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2009 Fiscal Year Final Research Report

Development of electron excited X-ray holography for micro-area 3D atomic structure analysis

Research Project

  • PDF
Project/Area Number 18360300
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionTohoku University

Principal Investigator

HAYASHI Koichi  Tohoku University, 金属材料研究所, 准教授 (20283632)

Co-Investigator(Kenkyū-buntansha) USAMI Noritaka  東北大学, 金属材料研究所, 准教授 (20262107)
Project Period (FY) 2006 – 2009
Keywordsホログラフィー / 電子顕微鏡 / 三次元原子像 / 局所構造 / 結晶構造
Research Abstract

We proposed the "electron excited X-ray holography", which can record the atomic resolution hologram by measuring an electron beam direction dependence of characteristic X-ray intensities from a sample. In this work, Ti K hologram was measured with 6 keV electron beam and atomic images of neighboring Sr and Ti were successfully reconstructed from its Fourier transform. Moreover, as advanced applications of atomic resolution holography, local lattice distortions of the mixed crystal of the diluted magnetic semiconductor Zn_<0.4>Mn_<0.6>Te and the shape memory alloy of Ti_<50>Ni_<44>Fe_6 were successfully estimated.

  • Research Products

    (12 results)

All 2010 2009 2007 2006 Other

All Journal Article (6 results) (of which Peer Reviewed: 6 results) Presentation (3 results) Remarks (2 results) Patent(Industrial Property Rights) (1 results)

  • [Journal Article] Reconciling the Pauling bond length picture and Vegard's law in a mixed crystal : An x-ray fluorescence holographic study2009

    • Author(s)
      S. Hosokawa, N. Happo, K.Hayashi
    • Journal Title

      Phys.rev.B 80

      Pages: 134123

    • Peer Reviewed
  • [Journal Article] Phase transition in Ti_<50>Ni_<44>Fe_6 studied by x-ray fluorescence holography2009

    • Author(s)
      W. Hu, K. Hayashi, T. Yamamoto, N. Happo, et al.
    • Journal Title

      Phys.rev.B 80

      Pages: 060202(R)

    • Peer Reviewed
  • [Journal Article] Structural analysis of Ti_<50>Ni_<44>Fe_6 single crystal by X-ray fluorescence holography2009

    • Author(s)
      W. Hu, K. Hayashi, N. Happo, et al.
    • Journal Title

      J.Cryst.Growth 311

      Pages: 982-985

    • Peer Reviewed
  • [Journal Article] Application of x-ray excited optical luminescence to x-ray standing wave method and atomic resolution holography2007

    • Author(s)
      K. Hayashi, T. Hayashi, T. Shishido, E. Matsubara, et al.
    • Journal Title

      Phys.rev.B 76

      Pages: 014119

    • Peer Reviewed
  • [Journal Article] Existence of tetrahedral site symmetry about Ge atoms in a single-crystal film of Ge2Sb2Te5 found by x-ray fluorescence holography2007

    • Author(s)
      S. Hosokawa, T. Ozaki, K. Hayashi, N. Happo, et al.
    • Journal Title

      Appl.Phys.Lett. 90

      Pages: 1361913

    • Peer Reviewed
  • [Journal Article] Holographic Analysis of Incident Electron Beam Angular Distribution of Characteristic X-Rays : Internal Detector Electron Holography2006

    • Author(s)
      K. Hayashi, T. Matsushita, E. Matsubara
    • Journal Title

      J.Phys.Soc.Jpn. 75

      Pages: 053601

    • Peer Reviewed
  • [Presentation] Introductory Talk2010

    • Author(s)
      林好一
    • Organizer
      日本物理学会 第65回年次大会
    • Place of Presentation
      岡山
    • Year and Date
      2010-03-21
  • [Presentation] Recent advances in X-ray fluorescence holography2009

    • Author(s)
      K. Hayashi, N. Happo, S. Hosokawa, T. Matsushita
    • Organizer
      第11th international conference on electronic spectroscopy & structure
    • Place of Presentation
      奈良
    • Year and Date
      2009-10-07
  • [Presentation] 射入射条件におけるX線定在波法を用いたモデルフリー構造解析2007

    • Author(s)
      林好一, 竹中久貴, 他
    • Organizer
      第18回MRS学術シンポジウム
    • Place of Presentation
      東京
    • Year and Date
      2007-12-09
  • [Remarks] 東北大金材料研究所

    • URL

      http://www.xraylab.imr.tohoku.ac.jp/member/hayashi/index.html

  • [Remarks] 原子分解能X線励起研究会

    • URL

      https://sites.google.com/site/atomicholography/

  • [Patent(Industrial Property Rights)] 非走査型波長分散型X線分析装置及びそれを用いた測定方法2007

    • Inventor(s)
      林好一, 中嶋一雄
    • Industrial Property Rights Holder
      東北大学
    • Industrial Property Number
      特願2007-015569
    • Filing Date
      2007-01-25

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Published: 2011-06-18   Modified: 2016-04-21  

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