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2009 Fiscal Year Final Research Report

A STUDY ON ENERGY LEVEL CHARACTERIZATION DEVICES FOR BIOLOGICAL MATERIALS BY ELECTRON RESPONSE OF METAL/MICRO-GAP/SEMICONDUCTOR STRUCTURES

Research Project

  • PDF
Project/Area Number 18360148
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionOsaka University

Principal Investigator

MORITA Mizuho  Osaka University, 大学院・工学研究科, 教授 (50157905)

Co-Investigator(Kenkyū-buntansha) FUKUI Kiichi  大阪大学, 工学研究科, 教授 (00311770)
ARIMA Kenta  大阪大学, 工学研究科, 准教授 (10324807)
Project Period (FY) 2006 – 2009
Keywordsシリコン / シリコン酸化膜 / 微小空隙 / 電子応答 / センシングデバイス
Research Abstract

The sensing of deoxyribonucleic acid solutions by capacitance-voltage measurements of a metal/micro-gap/semiconductor structure device has been demonstrated. The different concentrations of deoxyribonucleic acid solutions have been characterized from the change of the capacitance-voltage curve for the sensing device. A metal/insulator/gap/insulator/semiconductor structure device was sensitive to the ion concentration of the solution and had high sensitivity. It has been suggested that the change of capacitance-voltage characteristics reflects the change of the charge on the sensing silicon dioxide surface.

  • Research Products

    (20 results)

All 2009 2008 2007 2006 Other

All Journal Article (5 results) Presentation (12 results) Remarks (1 results) Patent(Industrial Property Rights) (2 results)

  • [Journal Article] Metal-Insulator-Gap-Insulator-Semiconductor Structure for Sensing D e v i c e s2009

    • Author(s)
      Takaaki HIROKANE, Hideaki HASHIMOTO, Daisuke KANZAKI, Shinichi URABE, Kenta ARIMA, Junichi UCHIKOSHI, Mizuho MORITA
    • Journal Title

      ANALYTICAL SCIENCES 25(Peer-reviewed)

      Pages: 101-104

  • [Journal Article] Characterization of Pinhole in Patterned Oxide Buried in Bonded Silicon-on-Insulator Wafers by Near-Infrared Scattering Topography and Transmission Microscopy2008

    • Author(s)
      Xing Wu, Junichi Uchikoshi, Takaaki Hirokane, Ryuta Yamada, Akihiro Takeuchi, Kenta Arima, Mizuho Morita
    • Journal Title

      Journal of The Electrochemical Society 155(11)(Peer-reviewed)

      Pages: H864-H868

  • [Journal Article] Characterization of Patterned Oxide Buried in Bonded Silicon-on-Insulator Wafers by Near-Infrared Scattering Topography and Microscopy2008

    • Author(s)
      Xing WU, Junichi UCHIKOSHI, Takaaki HIROKANE, Ryuta YAMADA, Akihiro TAKEUCHI, Kenta ARIMA, Mizuho MORITA
    • Journal Title

      Japanese Journal of Applied Physics 47(4)(Peer-reviewed.)

      Pages: 2511-2514

  • [Journal Article] Sensing ofλDNA solutions by metal-gap-semiconductor devices2008

    • Author(s)
      Takaaki Hirokane, Daisuke Kanzaki, Hideaki Hashimoto, Shinichi Urabe, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Journal Title

      Surface and Interface Analysis 40(Peer-reviewed.)

      Pages: 1131-1133

  • [Journal Article] Characterization of Void in Bonded Silicon-on-Insulator Wafers by Controlling Coherence Length of Light Source using Near-Infrared Microscope2007

    • Author(s)
      Noritaka AJARI, Junichi UCHIKOSHI, Takaaki HIROKANE, Kenta ARIMA, Mizuho MORITA
    • Journal Title

      Japanese Journal of Applied Physics 46(4B)(Peer-reviewed.)

      Pages: 1994-1996

  • [Presentation] Direct immobilization of DNA oligomers onto an aminosilane-attached SiO2 surface2009

    • Author(s)
      Yoshifumi Okamoto, Takaaki Hirokane, Takashi Furukawa, Junichi Uchikoshi, Kenta Arima, Mizuho Morita
    • Organizer
      Extended Abstracts of Second International Symposium on Atomically Controlled Fabrication Technology
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2009-11-25
  • [Presentation] Electrical Detection of ExtendedλDNA Molecules with Gap Electrodes by Ultraviolet Radiation2009

    • Author(s)
      Takamichi Hanada, Yoshifumi Okamoto, Katsuhiro Hashimoto, Yasuhumi Ochi, Takaaki Hirokane, Shinichiro Kajiyama, Susumu Uchiyama, Kiichi Fukui, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      Extended Abstracts of First International Symposium on Atomically Controlled Fabrication Technology- Surface and Thin Film Processing-
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2009-02-16
  • [Presentation] Sensing of DNA solution with Metal-Gap-Insulator-Semiconductor Device, Extended Abstracts of First International Symposium on Atomically Controlled Fabrication Technology2009

    • Author(s)
      Takaaki Hirokane, Daisuke Kanzaki, Hideaki Hashimoto, Shinichi Urabe, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      - Surface and Thin Film Processing-
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2009-02-16
  • [Presentation] Electrical Detection of Damage of ExtendedλDNA Molecules by Ultraviolet Radiation2007

    • Author(s)
      Takamichi Hanada, Katsuhiro Hashimoto, Yasuhumi Ochi, Takaaki Hirokane, Shinichiro Kajiyama, Susumu Uchiyama, Kiichi Fukui, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      Extended Abstracts of International 21st Century COE Symposium on Atomistic Fabrication Technology 2007
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2007-10-15
  • [Presentation] Sensing ofλDNA Solutions by Metal-Gap-Semiconductor Device2007

    • Author(s)
      Takaaki Hirokane, Daisuke Kanzaki, Hideaki Hashimoto, Shinichi Urabe, Mizuho Morita
    • Organizer
      Extended Abstracts of International 21st Century COE Symposium on Atomistic Fabrication Technology 2007
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2007-10-15
  • [Presentation] Metal-Insulator-Gap-Insulator-Semicondu ctor Device for Biosensors2007

    • Author(s)
      Takaaki Hirokane, Hideaki Hashimoto, Daisuke Kanzaki, Shinichi Urabe, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      Extended Abstracts of International 21st Century COE Symposium on Atomistic Fabrication Technology 2007
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2007-10-15
  • [Presentation] Sensing Device with Metal-Insulator-Gap-Insulator- Semiconductor for Biological Sensors, Abstracts2007

    • Author(s)
      Hideaki Hashimoto, Takaaki Hirokane, Daisuke Kanzaki, Shinichi Urabe, Mizuho Morita
    • Organizer
      212th Meeting of The Electrochemical Society
    • Place of Presentation
      Washington, DC(Not peer-reviewed.)
    • Year and Date
      2007-10-10
  • [Presentation] Current-Voltage Characteristics of Gap Electrodes withλDNA Molecules on SiO2/Si Substrate after Elongating Treatment, Abstracts2006

    • Author(s)
      Katsuhiro Hashimoto, Takamichi Hanada, Yasuhumi Ochi, Takaaki Hirokane, Shigeki Kawakami, Susumu Uchiyama, Kiichi Fukui, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      210th Meeting of The Electrochemical Society
    • Place of Presentation
      Cancun(Not peer-reviewed.)
    • Year and Date
      2006-11-01
  • [Presentation] Metal-Gap-Semiconductor Sensing Devices for DNA Solutions, Abstracts2006

    • Author(s)
      Takaaki Hirokane, Hideaki Hashimoto, Daisuke Kanzaki, Shinichi Urabe, Mizuho Morita
    • Organizer
      210th Meeting of The Electrochemical Society
    • Place of Presentation
      Not peer-reviewed.
    • Year and Date
      2006-10-31
  • [Presentation] Current-Voltage Characteristics of Gap Electrodes with ExtendedλDNA Molecules2006

    • Author(s)
      Katsuhiro Hashimoto, Takamichi Hanada, Yasuhumi Ochi, Takaaki Hirokane, Shigeki Kawakami, Susumu Uchiyama, Kiichi Fukui, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      Extended Abstracts of International 21st Century COE Symposium on Atomistic Fabrication Technology
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2006-10-19
  • [Presentation] Metal-Gap-Semiconductor Device for Biosensors2006

    • Author(s)
      Takaaki Hirokane, Hideaki Hashimoto, Daisuke Kanzaki, Shinichi Urabe, Mizuho Morita
    • Organizer
      Extended Abstracts of International 21st Century COE Symposium on Atomistic Fabrication Technology
    • Place of Presentation
      Osaka(Not peer-reviewed.)
    • Year and Date
      2006-10-19
  • [Presentation] Liquid Sensing by Nano-Gap Device with Treated Surface2006

    • Author(s)
      Takaaki Hirokane, Hideaki Hashimoto, Daisuke Kanzaki, Tatsuya Takegawa, Satoru Morita, Shinichi Urabe, Kenta Arima, Junichi Uchikoshi, Mizuho Morita
    • Organizer
      Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials
    • Place of Presentation
      Yokohama(Not peer-reviewed.)
    • Year and Date
      2006-09-15
  • [Remarks]

    • URL

      http://www-pm.prec.eng.osaka-u.ac.jp/

  • [Patent(Industrial Property Rights)] 検出素子およびそれを用いた検出装置2007

    • Inventor(s)
      森田瑞穂, 廣兼孝亮
    • Industrial Property Rights Holder
      森田瑞穂
    • Industrial Property Number
      特許,特願2007-248433
    • Filing Date
      2007-09-26
    • Acquisition Date
      2007-09-26
  • [Patent(Industrial Property Rights)] 検出装置2007

    • Inventor(s)
      森田瑞穂
    • Industrial Property Rights Holder
      森田瑞穂
    • Industrial Property Number
      特許,特許第3931294号
    • Filing Date
      2007-03-23
    • Acquisition Date
      2007-03-23

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Published: 2011-06-18   Modified: 2016-04-21  

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