
    • Organizer
      6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07
    • Place of Presentation
      金沢市
    • Year and Date
      2007-10-30
  • [Presentation] 「走査型アトムプローブによるグラファイトナノファイバーの分析」2007

    • Author(s)
      谷口昌宏,長谷川優太,西川治,後沢瑞芳
    • Organizer
      第1 回分子科学討論会
    • Place of Presentation
      仙台市
    • Year and Date
      2007-09-01
  • [Presentation] "Scanning atom probe study of graphite nanofibres"2007

    • Author(s)
      M. Taniguchi, O. Nishikawa, M. Ushirozawa
    • Organizer
      Atom Probe Workshop 2007
    • Place of Presentation
      Gothenburg, Sweden
    • Year and Date
      2007-06-01
  • [Book] 「第5版実験化学講座24」(日本化学会編、「3.11 FEM,FIM,アトムプローブ」を担当)

    • Author(s)
      谷口昌宏
    • Pages
      233-256
    • Publisher
      丸善
  • [Remarks] 西川・谷口研究室ホームページ

    • URL

      http://www2.kanazawa-it.ac.jp/nanotech/

  • [Patent(Industrial Property Rights)] 分析装置及び分析方法2008

    • Inventor(s)
      西川治
    • Industrial Property Rights Holder
      学校法人 金沢工業大学
    • Industrial Property Number
      特許,特願2008-145033
    • Acquisition Date
      2008-06-02
  • [Patent(Industrial Property Rights)] 試料及び電極ホルダユニット、位置調整台、並びに試料及び電極の装置への組付方法2007

    • Inventor(s)
      尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
    • Industrial Property Rights Holder
      尾張真則, 野島雅,谷口昌宏, 間山憲仁, 足立達哉
    • Industrial Property Number
      特許,特願2007-279318
    • Acquisition Date
      2007-10-26

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Published: 2010-06-10   Modified: 2017-11-09  

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