2011 Fiscal Year Final Research Report
Proximal multi-probe measurement and control method for nanometer-scale strrctures based on frequency modulation AFM
| Project/Area Number |
19106001
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| Research Category |
Grant-in-Aid for Scientific Research (S)
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Kyoto University |
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Principal Investigator |
YAMADA Hirofumi 京都大学, 大学院・工学研究科, 准教授 (40283626)
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| Co-Investigator(Kenkyū-buntansha) |
KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211)
HIRATA Yoshiki 産業技術総合研究所, 主任研究員 (10357858)
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| Project Period (FY) |
2007 – 2011
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| Keywords | 走査型プローブ顕微鏡 / マルチAFMプローブ技術 / ナノ空間相関 / ナノ刺激応答 / 液中高分解能 / 生体分子 |
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| Research Abstract |
A novel dual-probe AFM working in various environments has been developed based on vertical incidence optical beam deflection method. We succeeded in visualizing nanoscale anisotropic carrier conduction of a polydiacetylene crystal, especially in the diacetylene chain direction, as well as in measuring transistor characteristics of a single grain pentacene film. Furthermore, high-resolution dual-probe AFM measurements in physiological environments have been established toward the molecular-scale analysis of biological functions by use of the two-probe stimulus-response measurement
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