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2008 Fiscal Year Final Research Report

3-D micro-structure measurement method based on moire-topography using SEM

Research Project

  • PDF
Project/Area Number 19360123
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Intelligent mechanics/Mechanical systems
Research InstitutionKansai University

Principal Investigator

ARAI Yasuhiko  Kansai University, システム理工学部, 教授 (80131415)

Co-Investigator(Renkei-kenkyūsha) TAGAWA Norio  関西大学, システム理工学部, 教授 (50298840)
AOYAGI Seiji  関西大学, システム理工学部, 教授 (30202493)
Project Period (FY) 2007 – 2008
KeywordsSEM / モアレトポグラフィ / MEMS / 縞解析
Research Abstract

ナノテクノロジーにおける定量的な三次元形状評価を実現し, 微小構造物の定量的三次元形状計測が困難な現状を打開することのできる新しい計測技術を開発した. 具体的には,モアレトポグラフィの光源を光から電子線へ改めることによって, 数μm の構造物を数10nm の測定精度で形状計測可能な非接触三次元形状計測技術を補助金申請書に記した計画どうりに開発した.

  • Research Products

    (7 results)

All 2008 2007

All Journal Article (5 results) (of which Peer Reviewed: 5 results) Presentation (2 results)

  • [Journal Article] Electric speckle pattern interferometry based on spatial fringe analysis method using two cameras2008

    • Author(s)
      Yasuhiko Arai
    • Journal Title

      Journal of Modern Optics 55

      Pages: 281-296

    • Peer Reviewed
  • [Journal Article] 電子スペックル干渉計測におけるバーチャルスペックルパターンを用いた面内変形計測2008

    • Author(s)
      新井泰彦
    • Journal Title

      光学 37

      Pages: 119-129

    • Peer Reviewed
  • [Journal Article] High-resolution dynamic measurement using electronic speckle pattern interferometry based on multi-camera technology2008

    • Author(s)
      Yasuhiko Arai
    • Journal Title

      Optics and Lasers in Enginerring 46

      Pages: 733-738

    • Peer Reviewed
  • [Journal Article] バーチャルスペックルパターンを用いた高分解能ダイナミック面内計測2008

    • Author(s)
      新井泰彦
    • Journal Title

      光学 37

      Pages: 600-609

    • Peer Reviewed
  • [Journal Article] 3-D micro-structure measurement method based on shadow moire using scanning electron microscope2007

    • Author(s)
      Yasuhiko Arai
    • Journal Title

      Experimental analysis of nano and engineering materials and strictures

      Pages: 609-610

    • Peer Reviewed
  • [Presentation] 3-D measurement method based on Wavelet transform by using SEM2008

    • Author(s)
      Y.Arai
    • Organizer
      SPIE Optomechatronic Technology 2008
    • Place of Presentation
      San Diego(USA)
    • Year and Date
      2008-11-17
  • [Presentation] SEMを用いたモアレトポグラフィーによる微小構造物の三次元形状計測2008

    • Author(s)
      新井泰彦, 小林一也
    • Organizer
      日本機械学会関西支部第83期定時総会講演会
    • Place of Presentation
      大阪大学
    • Year and Date
      2008-03-14

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Published: 2010-06-10   Modified: 2016-04-21  

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