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2007 Fiscal Year Final Research Report Summary

Advanced Assessment Methodology of Lead-free Solder Joints under Multi-loads in Three-dimensional Electronic Packaging

Research Project

Project/Area Number 18360056
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Materials/Mechanics of materials
Research InstitutionYokohama National University

Principal Investigator

YU Qiang  Yokohama National University, Division of System Research, Associate Professor (80242379)

Co-Investigator(Kenkyū-buntansha) SHIRATORI Masaki  Yokohama Nationa University, Division of System Research, Professor (60017986)
SHIBUTANI Tadahiro  Yokohama Nalional University, Division of System Research, Research Associate (10332644)
Project Period (FY) 2006 – 2007
Keywords3D-Packaging Technology / Solder Joints / Multi-axial stresses / Low-cycle fatigue / Creep / Fatigue Life / Finite Element Method / Strain Measurement
Research Abstract

This paper reports a fundamental methodology of the assessment for thermal fatigue reliability of lead-free solder joints in three-dimensional electronic packaging. In particular, multi-loads condition provides complex failure mechanism to the assessment of reliability. Nanoindentation tests were carried out for lead or lead-free solder balls to evaluate mechanical properties under multi-axial stresses. Ratchet and transition of creep mechanism were found during the indentation creep. In the case of thin film such as plating finishes, mechanical properties may change due to multi-axial stresses. Based on measured properties, tin whisker initiation was examined. Transition from power-law creep to diffusion creep accelerates atoms migrating rate and then tin whiskers initiate due to the accumulation of atoms at the localized area. Another discussion is the reliability of connectors under multi loads. Three point bending tests were performed to evaluate the low-cycle fatigue under multi-loads. Inelastic strain range, which is the key to fatigue life of solder joints, increases with the multi loads. Finally, a methodology to assess the fatigue life of connectors under multi loads was developed.

  • Research Products

    (34 results)

All 2007 2006

All Journal Article (34 results) (of which Peer Reviewed: 18 results)

  • [Journal Article] 応力緩和法を用いたはんだの弾塑性・クリープ・粘塑性の物性値取得の効率化2007

    • Author(s)
      谷村利伸
    • Journal Title

      エレクトロニクス実装学会誌 10

      Pages: 52-61

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] A Study of Deformation Mechanism During Nanoindentation Creep in Tin-Based Solder Balls2007

    • Author(s)
      Shibutani, T.
    • Journal Title

      Journal of Electronic Packaging 129

      Pages: 71-75

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Mechanism of Damage Process on Si_3N_4/Cu Interface in Nanoscratch Test2007

    • Author(s)
      Shibutani, T.
    • Journal Title

      Journal of Solid Mechanics and Materials Engineering 1

      Pages: 322-331

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Evaluation Method of Interaction Relation between Design Factors And Simple Assessment Approach for BGA Package Reliability2007

    • Author(s)
      Kondo, S.
    • Journal Title

      Proceedings of ASME 2007 InterPack

      Pages: Interpack2007-33242

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Low-cycle fatigue reliability evaluation for lead-free solders in vehicle electronics devices2007

    • Author(s)
      Yu, Q.
    • Journal Title

      Proceedings of ASME 2007 InterPack

      Pages: Interpack2007-33250

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Reliability Evaluation of Lead Free Solder Joints Subjected to Multi-Loads2007

    • Author(s)
      Tosaka, A.
    • Journal Title

      Proceedings of ASME 2007 InterPack

      Pages: Interpack2007-33349

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Evaluation Technique for The Failure Life Scatter of Lead-Free Solder Joints in Electronic Device2007

    • Author(s)
      Miyauchi, H.
    • Journal Title

      Proceedings of THERMINIC2007

      Pages: 32-37

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Delamination Evaluation Approach for Bimaterial Structure Considering Interfacial Layer2007

    • Author(s)
      Yu, Q.
    • Journal Title

      Proceedings of ASME IMECE2007

      Pages: 1-6(IMECE2007-41715)

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] A Study of Deformation Mechanism During Nanoindentation Creep in Tin-Based Solder Balls2007

    • Author(s)
      Shibutani, T., Yu, Q., Shiratori, M
    • Journal Title

      Journal of Electronic Packaging Vol.129, No.1

      Pages: 71-75

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Mechanism of Damage Process on Si3N4/Cu Interface in Nanoscratch Test2007

    • Author(s)
      Shibutani, T., Yu, Q, Shiratori, M., Akai, T
    • Journal Title

      Journal of Solid Mechanics and Materials Engineering Vol.1, No.3

      Pages: 322-331

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Evaluation Method of Interaction Relation between Design Factors And Simple Assessment Approach for BGA Package Reliability2007

    • Author(s)
      Kondo, S., Yu, Q., Shibutani, T., Shiratori, M
    • Journal Title

      Proceedings of ASME InterPACK2007

      Pages: 1-7(Interpack2007-33242)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Low - cycle fatigue reliability evaluation for lead - free solders in vehicle electronics devices2007

    • Author(s)
      Yu, Q., Shibutani, T., Tanaka, A. Koyama, T., Shiratori, M
    • Journal Title

      Proceedings of ASME InterPACK2007

      Pages: 1-7(Interpack2007-33250)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Reliability Evaluation of Lead Free Solder Joints Subjected to Multi-Loads2007

    • Author(s)
      Tosaka, A. Yu, Q., Shibutani, T., Kondo, S., Shiratori, M
    • Journal Title

      Proceedings of ASME InterPACK2007

      Pages: 1-6(Interpack2007-33349)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Evaluation Technique for The Failure Life Scatter of Lead-Free Solder Joints in Electronic Device2007

    • Author(s)
      Miyauchi, H., Yu, Q., Shibutani, T., Shiratori, M
    • Journal Title

      Proceedings of the THERMINIC 2007

      Pages: 32-37

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Delamination Evaluation Approach for Bimaterial Structure Considering Interfacial Layer2007

    • Author(s)
      Yu, Q., Shibutani, T., Shiratori, M., Matsuzaki, T., Matsumoto, T
    • Journal Title

      Proceedings of the 2007 ASME IMECE2007

      Pages: 1-6(IMECE2007-41715)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Evaluation of Diffusion Creep in Low Melting Point Materials by Nanoindentation Creep Test2006

    • Author(s)
      Shibutani, T.
    • Journal Title

      JSME International Journal, SeriesA 49

      Pages: 397-402

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] サブミクロン金粒子低温焼結マイクロ接合構造の機械的疲労信頼性評価2006

    • Author(s)
      澁谷忠弘
    • Journal Title

      エレクトロニクス実装学会誌 9

      Pages: 465-471

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Stress-Induced Tin Whisker Initiation Under Contact Loading2006

    • Author(s)
      Shibutani, T.
    • Journal Title

      IEEE Transactions on Electronics Packaging Manufacturing 29

      Pages: 259-264

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Study of the electrical contact resistance of multi-contact MEMS relays fabricated using the MetalMUMPs process2006

    • Author(s)
      Almeid, L.
    • Journal Title

      Journal of Micromechanics and Microengineering 16

      Pages: 1189-1194

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Easy reliability design approach for solder BGA package considering correlation of each design factor2006

    • Author(s)
      Yu, Q.
    • Journal Title

      Proceedings of ITherm2006

      Pages: 900-905

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] The Effect of Voids on Thermal Reliability of BGA Lead Free Solder Joint and Reliability Detecting Standard2006

    • Author(s)
      Yu, Q.
    • Journal Title

      Proceedings of ITherm2006

      Pages: 1024-1030

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Modeling with Structure of Resins in Electronic Components2006

    • Author(s)
      Yu, Q
    • Journal Title

      Proceedings of THERMINIC2006

      Pages: 107-111

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Study on Whisker Outbreak on Tin Plating by Contact Force2006

    • Author(s)
      Yamashita, T.
    • Journal Title

      Proceedings of ASME IMECE2006

      Pages: 1-7(IMECE2006-14221)

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Tri-state multi-contact lateral MEMS relay with high mechanical reliability2006

    • Author(s)
      Yamada, S.
    • Journal Title

      Proceedings of EMAP2006

      Pages: 957-969

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Effective Acquisitions of Plastic, Creep, Viscoplastic Parameters of Solder Using the Stress Relaxation Method2006

    • Author(s)
      Tanimura, T.
    • Journal Title

      Proceedings of EMAP2006

      Pages: 658-666

    • Description
      「研究成果報告書概要(和文)」より
    • Peer Reviewed
  • [Journal Article] Evaluation of Diffusion Creep in Low Melting Point Materials by Nanoindentation Creep Test2006

    • Author(s)
      Shibutani, T., Yu, Q., Shiratori, M
    • Journal Title

      JSME International Journal, Series A Vol.49, No.3

      Pages: 397-402

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Stress-Induced Tin Whisker Initiation Under Contact Loading2006

    • Author(s)
      Shibutani, T., Yu, Q., Yamashita, T., Shiratori, M
    • Journal Title

      IEEE Transactions on Electronics Packaging Manufacturing Vol.29, No.4

      Pages: 259-264

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Study of the electrical contact resistance of multi-contact MEMS relays fabricated using the MetaIMUMPs process2006

    • Author(s)
      Almeid, L, Ramadoss, R., Jackson, R., Ishikawa, K., Yu, Q
    • Journal Title

      Journal of Micromechanics and Microengineering Vol.16

      Pages: 1189-1194

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Easy reliability design approach for solder joint BGA package considering correlation of each design factor2006

    • Author(s)
      Yu, Q., Shibutani, T., Jin, J.C., Kondo, S., Shiratori, M
    • Journal Title

      Proceedings of ITherm 2006

      Pages: 900-905

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] The Effect of Voids on Thermal Reliability of BGA Lead Free Solder Joint and Reliability Detecting Standard2006

    • Author(s)
      Yu, Q., Shibutani, T., Kobayashi, Y., Shiratori, M
    • Journal Title

      Proceedings of ITherm 2006

      Pages: 1024-1030

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Modeling with Structure of Resins in Electronic Components2006

    • Author(s)
      Yu, Q., Shibutani, T., Shiratori, M., Matsumoto, T
    • Journal Title

      Proceedings of Therm 2006

      Pages: 107-111

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Study on Whisker Outbreak on Tin Plating by Contact Force2006

    • Author(s)
      Yamashita, T., Shibutani, T., Yu, Q., Shiratori, M
    • Journal Title

      Proceedings of the 2006 ASME IMECE2006

      Pages: 1-7(IMECE2006-1422l)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Tri-state multi-contact lateral MEMS relay with high mechanical reliability2006

    • Author(s)
      Yamada, S., Ishikawa, K., Yu, Q., Ramadoss, R., Almeida, L
    • Journal Title

      Proceedings of EMAP 2006

      Pages: 957-969

    • Description
      「研究成果報告書概要(欧文)」より
  • [Journal Article] Effective Acquisitions of Plastic, Creep, Viscoplastic Parameters of Solder Using the Stress Relaxation Method2006

    • Author(s)
      Tanimura, T., Yu, Q., Shibutani, T., Jin, J.C., Shiratori, M
    • Journal Title

      Proceedings of EMAP 2006

      Pages: 658-666

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 2010-02-04  

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