• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to project page

2008 Fiscal Year Annual Research Report

局所的フォーススペクトル法による単原子物性計測手法の確立

Research Project

Project/Area Number 19360017
Research InstitutionOsaka University

Principal Investigator

阿部 真之  Osaka University, 大学院・工学研究科, 准教授 (00362666)

Keywords原子間力顕微鏡 / フォーススペクトロスコピー / 交換型原子操作 / フォーススペクトロスコピー / フォースマッピング / 原子識別 / 国際研究者交流
Research Abstract

1.アトムトラッキング技術とフィードフォーワード技術を組み合わせることで、室温における非接触原子間力顕微鏡を用いたフォーススペクトロスコピーおよび原子操作実験の精度を向上させた。さらに、表面の力の場を可視化できるフォースマッピングの精度を向上させることに成功した。
2.フォースマッピング法を原子識別実験に適用した。具体的には、(Si,Pb,Sn)/Si(111)-(√3×√3)表面の3元素を識別することに利用した。原子間力顕微鏡凹凸像では、あたかも2種類しかないように見えるが、フォースマッピングによって、相互作用力の2次元分布を視覚的にとらえることが可能となり、3腫類の原子が存在することが実証できた。
3.上記2.の手法を応用して、原子の識別を画像として得ることに成功した。具体的には、探針-試料間距離を変調し得られた応答は原子間結合力に相当することから、その応答の振幅を画像化した。その結果、フォーススペクトロスコピーやフォースマッピングでは時間と技術が必要であった原子識別実験を、簡単に高速に行えることが可能になった。
4.原子間力顕微鏡の探針先端に存在する原子を、ペンのインクのように試料表面に埋め込む技術を開発した。再現性を実証するために、シリコン製探針をもちいてスズの表面にシリコン原子を埋め込んでいき、文字を書いた(描いた)。
5.フォースマッピングによって、非接触原子間力顕微鏡の画像化機構の解明を行った。具体的には、Si(111)-(7×7)表面上で周波数シフトマッピングを行うことによって、力のマップ、さらにポテンシャルマップ、水平力マップを算出し、カンチレバーの振動振幅によって、得られるコントラストが変わることを実証した。

  • Research Products

    (38 results)

All 2009 2008 Other

All Journal Article (8 results) (of which Peer Reviewed: 8 results) Presentation (29 results) Remarks (1 results)

  • [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy2009

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Applied Physics Letters Vol. 94

      Pages: 023108-1-023108-3

    • Peer Reviewed
  • [Journal Article] “原子ペン", 室温で2009

    • Author(s)
      阿部真之
    • Journal Title

      CERAMICS JAPAN Vol. 44

      Pages: 126

    • Peer Reviewed
  • [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Science Vol. 322

      Pages: 413-417

    • Peer Reviewed
  • [Journal Article] Statistics of lateral atom manipulation by atomic force microscopy at room temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Physical Review B Vol. 78

      Pages: 205305-1-205305-5

    • Peer Reviewed
  • [Journal Article] Vertical and lateral force mapping on the Si(111)-(7×7) surface by dynamic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Physical Review B Vol. 77

      Pages: 195424-1-195424-9

    • Peer Reviewed
  • [Journal Article] High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Non-contact Atomic Force Microscopy2008

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Japanese Journal of Applied Physics Vol. 47

      Pages: 6085-6087

    • Peer Reviewed
  • [Journal Article] Solution Growth of Rubrene Single Crystals Using Various Organic Solvents2008

    • Author(s)
      Takeshi Matsukawa
    • Journal Title

      Japanese Journal of Applied Physics Vol. 47

      Pages: 8950-8954

    • Peer Reviewed
  • [Journal Article] フォースカーブによる元素識別とフォース・マツピング2008

    • Author(s)
      森田清三
    • Journal Title

      表面科学 Vol. 29

      Pages: 214-220

    • Peer Reviewed
  • [Presentation] Development of Atomic Force Microscopy Using Quartz Tuning Fork Operated in Ultra High Vacuum2009

    • Author(s)
      Takashi TERADO
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Optical Interferometer for Detection and Excitation of Cantilever Motion : A Study of Atomic Force Microscopy2009

    • Author(s)
      Arushi SATO
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Sensitivity improvement of interferometer for NC-AFM2009

    • Author(s)
      Kenichi INA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Investigation of excitation method for quartz tuning fork atomic force microscopy2009

    • Author(s)
      Yuki SASAGAWA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Observation of the metal oxide surface by scanning probe microscopy2009

    • Author(s)
      Hideki TANAKA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] High Resolution Imaging of TiO_2 (110)-(1x1) Using Non-Contact AFM at Low Temperature2009

    • Author(s)
      Abdi PRATAMA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3)3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] High-resolution imaging of CaF_2/Si (111) surface using atomic resolution NC-AFM2009

    • Author(s)
      Makoto TAKEDA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Statistics of lateral atom manipulation by atomic force microscopy at room temperature2009

    • Author(s)
      Yuki NAKAJIMA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Investigation into small diameter metal tip for force sensor2009

    • Author(s)
      Hitomi HASEGAWA
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Deflection amplifier for tuning fork operated in ultra-high vacuum2009

    • Author(s)
      Saeidifar SOMAYEH
    • Organizer
      3rd International Symposium on Atomic Technology (ISAT-3) 3rd Polyscale Technology Workshop (PTW-3)
    • Place of Presentation
      Tokyo International Exchange Center, Tokyo, Japan
    • Year and Date
      2009-03-05
  • [Presentation] Statistics of Lateral Atom Manipulation by Atomic Fprce Microscopy at Room Temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      The 16th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Japan
    • Year and Date
      2008-12-13
  • [Presentation] NC-AFM/STM Study on the Semiconductor Surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      The 16th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Atagawa, Japan
    • Year and Date
      2008-12-11
  • [Presentation] 非接触原子間力顕微鏡を用いたフォース・マッピング2008

    • Author(s)
      杉本宜昭
    • Organizer
      社団法人 日本表面科学会 主催第28回表面科学学術講演会
    • Place of Presentation
      早稲田大学総合学術情報センター(国際会議場)
    • Year and Date
      2008-11-15
  • [Presentation] Vertical and lateral force mapping by non-contact atomic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      International Symposium on Surface Science and Nanotechnology (ISSS-5)
    • Place of Presentation
      Waseda University, Tokyo, Japan
    • Year and Date
      2008-11-10
  • [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy2008

    • Author(s)
      Seizo Morita
    • Organizer
      21st International Microprocesses and Nanotechnology Conference (MNC 2008)
    • Place of Presentation
      Fukuoka, Japan
    • Year and Date
      2008-10-29
  • [Presentation] Atomic Tool for Nanofabrication Based on Atomic Force Microscopy2008

    • Author(s)
      Seizo Morita
    • Organizer
      55th AVS International Symposium
    • Place of Presentation
      Boston, MA, USA
    • Year and Date
      2008-10-21
  • [Presentation] Observation of the metal oxide surface by scanning probe microscopy2008

    • Author(s)
      Akira Hirai
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-30
  • [Presentation] NC-AFM/STM measurements on the Ge(111)-c(2x8) Surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-30
  • [Presentation] Single atom manipulaiton at room temperature2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      4th Handai Nanoscience and technology International Symposium
    • Place of Presentation
      Suita, Japan
    • Year and Date
      2008-09-29
  • [Presentation] 非接触原子間力顕微鏡を用いたSnを蒸着したSi(111)-(7×7)表面での原子操作2008

    • Author(s)
      三木浩太郎
    • Organizer
      日本金属学会2008年秋季(第143回)大会
    • Place of Presentation
      熊本大学黒髪キャンパス
    • Year and Date
      2008-09-25
  • [Presentation] 非接触原子間力顕微鏡を用いた金属酸化物表面の観察2008

    • Author(s)
      平井 明
    • Organizer
      日本金属学会2008年秋季(第143回)大会
    • Place of Presentation
      熊本大学黒髪キャンパス
    • Year and Date
      2008-09-25
  • [Presentation] Force spectroscopy using cantilever higher flexural modes2008

    • Author(s)
      Oscar Custance
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-19
  • [Presentation] Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy2008

    • Author(s)
      Masayuki Abe
    • Organizer
      11th International, Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-19
  • [Presentation] Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy2008

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] Distinct short-range electrostatic interaction on Si and substitutional Pb atoms at the Si(111)-(7x7) surface2008

    • Author(s)
      Sascha Sadewasser
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] Unveiling the atomic processes during the manipulation of single atoms at semiconductor surfaces using the FM-AFM in the repulsive regime2008

    • Author(s)
      Pablo Pou
    • Organizer
      11th International Conference on Non-contact Atomic Force Microscopy
    • Place of Presentation
      Madrid, Spain
    • Year and Date
      2008-09-16
  • [Presentation] Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature2008

    • Author(s)
      Seizo Morita
    • Organizer
      the 14th International Conference on Solid Films and Surfaces (ICSFS-14)
    • Place of Presentation
      Trinity College Dublin, Ireland
    • Year and Date
      2008-07-01
  • [Presentation] Imaging of the Si clusters on the Si(111)-(7×7) surface by using NC-AFM2008

    • Author(s)
      Satoru Iwasaki
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2008-06-30
  • [Presentation] NC-AFM study of phosphorous/Si(001)2×1 surface2008

    • Author(s)
      Daisuke Sawada
    • Organizer
      The 1st International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC)
    • Place of Presentation
      Nagoya, Japan
    • Year and Date
      2008-06-29
  • [Remarks]

    • URL

      http://www.afm.eei.eng.osaka-u.ac.jp/jp/index.html

URL: 

Published: 2010-06-11   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi