2007 Fiscal Year Final Research Report Summary
Estimation of deformation and fracture parameters through the inverse analysis of nanoindentation behavior
Project/Area Number |
18560652
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Inorganic materials/Physical properties
|
Research Institution | Tokyo Institute of Technology |
Principal Investigator |
AKATSU Takashi Tokyo Institute of Technology, Materials and Structunes Laboratory, Associate Professor (40231807)
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Project Period (FY) |
2006 – 2007
|
Keywords | Ceramics / Mechanical Properties / Nanoindentation / Hardness / Plasma Electrolic Oxidation |
Research Abstract |
The aim of this study is to extract mechanical properties, which reflects local deformation and fracture, from nanoindentation behavior through the combination of computer simulation and inverse analysis. The novel method to estimate mechanical properties depends on neither the contact mechanics nor mechanical models. In the first year of this project, the Young's modulus, Poisson's ratio, yield stress and strain hardening coefficient of an elastoplastic body can be estimated precisely through the inverse analysis of nanoindentation behavior. In the second year of this project, the inverse analysis is applied for film/substrate systems to derive the mechanical properties of the film. The Young's modulus of a film is successfully estimated in the case of elastic film/elastic substrate systems. Inverse analysis of elastoplastic film/elastoplastic substrate is going on studying. The analysis of viscoelastic bodies is also planned to investigate. Plasma electrolic oxidation (PEO) of valve metals to create ceramic films on metal substrate is studied. It is, in the first year, found that Oxide film on aluminum fabricated with PEO, which contains a-Al2O3, shows high hardness that is equivalent with that of sintered alumina polycrystals. In the second year, PEO treatment is applied for titanium to create titanium oxide on it, and the crystallization and microstructual development of the oxide film can be controlled. Not only mechanical but also photocatalytic performance is examined on the oxide film. The mechanism to produce oxide films with PEO treatment is found to be explained through electronic avalanche theory with Poole-Frenkel effect.
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[Presentation] A simple inverse analytical approach to indentation load Relaxation2007
Author(s)
Y., Nakagawara, T., Akatsu, R., Sasaki, Y., Shinoda, F., Wakai
Organizer
The 20th Fall Symposium, The Ceramic Society of Japan
Place of Presentation
Nagoya, Japan
Year and Date
2007-09-13
Description
「研究成果報告書概要(欧文)」より
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[Presentation] An Inverse Analytical Approach to Derive Creep Parameters from Indentation Load Relaxation2007
Author(s)
Y., Nakagawara, T., Akatsu, R., Sasaki, Y., Shinoda, F., Wakai
Organizer
The 1st International Conference on the Science and Technology for Advanced Ceramics
Place of Presentation
Shonan Village Center (Kanagawa), Japan
Year and Date
2007-05-24
Description
「研究成果報告書概要(欧文)」より