Angle-resolved spectroscopic observation using light from nano-structures excited by low-energy electron probe

2009 Fiscal Year Self-evaluation Report

• Project/Area Number: 19101004
• Research Category: Grant-in-Aid for Scientific Research (S)
• Allocation Type: Single-year Grants
• Research Field: Nanostructural science
• Research Institution: Tokyo Institute of Technology
• Principal Investigator: TAKAYANAGI Kunio Tokyo Institute of Technology, 大学院・理工学研究科, 教授 (80016162)
• Project Period (FY): 2007 – 2011
• Keywords: 収差補正 / 電子顕微鏡 / ナノプローブ / ルミネッセンス / 表面プラズモン

Research Abstract

(1)本研究では、サブ-ナノメートルに絞られた電子ビームでナノ構造物質を励起し、局所領域から放射される光を同時観測するSTEM-CL装置の開発を行う。
(2)ナノ領域からの発光現象、表面プラズモンと光との変換過程などについて、エネルギーと運動量の関係(分散関係)を明らかにして、ナノ構造物質(半導体、金属、ハイブリッド)での電子-光現象を研究する。

Research Products

• [Journal Article] STEM imaging of 47-pm-separated atomic columns by a spherical aberration -corrected electron microscope with a 300-kV cold field emission gun (2009)
  • Author(s): H. Sawada, Y. Tanishiro, N. Ohashi, T. Tomita F. Hosokawa, T. Kaneyama, Y. Kondo, K. Takayanagi
  • Journal Title: J. Electron. Microsc 58 Pages: 357-361
  • Peer Reviewed
• [Journal Article] Cathodoluminescent Spectroscopic Imaging of Surface Plasmon Polaritons in a 1-Dimensional Plasmonic Crystal (2009)
  • Author(s): T. Suzuki, N. Yamamoto
  • Journal Title: Opt. Express 17, No. 26 Pages: 23664-23671
  • Peer Reviewed
• [Journal Article] TEM-CL法による表面プラズモンの研究 (2009)
  • Author(s): 山本直紀, 鈴木喬博, 竹内健悟
  • Journal Title: 顕微鏡 44, No. 4 Pages: 268-274
  • Peer Reviewed
• [Journal Article] Measurement Method of Aberration from Ronchigram by Autocorrelation Function (2008)
  • Author(s): H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi
  • Journal Title: Ultramicroscopy 108 Pages: 1467-1475
  • Peer Reviewed
• [Journal Article] Conversion of Surface Plasmon Polaritons to Light by a Surface Step (2008)
  • Author(s): N. Yamamoto, Takahiro Suzuki
  • Journal Title: Appl. Phys. Lett 93 Pages: 093114-3(1-3)
  • Peer Reviewed
• [Presentation] 透過電子顕微鏡による表面プラズモンポラリトン発光の顕微分光 (2010)
  • Author(s): 山本直紀
  • Organizer: 応用物理学会学術講演会
  • Place of Presentation: 東海大学
  • Year and Date: 20100317-20100320
• [Presentation] 50pm resolution electron microscope, performance and application (2009)
  • Author(s): K. Takayanagi
  • Organizer: Workshop on Advanced Application of Aberration Correction TEM (National Synchrotron Radiation Research Center Hsinchu
  • Place of Presentation: Taiwan
  • Year and Date: 20091122-20091124
• [Presentation] Light Emission of Surface Plasmon Excited by Fast Electrons (2009)
  • Author(s): N. Yamamoto
  • Organizer: (invited) CLEO/Europe-EQEC 2009
  • Place of Presentation: Munich (Germany)
  • Year and Date: 20090614-20090619
• [Book] Beam Injection Based Nanocharacterization of Advanced Materials(ed. G. Salviati, T. Sekiguchi, S. Heun and A. Gustafsson, TEM-Cathodoluminescence study of semiconductor quantum dots and quantum wires) (2008)
  • Author(s): N. Yamamoto, K. Ishikawa, K. Akiba, S. Bhunia, K. Tateno, Y. Watanabe
  • Total Pages: 37-59
  • Publisher: Research Signpost